STMicroelectronics TN1317 Self Test Configuration for SPC58xNx Device User Manual
Learn how to configure the self-test control unit for SPC58xNx devices with STMicroelectronics TN1317. This guide covers Memory and Logic Built-In Self Test (MBIST and LBIST) for detecting latent failures. Discover how to run self-test in both online and offline mode, as well as the recommended MBIST configuration. For more details, consult chapter 7 of the RM0421 SPC58xNx reference manual.