ZEISS Axio Zoom.V16: Automated Imaging Systems

High resolution and high speed: your zoom microscope for large object fields.

Product Overview

The ZEISS Axio Zoom.V16 is the high resolution, apochromatically corrected on-axis zoom microscope from ZEISS. With a magnification range of 16:1, it allows users to zoom from a large overview (33 mm) down to the smallest detail (0.7 µm).

The Axio Zoom.V16 achieves a maximum resolution of up to 0.3 µm in a 1.6 mm field. This is particularly advantageous for automated etching of large tile images, reducing image acquisition times and significantly speeding up analysis tasks.

Simpler. More Intelligent. More Integrated.

The Axio Zoom.V16 combines a 16x zoom with a 0.25 numerical aperture, providing up to 2.5 times higher resolution compared to CMO stereo microscopes in comparable fields.
The eZoom principle integrates the zoom drive with an electronically-controlled iris diaphragm. Users can select their zoom mode at the touch of a button, offering maximum resolution at higher magnifications and greater depth of field.
The EpiRel contrast feature makes minor height differences visible in brightfield by illuminating the sample from a slight lateral angle, even with coaxial reflected light. This creates shadows that enhance the plasticity of the object compared to conventional brightfield.

Created for your applications

Analyze the structural elements of components such as phases, grain size, textures, and excretions, as well as structural defects like inclusions, pores, cavities, and cracks.
Create overview images of entire components and zoom in on the smallest details without changing the objective.
Capture the morphology and inner structure of wafers.

Example Applications:

Spark plug: Inspection of functional ceramic parts; analysis of different material structures like pore formation in ceramics for insulators, conductive composite materials, and steel and copper pins.
Carbon brush: Extensive views of structural homogeneity; distribution of conductive phases such as Cu particles and hard phases; visualization of manufacturing effects.

Configured to your requirements

Microscope

Axio Zoom.V16 (manual focus)
Axio Zoom.V16 (focus motor)

Illumination methods

Transmitted light: brightfield, darkfield, oblique light
Reflected light: brightfield, darkfield, oblique light, fluorescence

Illumination

Cold light sources CL 1500 Eco, CL 6000 LED, CL 9000 LED CAN with fiber optic spot; ring, linear, vertical, diffusion, surface and coaxial illuminators; VisiLED ring illuminators with segmenting function, fiber optic and LED transmitted light units.

Accessories

Eyepieces, eyepiece reticles, interchangeable lenses, stages, polarization equipment, binocular and trinocular tubes, stands for stages, boom stands.

Specifications Comparison

Find the microscope system that best suits your application.

Comparison Table

The following table compares various ZEISS microscope systems based on different application requirements and job functions. A detailed breakdown of features like sample type suitability, throughput, analysis capabilities, and image acquisition is provided.

Sample	Stemi 305	Stemi 508	Discovery.V8	Primotech	Axio Vert.A1	Axio Lab.A1	Axio Discovery.V12/V20	Axio Scope.A1	Smartzoom 5	Axio Zoom.V16	Axio Imager 2 Vario	Axio Imager	Axio Observer	Shuttle & Find NMI	Particle Analyzer CAPA	O-INSPECT	O-SELECT
Use of unprepared samples	●●●●●	●●●●	●●●	●●●	●●●●●	●●●●	●●●●●	●●●●	●●●●●	●●●●●	●●●●●	●●●●	●●●●	●●●	●●●	●●●●●	●●●●●
Large samples	●●●	●●●	●	●	●●●●	●●●	●●●●	●●●	●●●●	●●●●	●●●●●	●●●●	●●●●	●●●	●●●	●●●●●	●●●●●
High sample throughput	●●●	●●●	●●	●●	●●●●	●●●	●●●●	●●●	●●●●	●●●●	●●●●●	●●●●	●●●●	●●●	●●●	●●●●●	●●●●●
Analyze sample composition	●●	●●	●	●	●●●	●●	●●●	●●	●●●	●●●	●●●●	●●●	●●●	●●	●●	●●●●●	●●●●●
Job to be done	●●●	●●●	●●	●●	●●●●	●●●	●●●●	●●●	●●●●	●●●●	●●●●●	●●●●	●●●●	●●●	●●●	●●●●●	●●●●●
Creation of reports	Less suitable	Particularly suitable	Particularly suitable	Particularly suitable	Particularly suitable	Particularly suitable	Particularly suitable	Particularly suitable	Particularly suitable	Particularly suitable	Particularly suitable	Particularly suitable	Particularly suitable	Particularly suitable	Particularly suitable	Particularly suitable	Particularly suitable
2D measurement functionality	●●	●●	●●	●●	●●●●	●●●	●●●●	●●●	●●●●	●●●●	●●●●●	●●●●	●●●●	●●●	●●●	●●●●●	●●●●●
Resolution	●●●●	●●●●	●●●	●●●	●●●●●	●●●●	●●●●●	●●●●	●●●●	●●●●	●●●●●	●●●●	●●●●	●●●	●●●	●●●●●	●●●●●
Live 3D impression	●●	●●	●●	●●	●●●	●●	●●●	●●	●●●●	●●●●	●●●●●	●●●	●●●	●●	●●	●●●●●	●●●●●
3D image	●	●	●	●	●●●	●	●●●	●	●●●	●●●	●●●●●	●●	●●	●	●	●●●●●	●●●●●
Image acquisition and documentation	●●●	●●●	●●●	●●●	●●●●	●●●	●●●●	●●●	●●●●	●●●●	●●●●●	●●●●	●●●●	●●●	●●●	●●●●●	●●●●●

*) Maximum permissible error (MPE)

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