Samsung Electro-Mechanics Automotive MLCC Specification

Supplier: Samsung Electro-Mechanics

Product: Multi-Layer Ceramic Capacitor (MLCC)

Samsung P/N: CL05B102KB5VPNC

Description: CAP, 1nF, 50V, ±10%, X7R, 0402, AEC-Q200 Qualified

Product Overview

This document provides the specification reference sheet for the Samsung Electro-Mechanics Automotive Multi-Layer Ceramic Capacitor (MLCC) with the part number CL05B102KB5VPNC. This capacitor is designed for automotive applications and is AEC-Q200 qualified.

Key Specifications:

Dimensions

The physical dimensions of the 0402 size MLCC are as follows:

Dimension Size (inch code) L (mm) W (mm) T (mm) BW (mm)
0402 1.00 ±0.05 0.50 ±0.05 0.50 ±0.05 0.25 ±0.10

Note: L = Length, W = Width, T = Thickness, BW = Break Wall

Samsung Part Number Breakdown

The Samsung part number CL05B102KB5VPNC is structured as follows:

Field Description Value
SeriesMLCC SeriesCL
SizeCase Size Code05 (Corresponds to 0402 inch code)
DielectricDielectric MaterialB (X7R)
CapacitanceNominal Capacitance Code102 (10 x 10^2 pF = 1000 pF = 1 nF)
Capacitance ToleranceTolerance CodeK (±10%)
Rated VoltageVoltage CodeB (50V)
ThicknessThickness Code5 (0.50 mm)
Special CodeSpecial Feature/ApplicationV (Automotive)
PackagingPackaging TypePNC (Normal Cardboard Type, 7" Reel)

Reliability Test and Judgement Condition

The following table summarizes the reliability tests performed on the MLCC and their corresponding conditions and performance criteria:

Test Item Test Condition Performance
High Temperature ExposureUnpowered, 1000 hours @ Max. TemperatureAppearance: No abnormal exterior. Capacitance Change: Within ±10%. Tan δ: 3.0% max. IR: > 10000 MΩ or 500 MΩ (whichever is smaller).
Temperature Cycling1000 Cycles (-55°C to +125°C, 30 min each, 1 min transition)Appearance: No abnormal exterior. Capacitance Change: Within ±10%. Tan δ: 3.0% max. IR: > 10000 MΩ or 500 MΩ (whichever is smaller).
Destructive Physical Analysis (DPA)Per EIA 469No Defects or abnormalities.
Humidity Bias1000 hours, 85°C / 85% RH, Rated Voltage + 1.3~1.5V (Add 100Ω resistor)Appearance: No abnormal exterior. Capacitance Change: Within ±12.5%. Tan δ: 3.5% max. IR: > 500 MΩ or 25 MΩ (whichever is smaller).
High Temperature Operating Life (HTOL)1000 hours @ 125°C, 200% Rated Voltage (Charge/discharge current < 50mA)Appearance: No abnormal exterior. Capacitance Change: Within ±12.5%. Tan δ: 3.5% max. IR: > 1000 MΩ or 50 MΩ (whichever is smaller).
Mechanical ShockThree shocks in each direction (18 shocks total) @ 1500G, 0.5 ms, Half sine waveAppearance: No abnormal exterior. Capacitance Change: Within ±10%. Tan δ: 2.5% max. IR: > 10000 MΩ or 500 MΩ (whichever is smaller).
Vibration5g's for 20 min, 12 cycles each of 3 orientations (10-2000 Hz)Appearance: No abnormal exterior. Capacitance Change: Within ±10%. Tan δ: 2.5% max. IR: > 10000 MΩ or 500 MΩ (whichever is smaller).
Resistance to Solder HeatPreheating: 150°C for 60-120 sec. Solder pot: 260°C ±5°C, 10 sec ±1 sec.Appearance: No abnormal exterior. Capacitance Change: Within ±10%. Tan δ: 2.5% max. IR: > 10000 MΩ or 500 MΩ (whichever is smaller).
ESD (Electrostatic Discharge)AEC-Q200-002 or ISO/DIS10605Appearance: No abnormal exterior. Capacitance Change: Within ±10%. Tan δ: 2.5% max. IR: > 10000 MΩ or 500 MΩ (whichever is smaller).
Solderability95% of terminations soldered evenly and continuously.Appearance: No abnormal exterior. Capacitance Change: Within ±10%. Tan δ: 2.5% max. IR: > 10000 MΩ or 500 MΩ (whichever is smaller).
Electrical CharacterizationMeasured after heat treatment (150°C, 1hr) and 24hr stabilization. Capacitance, Tan δ @ 25°C. IR @ 25°C and 125°C.Capacitance: Within specified tolerance. Tan δ: 2.5% max. IR(25°C): > 10000 MΩ or 500 MΩ. IR(125°C): > 1000 MΩ or 10 MΩ.
Board FlexBending to the limit, 3 mm for 60 sec.Appearance: No abnormal exterior. Capacitance Change: Within ±10%.
Terminal Strength (SMD)2N for 60 sec. (Destruction value > 8N)Appearance: No abnormal exterior. Capacitance Change: Within ±10%.
Beam LoadApplied load to terminals.Appearance: No abnormal exterior. Capacitance Change: Within ±10%.
Temperature Characteristic-55°C to 125°C.Capacitance Change: Within ±15% (for X7R).
Dielectric Strength250% of rated voltage for 1-5 sec.Appearance: No abnormal exterior. Capacitance Change: Within ±10%.

Note on Measurements: Initial measurements are performed after heat treatment and stabilization. Final measurements are taken after the test conclusion and stabilization period (24±2 hours at room temperature). Specific conditions for heat treatment and measurement are detailed in the document.

Recommended Soldering Method

Recommended method is Reflow soldering with a peak temperature of 260°C +0/-5°C for a maximum of 30 seconds, adhering to IPC/JEDEC J-STD-020 D Standard.

Recommended TEST PCB Dimensions

The following tables provide recommended PCB land dimensions for various MLCC sizes to ensure proper adhesion and performance. Materials are typically glass epoxy substrate with copper foil and solder resist.

A. Land Dimensions for Adhesive Strength of Termination

Size CodeSize (mm)a (mm)b (mm)c (mm)
020.4 x 0.20.170.200.26
030.6 x 0.30.300.300.30
051.0 x 0.50.550.400.50
101.6 x 0.81.001.001.20
212.0 x 1.251.401.201.65
313.2 x 1.61.402.202.00
323.2 x 2.51.402.202.90
434.5 x 3.21.753.503.70
555.7 x 5.01.754.505.60

B. Substrate for Bending Strength Test

Size CodeSize (mm)
020.4 x 0.2
030.6 x 0.3
051.0 x 0.5
101.6 x 0.8
212.0 x 1.25
313.2 x 1.6
323.2 x 2.5
434.5 x 3.2
555.7 x 5.0

C. Substrate for Reliability Test

Size Codea (mm)b (mm)c (mm)d (mm)e (mm)
020.20.60.25.05.5
030.30.90.35.05.5
050.41.50.55.05.5
101.03.01.25.05.5
211.24.01.655.05.5
312.25.02.05.05.5
322.25.02.95.05.5
433.57.03.75.05.5
554.58.05.65.05.5

Material: Glass epoxy substrate. Thickness: T=1.6 mm (T=0.8 mm for 03/05 sizes).

⚠️ Caution: Abnormality can occur if lead-based solder (KSD 6704) with 3% silver is used.

Packaging Information

This specification applies to taping of MLCC. Specifications may be changed under agreement if customers require.

1. Taping and Reel Packaging

MLCCs are supplied in tape reels for automated assembly. Standard reel sizes include 7-inch, 10-inch, and 13-inch.

2. BOX Package

Chip Weight

Approximate chip weights (mg/pc) are provided for various MLCC sizes and thicknesses, categorized by dielectric type (e.g., X7R, C0G).

Size(L/W) Inch(mm)Size(T) (mm)Thickness CodeTemp.Weight (mg/pc)
0402 (1005)0.505X7*1.606
0402 (1005)0.606X7*3.288
0402 (1005)0.505C0G1.181
0603 (1608)0.808X7*6.492
0603 (1608)0.808C0G4.600
0805 (2012)0.606X7*8.670
0805 (2012)0.85CX7*13.338
0805 (2012)1.25FX7*19.526
0805 (2012)1.25QX7*23.200
0805 (2012)0.606C0G8.253
0805 (2012)0.85CC0G9.827
0805 (2012)1.25FC0G16.737
1206 (3216)1.15PX7*35.860
1206 (3216)1.60HX7*55.045
1206 (3216)1.60KX7*55.045
1210 (3225)2.00IX7*111.670
1210 (3225)2.50JX7*142.335
1210 (3225)2.50VX7*195.049

Note: The weight of the product is a typical value per size. For more details, please contact Samsung Electro-Mechanics.

Product Characteristic Data

2-1. Capacitance

Capacitance is measured based on specified voltage and frequency conditions. For Class I MLCCs, measurement is at 1 MHz ±10% or 1 kHz ±10% with 0.5-5 Vrms. For Class II MLCCs, it's at 1 kHz ±10% or 120 Hz ±20% with 1.0 ±0.2 Vrms or 0.5 ±0.1 Vrms, respectively. Measurements require heat treatment (150°C, 1hr) followed by 24±2hr stabilization at room temperature.

It is recommended to use measurement equipment with an Auto Level Control (ALC) option. Capacitance value of Class II MLCCs changes with applied AC and DC voltage, which must be considered in circuit design.

2-2. Tan δ (DF)

Dissipation Factor (DF) represents the energy loss in an MLCC. It is the ratio of loss energy to stored energy. Quality Factor (Q factor) is the inverse of DF. Class I MLCCs are often specified by Q due to low DF, while Class II are specified by DF. Class I MLCCs are recommended for applications requiring good linearity and low loss (e.g., coupling, filter, time constant circuits).

2-3. Insulation Resistance (IR)

Ceramic dielectrics have high insulating properties, resulting in low leakage current. Insulation Resistance is the ratio of leakage current to DC voltage. IR is measured 1 minute after applying the rated voltage, allowing charging current to stabilize.

2-4. Capacitance Aging

High dielectric (Class II) MLCCs experience a decrease in capacitance value over time. This aging characteristic is typically linear with the log of time. Capacitance recovers after heat treatment (150°C, 1hr), and aging restarts from that point.

2-5. Temperature Characteristics of Capacitance (TCC)

Capacitance changes with temperature due to variations in the ceramic dielectric constant. TCC values and ranges are specified in the reliability test conditions. When selecting MLCCs, consider system operating temperature, ambient temperature, and the MLCC's TCC. Bias TCC must be considered when DC voltage is applied.

2-6. Self-heating Temperature

When AC or pulse voltage is applied, AC or pulse current flows through the MLCC, generating self-heating due to ESR. This can degrade insulating properties and potentially cause short circuits. The surface temperature of the MLCC must remain within the maximum operating temperature, and the temperature rise from self-heating should not exceed 20°C.

2-7. DC & AC Voltage Characteristics

The capacitance value of high dielectric constant (Class II) MLCCs varies with applied DC and AC voltage. Circuit designs must account for these changes, especially in systems with narrow capacitance tolerance requirements. DC Bias characteristics and AC voltage characteristics are critical considerations.

2-8. Impedance Characteristic

Impedance (Z) is the opposition to current flow in an AC circuit (Z = R + jX). At low frequencies, MLCCs act as capacitors with decreasing capacitive reactance (XC). At high frequencies, they act as inductors with increasing inductive reactance (XL) due to ESL. The Equivalent Series Resistance (ESR) contributes to impedance at all frequencies. The Self Resonant Frequency (SRF) is where XC and XL cancel out, leaving only ESR. Impedance is measured using network or impedance analyzers.

Electrical & Mechanical Cautions

3-1. Derating

For 'derated MLCC' models, operating voltage and temperature should be reduced below their rated values to achieve an equivalent lifetime comparable to standard MLCCs tested at 150% of rated voltage. The derating graph shows the maximum operating voltage relative to the surface temperature (including self-heating).

3-2. Applied Voltage

The actual applied voltage must not exceed the rated voltage. This applies to DC voltage, AC voltage (peak-to-peak), DC+AC voltage (maximum value), surge voltage, and static electricity. Electrical Overstress (EOS), including surge and ESD, can cause dielectric breakdown and short failures. Careful design is needed to prevent excessive voltage spikes and surges.

3-3. Vibration

In vibration environments, manage MLCCs to avoid resonance and impact. For severe vibration conditions, consult Samsung Electro-Mechanics for special MLCCs like Soft-term.

3-4. Shock

Mechanical shock from dropping or impact during handling can cause cracks or dielectric damage. Avoid using dropped MLCCs. Prevent impacts to terminals when handling PCBs.

3-5. Piezo-electric Phenomenon

High dielectric (Class II) MLCCs may generate audible noise due to vibration at specific frequencies when used in AC or pulse circuits. Mechanical vibrations or shocks can also cause noise.

Process of Mounting and Soldering

4-1. Mounting

4-2. Cautions Before Mounting

4-3. Cautions During Mounting with Machines

4-4. Reflow Soldering

MLCCs can be exposed to mechanical stress and contamination during soldering. Monitor the process closely.

4-5. Flow Soldering

4-6. Soldering Iron

Manual soldering poses a risk of thermal cracks. Use caution with soldering iron tip contact and temperature control.

4-7. Cleaning

Cleaning is generally unnecessary with rosin flux. If acidic flux is used, select cleaning fluids carefully as chlorine can affect MLCC performance. Avoid ultrasonic vibration that is too strong, as it can crack MLCCs or solder joints.

4-8. Cautions for Using Electrical Measuring Probes

Confirm probe positions and support jigs. Avoid PCB bending from probe pressure, which can crack MLCCs or damage solder joints. Use support pins on the back of the PCB to prevent flexing.

4-9. Printed Circuit Board Cropping

Avoid applying stress (bending, twisting) to MLCCs when cutting PCBs. Cracked MLCCs can lead to insulation resistance degradation and short circuits. Select PCB separation methods that minimize board deformation.

4-10. Assembly Handling

4-11. Adhesive Selection

Adhesives used before soldering must have sufficient strength, withstand soldering temperatures, not spread, have a long pot life, harden quickly, not corrode materials, and be insulating and non-toxic. Check application conditions carefully, as inappropriate use can degrade MLCC performance or cause cracks due to differential contraction.

4-12. Flux

Apply flux thinly and evenly. Use flux with a halogen content of 0.1% max. Avoid strong acidic flux. Check solder quality and remaining flux after mounting.

4-13. Coating

Cracks can occur due to resin amount or thermal contraction stress during coating. The difference in thermal expansion coefficients between the coating resin and MLCC can cause destruction or insulation degradation. Recommended coating materials have thermal expansion coefficients close to MLCCs, low curing contraction, and are insulating and non-corrosive.

Design Considerations

5-1. Circuit Design

Install safety equipment like fuses to prevent accidents if MLCCs short-circuit, as this product is not safety-guaranteed.

5-2. PCB Design

SMD components are fragile and sensitive to mechanical and thermal stress. Differences in thermal expansion coefficients between PCB materials and MLCCs can cause cracks.

5-3. Design System Evaluation

Evaluate the actual design with MLCCs to ensure no functional issues. Consider that Class II MLCC capacitance varies with operating conditions (voltage, temperature). Evaluate surge resistance, as system inductance can cause excessive surges.

5-4. Land Dimension

Recommended land dimensions for reflow and flow footprints are provided for various chip sizes to ensure proper soldering and adhesion. These dimensions are determined by evaluating the actual set and board.

Reflow Footprint Land Dimensions

Chip Size [mm]Chip Tol. [mm]a [mm]b [mm]c [mm](a+2b) min(a+2b) max
0402±0.020.14~0.200.14~0.220.20~0.260.420.64
0603±0.030.16~0.200.24~0.320.30~0.350.640.84
1005±0.050.18~0.260.24~0.320.32~0.370.660.84
1608±0.070.20~0.280.25~0.350.35~0.390.700.90
2012±0.090.22~0.300.25~0.350.35~0.390.720.90
3216±0.050.35~0.400.37~0.470.50~0.551.091.34
3225±0.070.37~0.420.37~0.470.52~0.581.111.36
4532±0.100.40~0.450.37~0.470.55~0.601.141.39
5750±0.150.40~0.450.40~0.500.60~0.651.201.45

Flow Footprint Land Dimensions

Chip Size [mm]Chip Tol. [mm]a [mm]b [mm]c [mm](a+2b) min(a+2b) max
1608-0.60~1.000.60~0.800.60~0.801.802.60
2012-1.00~1.200.80~1.200.80~1.202.603.60
3216-2.00~2.401.00~1.201.00~1.404.004.80

Others

6-1. Storage Environment

6-2. Caution for Corrosive Environment

Store MLCCs in an environment free of corrosive gases, as they can deteriorate solderability and cause quality issues due to plating corrosion and moisture penetration.

6-3. Equipment in Operation

6-4. Waste Treatment

Scrapped MLCCs should be incinerated or buried by a licensed industrial waste company.

6-5. Operating Temperature

Do not use MLCCs above the maximum operating temperature. Consider equipment temperature distribution and ambient temperature fluctuations. The surface temperature, including self-heating, must not exceed the maximum operating temperature.

6-6. Transportation

Protect MLCCs from excessive temperature, humidity, and mechanical force during transportation. Avoid excessive vibrations, shocks, or forces that could crack the ceramic body or cause short circuits. Protect inner packaging from external forces.

6-7. Notice

This document is a standard product specification for reference only. Samsung Electro-Mechanics may change, modify, or discontinue product specifications without notice. Product specifications must be approved before placing an order. Contact sales personnel or application engineers for any questions.

Caution of Application

Disclaimer & Limitation of Use and Application

The products listed in this specification sheet are NOT designed and manufactured for high reliability applications such as aerospace, medical, military, power plant control, atomic energy, undersea, disaster prevention, crime prevention, traffic signal, data-processing, electric heating, safety equipment, or any other applications with similar complexity or reliability requirements. Misuse of products deviating from specifications may cause serious property damages or personal injury. Samsung Electro-Mechanics will NOT be liable for any damages resulting from such misuse. Contact sales personnel or application engineers for clarification.

PDF preview unavailable. Download the PDF instead.

CL05B102KB5VPNC cpdf AGPL

Related Documents

Preview Samsung CL31B105KBHNNNE Multi-layer Ceramic Capacitor Specification
Detailed specification sheet for the Samsung CL31B105KBHNNNE Multi-layer Ceramic Capacitor, including electrical characteristics, dimensions, reliability tests, and handling instructions.
Preview Samsung CL31A106KBHNNNE Multi-layer Ceramic Capacitor Datasheet
Detailed specifications and application guidelines for the Samsung CL31A106KBHNNNE Multi-layer Ceramic Capacitor, including electrical characteristics, reliability tests, packaging, and handling instructions.
Preview Samsung CL10C120JB8NNNC Multi-layer Ceramic Capacitor Specification
Detailed specification sheet for the Samsung CL10C120JB8NNNC Multi-layer Ceramic Capacitor, including electrical characteristics, dimensions, reliability tests, and handling instructions.
Preview Samsung MLCC Product Manual: Specifications and Handling
Comprehensive manual detailing the specifications, handling, and application guidelines for Samsung's Multi-Layer Ceramic Capacitors (MLCCs). Covers product features, reliability tests, packaging, mounting, soldering, and design considerations for optimal performance and safety.
Preview Samsung Electro-Mechanics 2024-2025 Sustainability Report
Samsung Electro-Mechanics' 2024-2025 Sustainability Report details the company's vision, strategy, performance, and improvement activities in sustainability management. The report adheres to global standards like GRI Standards 2021, SASB, and IFRS S2, and supports UN SDGs. It covers economic, social, and environmental aspects of Samsung Electro-Mechanics' domestic and international operations.