onsemi NDT3055L Transistor - N-Channel, Logic Level, Enhancement Mode Field Effect

Part Number: NDT3055L

Package: SOT-223, CASE 318H-01

General Description

This Logic Level N-Channel enhancement mode power field effect transistor is produced using onsemi's proprietary, high cell density, DMOS technology. This very high density process is especially tailored to minimize on-state resistance and provide superior switching performance, and withstand high energy pulse in the avalanche and commutation modes. This device is particularly suited for low voltage applications such as DC motor control and DC/DC conversion where fast switching, low in-line power loss, and resistance to transients are needed.

Features

Absolute Maximum Ratings

(TA = 25°C, unless otherwise noted)

Symbol Parameter Value Unit
VDSS Drain-Source Voltage 60 V
VGSS Gate-Source Voltage - Continuous ±20 V
ID Maximum Drain Current Continuous (Note 1a) 4 A
Pulsed 25 A
PD Maximum Power Dissipation (Note 1a) 3 W
(Note 1b) 1.3 W
(Note 1c) 1.1 W
TJ, TSTG Operating and Storage Temperature Range -65 to 150 °C

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected.

Thermal Characteristics

(TA = 25°C, unless otherwise noted)

Symbol Parameter Max Unit
ROJA Thermal Resistance, Junction-to-Ambient (Note 1a) 42 °C/W
ReJC Thermal Resistance, Junction-to-Case (Note 1) 12 °C/W

Electrical Characteristics

(TA = 25°C unless otherwise noted)

Symbol Parameter Conditions Min Typ Max Unit
OFF CHARACTERISTICS
BVDSS Drain-Source Breakdown Voltage VGS = 0 V, ID = 250 μA 60 V
ABVDSS/ATJ Breakdown Voltage Temp. Coefficient ID = 250 µA, Referenced to 25°C 55 mV/°C
IDSS Zero Gate Voltage Drain Current VDS = 60 V, VGS = 0 V 1 μA
VDS = 60 V, VGS = 0 V, TJ = 125°C 50 μA
IGSSF Gate - Body Leakage, Forward VGS = 20 V, VDS = 0 V 100 nA
IGSSR Gate - Body Leakage, Reverse VGS = -20 V, VDS = 0 V -100 nA
ON CHARACTERISTICS (Note 2)
VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250 μA 1 1.6 2 V
AVGS(th)/ATJ Gate Threshold Voltage Temp. Coefficient ID = 250 µA, Referenced to 25°C -4 mV/°C
RDS(ON) Static Drain-Source On-Resistance VGS = 10 V, ID = 4.0 A 0.07 0.1 Ω
VGS = 10 V, ID = 4.0 A, TJ = 125°C 0.125 0.18 Ω
VGS = 4.5 V, ID = 3.7 A 0.103 0.12 Ω
ID(ON) On-State Drain Current VGS = 5 V, VDS = 10 V 10 A
gFS Forward Transconductance VDS = 5 V, ID = 4 A 7 S
DYNAMIC CHARACTERISTICS
Ciss Input Capacitance VDS = 25 V, VGS = 0 V, f = 1.0 MHz 345 pF
Coss Output Capacitance 110 pF
Crss Reverse Transfer Capacitance 30 pF
SWITCHING CHARACTERISTICS (Note 2)
tD(on) Turn - On Delay Time VDD = 25 V, ID = 1 A, VGS = 10 V, RGEN = 6 Ω 5 20 ns
tr Turn - On Rise Time 7.5 20 ns
tD(off) Turn - Off Delay Time 20 50 ns
tf Turn - Off Fall Time 7 20 ns
Qg Total Gate Charge VDS = 40 V, ID = 4 A, VGS = 10 V 13 20 nC
Qgs Gate-Source Charge 1.7 nC
Qgd Gate-Drain Charge 3.2 nC
DRAIN-SOURCE DIODE CHARACTERISTICS
Is Maximum Continuous Drain-Source Diode Forward Current 2.5 A
VSD Drain-Source Diode Forward Voltage VGS = 0 V, Is = 2.5 A (Note 2) 0.8 1.2 V

Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions.

1. ROJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. Rejc is guaranteed by design while ROCA is determined by the user's board design.

Figure 1: On-Region Characteristics

Description: This graph shows the relationship between Drain-Source Voltage (VDS) and Drain Current (ID) for various Gate-Source Voltages (VGS) at a constant temperature.

Figure 2: On-Resistance Variation with Drain Current and Gate Voltage

Description: This graph illustrates how the normalized on-resistance (RDS(ON)) changes with Drain Current (ID) for different Gate-Source Voltages (VGS).

Figure 3: On-Resistance Variation with Temperature

Description: This graph displays the normalized on-resistance (RDS(ON)) as a function of Junction Temperature (TJ) for a specific Drain Current (ID) and Gate-Source Voltage (VGS).

Figure 4: On-Resistance Variation with Gate-to-Source Voltage

Description: This graph shows the on-resistance (RDS(ON)) variation with Gate-to-Source Voltage (VGS) at different ambient temperatures (TA) for a constant Drain Current (ID).

Figure 5: Transfer Characteristics

Description: This graph plots Drain Current (ID) against Gate-to-Source Voltage (VGS) at different Junction Temperatures (TJ) and a constant Drain-Source Voltage (VDS).

Figure 6: Body Diode Forward Voltage Variation with Current and Temperature

Description: This graph illustrates the Body Diode Forward Voltage (VSD) variation with Drain-Source Diode Forward Current (IS) and temperature.

2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2.0%.

Typical Electrical Characteristics (continued)

Figure 7: Gate Charge Characteristics

Description: This graph shows the relationship between Gate Charge (Qg) and Gate-Source Voltage (VGS) for a specific Drain Current (ID) and Drain-Source Voltage (VDS).

Figure 8: Capacitance Characteristics

Description: This graph displays various capacitances (Ciss, Coss, Crss) as a function of Drain-Source Voltage (VDS) at a specific frequency and Gate-Source Voltage (VGS).

Figure 9: Maximum Safe Operating Area

Description: This graph shows the maximum allowable Drain Current (ID) versus Drain-Source Voltage (VDS) for different pulse durations and conditions, indicating the safe operating region.

Figure 10: Single Pulse Maximum Power Dissipation

Description: This graph illustrates the maximum power dissipation (W) for a single pulse event, considering the ambient temperature (TA) and thermal resistance (ROJA).

Figure 11: Transient Thermal Response Curve

Description: This graph shows the normalized effective transient thermal resistance (r(t)) as a function of time (t1) for a single pulse event. It includes the formula for calculating junction temperature based on power, thermal resistance, and ambient temperature, considering duty cycle.

Thermal characterization performed using the conditions described in Note 1c. Transient thermal response will change depending on the circuit board design.

Mechanical Case Outline

Package Dimensions: SOT-223, CASE 318H, ISSUE B

Date: 13 MAY 2020

Notes:

  1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 2009.
  2. CONTROLLING DIMENSION: MILLIMETERS
  3. DIMENSIONS D & E1 ARE DETERMINED AT DATUM H. DIMENSIONS DO NOT INCLUDE MOLD FLASH, PROTRUSIONS OR GATE BURRS. SHALL NOT EXCEED 0.23mm PER SIDE.
  4. LEAD DIMENSIONS b AND b1 DO NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBBAR PROTRUSION IS 0.08mm PER SIDE.
  5. DATUMS A AND B ARE DETERMINED AT DATUM H.
  6. A1 IS DEFINED AS THE VERTICAL DISTANCE FROM THE SEATING PLANE TO THE LOWEST POINT OF THE PACKAGE BODY.
  7. POSITIONAL TOLERANCE APPLIES TO DIMENSIONS b AND b1.
DIM MIN. NOM. MAX.
A 1.80
A1 0.02 0.06 0.11
b 0.60 0.74 0.88
b1 2.90 3.00 3.10
C 0.24 0.35
D 6.30 6.50 6.70
E 6.70 7.00 7.30
E1 3.30 3.50 3.70
e 2.30 BSC
L 0.25
10°
-3.80

Generic Marking Diagram:

Recommended Mounting Footprint:

For additional information on our Pb-Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.

Document Information

Document Number: 98ASH70634A

Description: SOT-223

Page: 1 OF 1

Additional Information

Technical Publications:

Technical Library: www.onsemi.com/design/resources/technical-documentation

onsemi Website: www.onsemi.com

Online Support:

www.onsemi.com/support

For additional information, please contact your local Sales Representative at www.onsemi.com/support/sales

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