HORIBA EMGA/EMIA Series: Quantitative Elemental Analysis in Nonferrous Metals

Background and Challenges

Nonferrous metals such as aluminum, copper, and titanium are functional, lightweight materials with excellent thermal conductivity and heat resistance, used in a variety of applications. Oxygen, hydrogen, and sulfur are intentionally added to these materials to improve their functions. The concentration of oxygen, hydrogen, and carbon as foreign substances is controlled to improve quality.

Lower oxygen content in pure copper leads to better electrical conductivity, making it important to control oxygen content at ppm levels. Titanium and aluminum require precise control of hydrogen concentration to prevent embrittlement. Carbon and sulfur must be removed as much as possible during refining. For quality control, quantitative analysis of extremely small amounts of these trace elements is essential.

Solution from HORIBA

HORIBA offers advanced solutions for elemental analysis with its EMGA Series (Oxygen/Nitrogen/Hydrogen Analyzer) and EMIA Series (Carbon/Sulfur Analyzer).

"For trace analysis, the higher the number of measurements, the greater the reliability of the results; the fast measurement speed in EMIA and EMGA ensure result reliability and reduce the overall time of a high-volume quality control processes."

— Testimonial from process control division

EMGA-Pro/Expert [O, N, H] - Sample: Titanium

Sample weight (g)Oxygen (weight %)Nitrogen (weight %)Sample weight (g)Hydrogen (weight %)
0.05040.073900.016400.10230.00023
0.05030.071800.015300.11250.00027
0.05060.072500.017100.11340.00021
Average0.072730.01627Average0.00024

EMIA-Pro/Expert [C, S] - Sample: Copper

Sample weight (g)Oxygen (ppm)Sample weight (g)Carbon (weight %)Sulfur (weight %)
1.01900.000470.71270.008420.00351
1.02300.000480.72480.008800.00364
1.02200.000510.69320.008200.00352
Average0.00049Average0.008470.00356

Note: This data is an image only, as actual data cannot be released due to confidentiality obligations.

[Information Symbol] Possible to detect ultra trace amount of CSONH, >0.6ppm

Additional solutions for ultra trace analysis

HORIBA offers several additional optional units that provide even more accurate trace analysis capabilities.

[UV detector]

Lower limit of sulfur detection improved from 1ppm to 0.2ppm with a dedicated detector.

[EMIA-Step]

Gas collection function enables the analysis of trace amounts of gases with high accuracy.

[Transfer vessel]

Reduces oxidation reactions of samples with outside air (EMGA-Pro/Expert).

[Capsule press unit]

Sealing device enables sealing without atmospheric entrapment (EMGA-Pro/Expert).

Contact Information and Resources

For details regarding special specifications, please contact us.

Website: www.horiba.com/scientific

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