onsemi NVBLS1D2N08X Power MOSFET
Product Type: Power, Single N-Channel, TOLL MOSFET
Key Specifications: 80 V, 1.1 mΩ RDS(on) MAX, 299 A ID MAX
Features
- Low QRR, Soft Recovery Body Diode
- Low RDS(on) to Minimize Conduction Losses
- Low QG and Capacitance to Minimize Driver Losses
- AEC-Q101 Qualified and PPAP Capable
- Pb-Free, Halogen Free/BFR Free and RoHS Compliant
Typical Applications
- Synchronous Rectification (SR) in DC-DC and AC-DC
- Primary Switch in Isolated DC-DC Converters
- Motor Drives
- Automotive 48 V Systems
Maximum Ratings
The following table lists the maximum ratings for the NVBLS1D2N08X MOSFET. Stresses exceeding these limits may damage the device, affect functionality, or impact reliability.
Parameter | Symbol | Value | Unit |
---|---|---|---|
Drain-to-Source Voltage | VDSS | 80 | V |
Gate-to-Source Voltage | VGS | ±20 | V |
Continuous Drain Current | ID (Tc = 25°C) | 299 | A |
Continuous Drain Current | ID (Tc = 100°C) | 211 | A |
Power Dissipation | PD (Tc = 25°C) | 197 | W |
Pulsed Drain Current | IDM (Tc = 25°C, tp = 100 µs) | 1941 | A |
Operating Junction and Storage Temperature Range | TJ, Tstg | -55 to +175 | °C |
Source Current (Body Diode) | IS | 332 | A |
Single Pulse Avalanche Energy (IPK = 94 A) | EAS | 441 | mJ |
Lead Temperature for Soldering Purposes (1/8" from case for 10 s) | TL | 260 | °C |
Note on Ratings: Actual continuous current is limited by thermal and electromechanical application board design. EAS is based on TJ = 25°C, rated IAS, VDD = 64 V, VGS = 10 V, 100% avalanche tested.
Electrical Characteristics
Thermal Characteristics
Parameter | Symbol | Value | Unit |
---|---|---|---|
Thermal Resistance, Junction-to-Case | RθJC | 0.76 | °C/W |
Thermal Resistance, Junction-to-Ambient | RθJA | 30 | °C/W |
Electrical Characteristics (TJ = 25°C unless otherwise noted)
Parameter | Symbol | Test Conditions | Min | Typ | Max | Unit |
---|---|---|---|---|---|---|
OFF CHARACTERISTICS | ||||||
Drain-to-Source Breakdown Voltage | V(BR)DSS | VGS = 0 V, ID = 1 mA, TJ = 25°C | 80 | V | ||
Drain-to-Source Breakdown Voltage Temperature Coefficient | ΔV(BR)DSS/ ΔTJ | ID = 1 mA, Referenced to 25°C | 33 | mV/°C | ||
Zero Gate Voltage Drain Current | IDSS | VDS = 80 V, TJ = 25°C | 1.0 | µA | ||
Zero Gate Voltage Drain Current | IDSS | VDS = 80 V, TJ = 125°C | 250 | µA | ||
Gate-to-Source Leakage Current | IGSS | VGS = 20 V, VDS = 0 V | 100 | nA | ||
ON CHARACTERISTICS | ||||||
Drain-to-Source On Resistance | RDS(on) | VGS = 10 V, ID = 95 A, TJ = 25°C | 0.95 | 1.1 | mΩ | |
Drain-to-Source On Resistance | RDS(on) | VGS = 6 V, ID = 95 A, TJ = 25°C | 1.4 | mΩ | ||
Gate Threshold Voltage | VGS(th) | VGS = VDS, ID = 475 µA, TJ = 25°C | 2.4 | 3.6 | V | |
Gate Threshold Voltage Temperature Coefficient | ΔVGS(th)/ ΔTJ | VGS = VDS, ID = 475 µA | -7 | mV/°C | ||
Forward Transconductance | gFS | VDS = 10 V, ID = 95 A | 294 | S | ||
CHARGES, CAPACITANCES & GATE RESISTANCE | ||||||
Input Capacitance | Ciss | VDS = 40 V, VGS = 0 V, f = 1 MHz | 8618 | pF | ||
Output Capacitance | Coss | 2458 | pF | |||
Reverse Transfer Capacitance | Crss | 37 | pF | |||
Output Charge | Qoss | 175 | nC | |||
Total Gate Charge | QG(tot) | VDD = 64 V, ID = 95 A, VGS = 10 V | 121 | nC | ||
Threshold Gate Charge | QG(th) | 26 | nC | |||
Gate-to-Source Charge | Qgs | 40 | nC | |||
Gate-to-Drain Charge | Qgd | 19 | nC | |||
Gate Resistance | Rg | f = 1 MHz | 0.67 | Ω | ||
SWITCHING CHARACTERISTICS | ||||||
Turn-On Delay Time | td(on) | Resistive Load, VGS = 0/10 V, VDD = 64 V, ID = 95 A, RG = 2.5 Ω | 40 | ns | ||
Rise Time | tr | 23 | ns | |||
Turn-Off Delay Time | td(off) | 65 | ns | |||
Fall Time | tf | 12 | ns | |||
SOURCE-TO-DRAIN DIODE CHARACTERISTICS | ||||||
Forward Diode Voltage | VSD | IS = 95 A, VGS = 0 V, TJ = 25°C | 0.83 | 1.2 | V | |
Forward Diode Voltage | VSD | IS = 95 A, VGS = 0 V, TJ = 125°C | 0.67 | V | ||
Reverse Recovery Time | trr | VGS = 0 V, IS = 95 A, dI/dt = 1000 A/µs, VDD = 64 V, TJ = 25°C | 32 | ns | ||
Charge Time | ta | 17 | ns | |||
Discharge Time | tb | 15 | ns | |||
Reverse Recovery Charge | Qrr | 307 | nC |
Typical Characteristics
Figure 1. On-Region Characteristics
This graph plots Drain Current (ID) versus Drain-Source Voltage (VDS) for various Gate-Source Voltages (VGS) at a junction temperature of 25°C. It illustrates the MOSFET's behavior in the saturation and linear (ohmic) regions.
Figure 2. Transfer Characteristics
This graph shows Drain Current (ID) versus Gate-Source Voltage (VGS) for different junction temperatures (TJ = -55°C, 25°C, 175°C) at a Drain-Source Voltage (VDS) of 5V. It highlights the gate threshold voltage and current transfer efficiency.
Figure 3. On-Resistance vs. Gate Voltage
This graph displays the Drain-to-Source On-Resistance (RDS(on)) in mΩ as a function of Gate-Source Voltage (VGS) at a junction temperature of 25°C. It shows how RDS(on) decreases with increasing VGS.
Figure 4. On-Resistance vs. Drain Current
This graph illustrates the Drain-to-Source On-Resistance (RDS(on)) in mΩ as a function of Drain Current (ID) for different Gate-Source Voltages (VGS) at a junction temperature of 25°C. It shows the impact of current on conduction losses.
Figure 5. Normalized ON Resistance vs. Junction Temperature
This graph plots the normalized ON-Resistance (RDS(on)) versus Junction Temperature (TJ) for a constant Drain Current (ID) of 95A and Gate-Source Voltage (VGS) of 10V. It indicates the temperature dependency of the conduction resistance.
Figure 6. Drain Leakage Current vs Drain Voltage
This graph shows the Drain Leakage Current (IDSS) in nA as a function of Drain-Source Voltage (VDS) for different junction temperatures (TJ = 85°C, 125°C, 150°C) with the Gate-Source Voltage (VGS) set to 0V. It illustrates the off-state leakage characteristics.
Figure 7. Capacitance Characteristics
This graph presents various capacitances (Ciss, Coss, Crss) in pF as a function of Gate-Source Voltage (VGS) at a Drain-Source Voltage (VDS) of 40V and a frequency of 1 MHz. It shows the voltage dependency of input, output, and reverse transfer capacitances.
Figure 8. Gate Charge Characteristics
This graph plots Gate Charge (QG) in nC against VGS, Gate to Source Voltage (V), for a constant VDD of 64V, ID of 95A, and varying VGS values. It illustrates the charge required to switch the MOSFET.
Figure 9. Resistive Switching Time Variation vs. Gate Resistance
This graph shows switching times (td(on), tr, td(off), tf) in seconds as a function of Gate Resistance (RG) in Ohms. It demonstrates how gate resistance affects switching speed under specific test conditions (VDD=64V, ID=95A, VGS=0/10V).
Figure 10. Diode Forward Characteristics
This graph plots Source Current (IS) in Amperes against Body Diode Forward Voltage (VSD) in Volts for different junction temperatures (TJ = 25°C, 125°C) with VGS = 0V. It characterizes the internal body diode's forward conduction.
Figure 11. Safe Operating Area (SOA)
This graph shows the Safe Operating Area (SOA) for the MOSFET, plotting Drain Current (ID) in Amperes against Drain-Source Voltage (VDS) in Volts. It indicates the maximum allowable operating conditions under various pulse durations and temperature limits (TJ = 25°C, TJ = 175°C).
Figure 12. Avalanche Current vs Pulse Time (UIS)
This graph illustrates the Unclamped Inductive Switching (UIS) capability, plotting Avalanche Current (IAS) in Amperes against Time in Avalanche (t) in seconds for different junction temperatures (TJ = 25°C, 100°C, 150°C). It shows the device's ability to withstand avalanche breakdown.
Figure 13. Gate Threshold Voltage vs Junction Temperature
This graph shows the normalized Gate Threshold Voltage (VTH) as a function of Junction Temperature (TJ) for a constant Drain Current (ID) of 475µA. It depicts how the threshold voltage changes with temperature.
Figure 14. Maximum Current vs. Case Temperature
This graph plots the Maximum Drain Current (ID) in Amperes against Case Temperature (TC) in °C. It shows the current derating capability based on the case temperature.
Figure 15. Transient Thermal Response
This graph displays the Effective Transient Thermal Impedance (ZθJC) in °C/W as a function of Rectangular Pulse Duration (t) in seconds for various duty cycles (D). It is used for calculating transient thermal behavior.
Package Dimensions
The NVBLS1D2N08X is supplied in the H-PSOF8L, 11.68x9.80x2.30 mm, 1.20P package, CASE 100CU, ISSUE F. The dimensions and land pattern recommendations are provided for PCB layout and assembly.
DIM | MILLIMETERS | MILLIMETERS | |||||
---|---|---|---|---|---|---|---|
MIN | NOM | MAX | MIN | NOM | MAX | ||
A | 2.20 | 2.30 | 2.40 | E5 | 9.36 | 9.46 | 9.56 |
A1 | 1.70 | 1.80 | 1.90 | E6 | 1.10 | 1.20 | 1.30 |
b | 0.70 | 0.80 | 0.90 | E7 | 0.15 | 0.18 | 0.21 |
b1 | 9.70 | 9.80 | 9.90 | ||||
b2 | 0.35 | 0.45 | 0.55 | ||||
C | 0.40 | 0.50 | 0.60 | ||||
D | 10.28 | 10.38 | 10.48 | H | 11.58 | 11.68 | 11.78 |
D/2 | 5.09 | 5.19 | 5.29 | H/2 | 5.74 | 5.84 | 5.94 |
D1 | 10.98 | 11.08 | 11.18 | H1 | 7.15 | BSC | |
D2 | 3.20 | 3.30 | 3.40 | L | 1.90 | 2.00 | 2.10 |
D3 | 2.60 | 2.70 | 2.80 | L1 | 0.60 | BSC | |
D4 | 4.45 | 4.55 | 4.65 | L2 | 0.50 | 0.60 | 0.70 |
D5 | 3.20 | 3.30 | 3.40 | L3 | 0.70 | 0.80 | 0.90 |
D6 | 0.55 | 0.65 | 0.75 | θ | 10° | REF | |
E | 9.80 | 9.90 | 10.00 | θ1 | 10° | REF | |
E1 | 7.30 | 7.40 | 7.50 | aaa | 0.20 | ||
E2 | 0.30 | 0.40 | 0.50 | bbb | 0.25 | ||
E3 | 7.40 | 7.50 | 7.60 | ccc | 0.20 | ||
E4 | 8.20 | 8.30 | 8.40 | ddd | 0.20 | ||
eee | 0.10 |
Generic Marking Diagram
The generic marking diagram indicates the placement of the part number (AYWWZZ), assembly location (A), year (Y), work week (WW), assembly lot code (ZZ), and specific device code (XXXX). Note that Pb-Free indicators may or may not be present.
Additional Information and Disclaimers
This document provides technical information for the onsemi NVBLS1D2N08X MOSFET. onsemi disclaims liability for product suitability, accuracy of information, and unauthorized use in critical applications like life support or medical devices. Buyers are responsible for validating parameters and ensuring compliance with all applicable laws and safety standards. onsemi products are not authorized for use in critical components for life support systems or medical devices without explicit authorization.
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