UNI-T 100M BASE-TX Ethernet Compliance Test User Manual

1. Ethernet Compliance Analysis Overview

Ethernet is the most widely adopted computer networking technology, originating in 1973. Initially, 10Mbps Ethernet was sufficient for most networking needs. By 2008, 100Mbps Ethernet, known as Fast Ethernet, was introduced to provide a tenfold speed improvement over existing twisted-pair cabling. 100BASE-TX is a key physical layer specification within the Fast Ethernet standard. Ethernet compliance testing adheres to IEEE and ANSI standards. While there isn't a central certification authority for Ethernet, compliance testing is crucial during device development to ensure interoperability between products from different manufacturers. For 100BASE-TX, this testing typically includes amplitude, time-domain, jitter, and eye diagram mask testing.

2. Test Items and Standard

2.1 Test Items

AOI Template Test
AOI Rise/Fall Edge Time Test
Overshoot Test
Peak Differential Voltage Test
Jitter/Duty Ratio Distortion Test

2.2 Test Standard

Test Items	Test Sub-items	Reference Standard
AOI Template Test	UTP AOI template	IEEE 802.3-2018, Clause 25 ANSI X3.263-1995, Appendix J
AOI Rise/Fall Edge Time Test	AOI +Vout fall time	IEEE 802.3-2018, Clause 25 ANSI X3.263-1995, Section 9.1.6
	AOI -Vout rise time
	AOI +Vout rise time
	AOI -Vout fall time
	AOI +Vout rise/fall time symmetry
	AOI -Vout rise/fall time symmetry

Test Items	Test Sub-items	Reference Standard
Overshoot Test	Overshoot (Positive pulse width)	IEEE802.3-2018, Clause 25 ANSI X3.263-1995, Section 9.1.3
Overshoot Test	Overshoot (Negative pulse width)	IEEE802.3-2018, Clause 25 ANSI X3.263-1995, Section 9.1.3
Peak Differential Voltage Test	UTP differential output voltage (Pos)	IEEE802.3-2018, Clause 25 ANSI X3.263-1995, Section 9.1.2.2
Peak Differential Voltage Test	UTP differential output voltage (Neg)	IEEE802.3-2018, Clause 25 ANSI X3.263-1995, Section 9.1.2.2
Jitter/Duty Ratio Distortion Test	Signal amplitude symmetry	IEEE 802.3-2018, Clause 25 ANSI X3.263-1995, Section 9.1.8
Jitter/Duty Ratio Distortion Test	Duty ratio distortion Transmitter jitter (Pos) Transmitter jitter (Neg)	IEEE 802.3-2018, Clause 25 ANSI X3.263-1995, Section 9.1.8

3. Test Equipment

3.1 Requirements

Oscilloscope: Bandwidth > 1GHz, with Ethernet compliance test software installed.
Ethernet Compliance Test Fixture: Provides signal access points.
Active Differential Probe: Bandwidth ≥ 1.5GHz.

3.2 Configuration

Component	Configuration
Oscilloscope	> 1GHz bandwidth, recommended: MSO7000X, MSO8000HD series
Active Differential Probe	> 1.5GHz bandwidth, recommended: UT-PD1500, UT-PD2500
Test Fixture	UNI-T Ethernet compliance test fixture (UT-GBE-FT) or association-recommended
100BASE-T Compliance Test Software	UNI-T CTS-ENET100
CAT6 Network Cable	Compliant with transmission line requirements

UNI-T's high-bandwidth oscilloscopes, MSO8000HD (up to 8GHz, 20GSa/s) and MSO7000X (up to 2GHz, 10GSa/s) series, feature a 12-bit ADC for accurate measurements. They offer excellent signal integrity with a noise floor below 800µV and low intrinsic jitter (150fs RMS).

Active differential probes, such as the UT-PD2500 (2.5GHz) and UT-PD1500 (1.5GHz), are recommended for their bandwidth and reliable connection to the Device Under Test (DUT).

The UT-GBE-FT fixture supports both 100BASE-T and 1000BASE-T compliance testing, divided into zones for signal access and interference minimization.

Diagram Description: The document includes images of the UNI-T Ethernet Test Main Fixture and the Return Loss Calibration Fixture.

4. Compliance Test Software

The UNI-T CTS-ENET100 software automates oscilloscope configuration and test execution for physical-layer compliance. It offers graphical guidance for setup, ensuring accurate and repeatable results. Key features include single-test or batch testing, an intuitive user interface, automated oscilloscope control, comprehensive report generation, and flexible parameter configuration.

Diagram Description: A screenshot shows the UNI-T CTS-ENET100 software interface with the 'Compliance' icon highlighted in the Start menu.

4.1 Test Setup

To configure a test, navigate to the 'Setup' menu. Here, you can define the DUT project (e.g., 'Ethernet 100Base-TX') and specify the IP address if needed. The 'Project' section allows selection of specific test items, marked with a checkmark. After selection, click 'Start' to begin.

Diagram Description: Screenshots illustrate the 'Test Settings' and 'Test Items Settings' interfaces of the UNI-T CTS-Compliance Analysis Software. The 'Test Items Settings' show a list of available tests with '+' icons to expand sub-items for individual configuration.

Users can configure parameters like the number of acquisitions, failure thresholds, and template sizes for the AOI template test, and the number of averages and acquisition modes for other tests.

The 'Acquisition' menu allows setting the signal type (differential or single-ended) and channel source.

The 'Limit Editor' enables viewing and customizing compliance standards for selected test items.

Diagram Description: Screenshots show the 'Waveform Acquisition Settings' and 'Limit Editor Settings' interfaces, detailing signal type, channel, and parameter limits for various tests.

4.2 Test Status

Click the 'Status' menu to view the progress and logs of selected test items.

Diagram Description: A screenshot displays the 'Test Status Settings' interface, showing a list of completed tests.

4.3 Test Results

After testing, select 'Results' to review detailed test outcomes, including reference thresholds, test values, margins, and pass/fail status.

Diagram Description: A screenshot shows the 'Test Results Settings' interface, presenting a table of test results with columns for Name, Lower/Upper Limit, Unit, Value, Margin, and Detail.

4.4 Save Settings

The 'Settings' menu allows configuring screenshot capture options such as area, color, image type, and save location.

Diagram Description: A screenshot shows the 'Save Settings' interface, with options for Area, Color, Image Type, and Save Location.

4.5 Test Report

The 'Report' menu provides options for configuring report generation, including update methods, content inclusion (LOGO, Header, Pass/Fail, Image), report type (PDF), report name, and save location. An option to automatically open the report after generation is also available.

Diagram Description: A screenshot shows the 'Test Report Settings' interface, detailing report configuration options.

5. Test Environment Setup and Packet Transmission Control

100BASE-TX Ethernet compliance testing requires specific test waveforms as defined by the IEEE 802.3 standard. A packet transmission tool is used to send these test packets. The test fixture includes an auto-negotiation mode Link Partner that transmits 100Mbps idle waveforms. The setup involves connecting the DUT's transmit signal to the fixture's Ethernet port and the fixture's Ethernet port to the DUT's receive terminal. A differential probe captures the waveform for display on the oscilloscope.

Diagram Description: The document includes a diagram illustrating the test environment setup, showing the connection between the oscilloscope, active differential probe, DUT, and the UNI-T test fixture, including power supply connections.

6. Compliance Test Items

6.1 AOI Template Test

6.1.1 Calculation Method

The AOI (output interface) mask test verifies if transmission signals meet industry standards for jitter, overshoot, rise/fall times, and signal noise. The test uses a mask with a 5% geometric tolerance as defined by the ANSI X3.263 standard. The software compares the Ethernet eye diagram waveform against this mask. Any violation results in a 'Fail'. The DUT must transmit idle-mode waveforms encoded with MLT-3 for this test.

Diagram Description: An image displays a typical eye diagram, showing normalized amplitude versus time, with superimposed waveforms and mask boundaries.

6.1.2 Test Procedure

Select AOI test: Navigate to Setup > Project and select AOI.
Configure waveform acquisition: In the Acquisition menu, set the signal type (differential or single-ended) and channel source.
Select comparison standard: In the Limit Editor menu, choose the desired standard.
Start the test: Click Start.
Set up the test environment: Follow the on-screen connection diagram prompts. Click Continue to proceed.
Handle errors: If connection or waveform errors occur, the log will display a timeout and the connection diagram. Correct connections, resend the waveform, and click Continue.
Oscilloscope verification: The oscilloscope verifies the test signal, captures pulses, and measures the signal against compliance parameters. The software records the results.

Diagram Description: A screenshot shows the software interface during the AOI Template test, with 'Continue', 'Retry', and 'Skip' buttons.

6.1.3 Test Results

The AOI Template test result indicates 'Pass' if the eye pattern conforms to the standard template without intersection points. The test measures 'Hits' against a specified limit.

Diagram Description: A screenshot shows the UTP AOI Template test results, indicating 'Pass' and displaying measurement values.

6.2 AOI Rise/Fall Time Test

6.2.1 Calculation Method

This test measures the rise and fall times of positive and negative pulse widths and evaluates their symmetry.

AOI +Vout rise time: Measures rise time from 0V to +Vout (Threshold: 3-5ns).
AOI +Vout fall time: Measures fall time from +Vout to 0V (Threshold: 3-5ns).
AOI +Vout rise/fall time symmetry: Difference between rise and fall times (must be ≤ 500ps).
AOI -Vout rise time: Measures rise time from 0V to -Vout (Threshold: 3-5ns).
AOI -Vout fall time: Measures fall time from -Vout to 0V (Threshold: 3-5ns).
AOI -Vout rise/fall time symmetry: Difference between rise and fall times (must be ≤ 500ps).
AOI overall rise/fall time symmetry: Difference between maximum and minimum rise/fall times across all pulses (must be ≤ 500ps).

6.2.2 Test Procedure

Select AOI rise/fall time test: In Setup > Project, select AOI Rise/Fall Time.
Configure waveform acquisition: In the Acquisition menu, set signal type and channel.
Select comparison standard: In the Limit Editor menu, choose the desired standard.
Start the test: Click Start.
Set up the test environment: Follow connection diagram prompts. Click Continue.
Handle errors: Address connection or waveform errors as indicated in the log. Click Continue.
Oscilloscope verification: The oscilloscope verifies the signal and measures it against parameters. The software records results.

6.2.3 Test Results

AOI +Vout Rise Time: Measures the time for the signal to rise from 0V to +Vout (10% to 90% of +Vout). Standard: 3.0ns ≤ trise ≤ 5.0ns.

Diagram Description: A waveform screenshot shows the AOI +Vout Rise Time measurement.

AOI +Vout Fall Time: Measures the time for the signal to fall from +Vout to 0V (90% to 10% of +Vout). Standard: 3.0ns ≤ tfall ≤ 5.0ns.

Diagram Description: A waveform screenshot shows the AOI +Vout Fall Time measurement.

AOI +Vout Rise/Fall Time Symmetry: Measures the difference between rise and fall times of positive pulses. Standard: ≤ 500ps.

Diagram Description: A waveform screenshot shows the AOI +Vout Rise/Fall Time Symmetry measurement.

AOI -Vout Rise Time: Measures the time for the signal to rise from -Vout to 0V (10% to 90% of -Vout). Standard: 3.0ns ≤ trise ≤ 5.0ns.

Diagram Description: A waveform screenshot shows the AOI -Vout Rise Time measurement.

AOI -Vout Fall Time: Measures the time for the signal to fall from 0V to -Vout (90% to 10% of -Vout). Standard: 3.0ns ≤ tfall ≤ 5.0ns.

Diagram Description: A waveform screenshot shows the AOI -Vout Fall Time measurement.

AOI -Vout Rise/Fall Time Symmetry: Measures the difference between rise and fall times of negative pulses. Standard: ≤ 500ps.

Diagram Description: A waveform screenshot shows the AOI -Vout Rise/Fall Time Symmetry measurement.

6.3 Overshoot Test

6.3.1 Calculation Method

This test verifies waveform overshoot against compliance limits for positive and negative pulses. A result is 'Pass' if overshoot is less than 5% of the average differential output voltage; otherwise, it's 'Fail'.

6.3.2 Test Procedure

Select overshoot test: In Setup > Project, select Overshoot.
Configure waveform acquisition: In the Acquisition menu, set signal type and channel.
Select comparison standard: In the Limit Editor menu, choose the desired standard.
Start the test: Click Start.
Set up the test environment: Follow connection diagram prompts. Click Continue.
Handle errors: Address connection or waveform errors. Click Continue.
Oscilloscope verification: The oscilloscope verifies the signal and measures it. The software records results.

6.3.3 Test Results

Results are provided for Overshoot (Positive Pulse Width) and Overshoot (Negative Pulse Width), indicating 'Pass' if within limits.

Diagram Description: Waveform screenshots illustrate the Overshoot (Positive Pulse Width) and Overshoot (Negative Pulse Width) test results.

6.4 Peak Differential Voltage Test

6.4.1 Calculation Method

This test comprises differential output voltage amplitude and signal amplitude symmetry tests.

Differential output voltage amplitude: Verifies if the DUT's differential output voltage is within compliance limits (950mV to 1050mV for absolute voltage amplitude).
Signal amplitude symmetry: Calculates the ratio between average positive and negative amplitudes. The absolute value of this ratio must be between 0.98 and 1.02.

6.4.2 Test Procedure

Select peak differential voltage test: In Setup > Project, select Peak Differential Voltage.
Configure waveform acquisition: In the Acquisition menu, set signal type and channel.
Select comparison standard: In the Limit Editor menu, choose the desired standard.
Start the test: Click Start.
Set up the test environment: Follow connection diagram prompts. Click Continue.
Handle errors: Address connection or waveform errors. Click Continue.
Oscilloscope verification: The oscilloscope verifies the signal and measures it. The software records results.

6.4.3 Test Results

UTP Differential Output Voltage (Pos): Measures the positive pulse (+Vout) average voltage within a specified time window after the signal transition. Pass condition: 950mV ≤ Vout ≤ 1050mV.

Diagram Description: A diagram illustrates the measurement window for differential output voltage. Waveform screenshots show UTP +Vout Differential Output Voltage test results.

TP Differential Output Voltage (Neg): Measures the negative pulse (-Vout) average voltage within a specified time window after the signal transition. Pass condition: 950mV ≤ Vout ≤ 1050mV.

Diagram Description: Waveform screenshots show UTP -Vout Differential Output Voltage test results.

Amplitude Symmetry: Evaluates the ratio of positive to negative amplitudes. Pass condition: 0.98 to 1.02.

Diagram Description: Waveform screenshots show Signal Amplitude Symmetry (Pos) and Signal Amplitude Symmetry (Neg) test results.

6.5 Jitter/Duty Ratio Distortion Test

6.5.1 Calculation Method

Transmitter Jitter Test

This test measures peak-to-peak jitter per ANSI X3.263-1995, Clause 9.1.9, evaluating total transmission jitter caused by duty cycle distortion and baseline drift. It uses a histogram of waveform crossing points. For MLT-3 signals in 100BASE-TX, jitter is measured at upper and lower voltage crossing points.

Transmitter Jitter (Positive Pulse Width): Maximum jitter must not exceed 1.4ns. The DUT transmits MLT-3 idle-mode waveforms. The test measures differences between actual edge positions and ideal clock positions over 40,000-100,000 UIs.

Transmitter Jitter (Negative Pulse Width): The procedure is the same as for positive pulse widths, but measurements are taken at the edges of negative pulse widths.

Duty Ratio Distortion Test

This test, per ANSI X3.263-1995, Clause 9.1.8, evaluates signal symmetry by measuring the difference between high-level and low-level signal durations. Pass/fail is based on the deviation from the theoretical value.

Times are measured where the average waveform crosses the Vout/2 level. Calculations for Tx (x=1 to 6) involve time differences (t1, t2, t3, t0) and specific intervals (16ns, 32ns, 48ns). Peak-to-peak duty ratio distortion is the maximum absolute value of T1-T6. The standard requires this to be less than 500ps.

Diagram Description: A diagram illustrates the measurement of times (t1, t2, t3, t4) and voltage levels (+Vout, Vout/2, 0, -Vout) for duty ratio distortion calculation.

6.5.2 Test Procedure

Select jitter/duty ratio distortion: In Setup > Project, select Jitter/Duty Ratio Distortion.
Configure waveform acquisition: In the Acquisition menu, set signal type and channel.
Select comparison standard: In the Limit Editor menu, choose the desired standard.
Start the test: Click Start.
Set up the test environment: Follow connection diagram prompts. Click Continue.
Handle errors: Address connection or waveform errors. Click Continue.
Oscilloscope verification: The oscilloscope verifies the signal and measures it. The software records results.

6.5.3 Test Results

Results are provided for Transmit Jitter (Pos), Transmit Jitter (Neg), and Duty Cycle Distortion, indicating 'Pass' if within specified limits.

Diagram Description: Waveform screenshots show Transmit Jitter (Pos), Transmit Jitter (Neg), and Duty Cycle Distortion test results.

Limited Warranty and Liability

UNI-T warrants the Instrument product against defects in material and workmanship for three years from the purchase date. This warranty excludes damages from accident, negligence, misuse, modification, contamination, or improper handling. For warranty service, contact your seller directly. UNI-T is not liable for special, indirect, incidental, or subsequent damages. Probes and accessories have a one-year warranty. Full warranty information is available at instrument.uni-trend.com.

Diagram Description: Two QR codes are displayed. The left QR code links to www.instruments.uni-trend.com for more information. The right QR code is for product registration.

UNI-T is a licensed trademark of UNI-TREND TECHNOLOGY (CHINA) CO., Ltd. UNI-T products are protected by patents. This manual supersedes all previous versions and is subject to update without notice. For product information, applications, or service, contact UNI-T support via www.uni-trend.com.

Company Contact Information:

Headquarter: UNI-TREND TECHNOLOGY (CHINA) CO., Ltd., Dongguan, China. Tel: (86-769) 8572 3888.
Europe: UNI-TREND TECHNOLOGY EU GmbH, Augsburg, Germany. Tel: +49 (0)821 8879980.
North America: UNI-TREND TECHNOLOGY US INC., Fort Worth, Texas, USA. Tel: +1-888-668-8648.

	UNI-T UT-GBE-FT 100/1000M Ethernet Compliance Test Fixture User Manual User manual for the UNI-T UT-GBE-FT, a 100/1000M Ethernet Compliance Test Fixture, detailing its features, setup, testing procedures, and specifications for Ethernet compliance testing.
	UNI-T USB 2.0 Compliance Tests User Manual This user manual provides comprehensive guidance for performing USB 2.0 compliance tests using UNI-T's MSO7000X and MSO8000HD oscilloscopes and CTS-USB20 software. It details test procedures for signal quality and non-signal quality tests, equipment requirements, and software operation.
	UNI-T UT320D Mini Single Input Thermometer User Manual User manual for the UNI-T UT320D Mini Single Input Thermometer, detailing features, safety instructions, structure, operation, and specifications for accurate temperature measurement.
	UT320D Mini Single Input Thermometer User Manual \| UNI-T Comprehensive user manual for the UNI-T UT320D Mini Single Input Thermometer. Learn about features, operation, specifications, and safety instructions for this K/J thermocouple thermometer.
	UNI-T MSO7000X Series Mixed Signal Oscilloscope Datasheet Datasheet for the UNI-T MSO7000X Series Mixed Signal Oscilloscope, detailing its features, specifications, and capabilities including bandwidth, sample rate, memory depth, and advanced analysis tools.
	UNI-T UT-PA2000/UT-PA1000 Active Single-Ended Probe User Manual This user manual provides comprehensive information on the UNI-T UT-PA2000 and UT-PA1000 active single-ended probes, covering their features, specifications, safety guidelines, operation, maintenance, and warranty.
	UNI-T UT320A Mini Single Input Thermometer User Manual User manual for the UNI-T UT320A Mini Single Input Thermometer, detailing features, operation, safety instructions, and technical specifications for K-type and J-type thermocouples.
	UNI-T UT-CK02 Test Kit: High-Frequency Applications Overview of the UNI-T UT-CK02 test kit for high-frequency applications, detailing its components, specifications, and performance characteristics including RF cables, adapters, and measurement graphs.