Certification Test Report

Report Number: 13190901-E13V1

Applicant: APPLE, INC.
1 APPLE PARK WAY
CUPERTINO, CA 95014, U.S.A.

Model: A2398

FCC ID: BCG-E3540A

IC: 579C-E3540A

EUT Description: SMARTPHONE

Test Standard(s): FCC 47 CFR PART 15 SUBPART C, ISED RSS-216 ISSUE 2, ISED RSS-GEN ISSUE 5

Date Of Issue: September 21, 2020

Prepared by: UL Verification Services Inc.
47173 Benicia Street
Fremont, CA 94538 U.S.A.
TEL: (510) 319-4000 FAX: (510) 661-0888

Accreditation: NVLAP Lab code: 200065-0

Report Revision History

Rev.Issue DateRevisionsRevised By
V19/21/2020Initial IssueChin Pang

Table of Contents

(Refer to original document for full table of contents)

1. Attestation of Test Results

Company Name: APPLE, INC.
ONE APPLE PARK WAY
CUPERTINO, CA 95014,

EUT Description: SMARTPHONE

Model: A2398

Serial Number: Original: C7CD601F08HL, Spot Check: C7CD601408GG

Date Tested: AUGUST 14, 2020 – SEPTEMBER 09, 2020

Applicable Standards & Test Results

STANDARDTEST RESULTS
FCC PART 15 SUBPART CComplies
ISED RSS-216 Issue 2Complies
ISED RSS-GEN Issue 5Complies

UL Verification Services Inc. tested the equipment in accordance with the specified standards. The results indicate the equipment is capable of demonstrating compliance.

The results apply only to the tested sample. The manufacturer is responsible for ensuring additional production units match the tested sample. Measurement Uncertainties are for informational purposes only.

This document may not be altered or revised except by UL Verification Services Inc. Any alteration will nullify the document. This report must not be used to claim product certification, approval, or endorsement by government agencies.

Approved & Released For UL Verification Services Inc. By: Chin Pang, Senior Engineer

Prepared By: Joe Vang, Test Engineer

2. Test Methodology

Tests were performed in accordance with ANSI C63.10-2013, KDB 414788 D01 Radiated Test Site v01r01, FCC CFR 47 Part 2, FCC CFR 47 Part 15, RSS-GEN Issue 5, and RSS-216 Issue 2 January 2016.

3. Facilities and Accreditation

Test sites and measurement facilities are located at 47173 and 47266 Benicia Street, and 47658 Kato Road, Fremont, California, USA. Line conducted emissions are measured at the 47173 address. The following table identifies facilities used for radiated emission measurements:

Test Site Locations & ISED Codes

47173 Benicia Street (ISED Site Code)47266 Benicia Street (ISED Site Code)47658 Kato Rd (ISED Site Code)
Chamber A (IC:2324B-1)Chamber D (IC:22541-1)Chamber I (IC: 2324A-5)
Chamber B (IC:2324B-2)Chamber E (IC:22541-2)Chamber J (IC: 2324A-6)
Chamber C (IC:2324B-3)Chamber F (IC:22541-3)Chamber K (IC: 2324A-1)
Chamber G (IC:22541-4)Chamber L (IC: 2324A-3)
Chamber H (IC:22541-5)

Test sites are covered under FCC Test Firm Registration # 208313. Chambers are covered under Industry Canada company address and code 2324A.

UL Verification Services Inc. is accredited by NVLAP, Laboratory Code 200065-0.

4. Decision Rules and Measurement Uncertainty

4.1. Metrological Traceability

Test and measuring equipment is calibrated regularly, traceable to national standards.

4.2. Decision Rules

Decision Rule is based on Simple Acceptance per ISO Guide 98-4:2012 Clause 8.2. Measurement uncertainty is not considered for conformity statements.

4.3. Measurement Uncertainty

Estimated measurement uncertainty levels:

PARAMETERUNCERTAINTY
Worst Case Conducted Disturbance, 9KHz to 0.15 MHz3.84 dB
Worst Case Conducted Disturbance, 0.15 to 30 MHz3.65 dB
Worst Case Radiated Disturbance, 9KHz to 30 MHz2.52 dB
Worst Case Radiated Disturbance, 30 to 1000 MHz4.88 dB
Worst Case Radiated Disturbance, 1000 to 18000 MHz4.24 dB
Worst Case Radiated Disturbance, 18000 to 26000 MHz4.37 dB
Worst Case Radiated Disturbance, 26000 to 40000 MHz5.17 dB

Uncertainty figures are valid to a confidence level of 95%.

5. Introduction of Test Data Reuse

5.1. EUT Description

The Apple iPhone is a smartphone with multimedia functions (music, application support, video), cellular (GSM, GPRS, EGPRS, UMTS, LTE, 5G, CDMA), IEEE 802.11a/b/g/n/ac/ax, Bluetooth, Ultra-Wideband, GPS, NFC, and WPT. It supports UICC-based SIM (physical or electronic). The device includes a built-in inductive charging transmitter/receiver. The battery is not user accessible.

5.2. Introduction

This application leverages data reuse procedures from KDB 484596 D01, referencing FCC ID: BCG-E3539A, IC: 579C-E3539A, to cover variant BCG-E3540A, 579C-E3540A. The primary difference is the depopulation of the mmWave transmitter in the variant model. Other circuitry and features are identical. The data reuse test plan was approved via manufacturer KDB inquiry.

5.3. Spot Check Verification Results Summary

Spot check verification was performed on model A2398 (FCC ID: BCG-E3540A, IC: 579C-E3540A) for radiated spurious and radiated band-edge emissions, following an approved KDB inquiry test plan.

ItemFrequencyOriginal model (A2176, BCG-E3539A, 579C-E3539A)Spot check model (A2398, BCG-E3540A, 579C-E3540A)Delta (dB)
FCCICFCCIC
Fund360kHz-12.95 dBuV/m13.87 dBuA/m-15.51 dBuV/m11.10 dBuA/m-2.56
RSE30.55 MHz (FCC) 58.14 MHz (IC)32.22dBuV/m31.15dBuV/m32.51 dBuV/m31.47dBuV/m0.29
-2.7

The upper deviation between models is within 3dB, and all tests comply with FCC Technical Limits. The test report for FCC ID: BCG-E3539A, IC: 579C-E3539A supports the application for FCC ID: BCG-E3540A, IC: 579C-E3540A.

5.3.1. FCC TX Fundamental and Spurious Emissions from 9 kHz to 30 MHz

Operating with Load:

Plot Description: A graph displays radiated emission levels (dBuV/m) versus frequency (MHz) from 0.009 to 30 MHz. It includes measured data points (green and blue lines) and limit lines (red lines for Peak Limit, pink line for Avg Limit). The plot indicates test setup details, including chamber, configuration, mode, and tested-by information.

MarkerFrequency (MHz)Meter Reading (dBuV)DetLoop Antenna (dB/m)Cables (dB)Dist Corr 300mCorrected Reading (dBuV/m)Peak Limit (dBuV/m)Margin (dB)Azimuth (Degs)
10.367153.29Pk11.10.1-80-15.5136.31-51.82121
40.3678347.41Pk11.10.1-80-21.3936.3-57.69186

Note: The data table shows measurements for frequencies around 0.367 MHz, indicating peak detector readings and compliance with limits.

5.3.2. IC / CISPR 11 TX Fundamental and Spurious Emissions from 9 kHz to 30 MHz

Operating with Load:

Plot Description: A graph displays magnetic field strength (dBuA/m) versus frequency (MHz) from 0.009 to 30 MHz. It includes measured data points (green and blue lines) and limit lines (red lines). The plot indicates test setup details.

MarkerFrequency (MHz)Meter Reading (dBuV)DetLoop Antenna (dB/m)Cables (dB)Corrected Reading dB(uAmps/meter)ICES-001 G2 WPT Mag FS (dBuA/m)Margin (dB)Azimuth (Degs)
10.087540.34Pk-39.60.10.8460.1-59.260-360
40.3574148.08Pk-40.60.17.5829.4-21.820-360
20.3590751.6Pk-40.60.111.129.35-18.250-360
31.0786434.49Pk-40.20.1-5.6117.33-22.940-360
51.080331.09Pk-40.20.1-9.0117.31-26.320-360
64.4311122.4Pk-40.10.3-17.43-20.40-360
726.70817.75Pk-42.50.8-23.953-26.950-360

5.3.3. FCC TX Spurious Emission 30 to 1000 MHz

Operating with Load:

Horizontal Plot Description: A graph shows radiated emission levels (dBuV/m) versus frequency (MHz) from 30 to 1000 MHz. It displays measured data (blue line) and limit lines (red lines for QP Limit). Test setup details are provided.

Vertical Plot Description: A graph shows radiated emission levels (dBuV/m) versus frequency (MHz) from 30 to 1000 MHz. It displays measured data (green line) and limit lines (red lines for QP Limit). Test setup details are provided.

MarkerFrequency (MHz)Meter Reading (dBuV)DetAF T477 (dB/m)Amp Cbl (dB)Corrected Reading (dBuV/m)QPk Limit (dBuV/m)Margin (dB)Azimuth (Degs)Height (cm)Polarity
5327.916636.56Pk20-28.627.9646.02-18.0619399H
330.340136.41Pk27.1-3132.5140-7.49266100V
130.510131.13Pk27-3127.1340-12.876999H
458.524948.96Pk13.4-30.731.6640-8.34157100V
2197.450841.22Pk18.1-29.529.8243.52-13.714599H
6226.303434.94Pk16.9-29.322.5446.02-23.4823201V

5.3.4. IC / CISPR 11 TX Spurious Emission 30 to 1000 MHz

Operating with Load:

Horizontal Plot Description: A graph shows radiated emission levels (dBuV/m) versus frequency (MHz) from 30 to 1000 MHz. It displays measured data (blue line) and limit lines (red lines for ClassB Gep2 QPk Limit). Test setup details are provided.

Vertical Plot Description: A graph shows radiated emission levels (dBuV/m) versus frequency (MHz) from 30 to 1000 MHz. It displays measured data (green line) and limit lines (red lines for ClassB Gep2 QPk Limit). Test setup details are provided.

MarkerFrequency (MHz)Meter Reading (dBuV)DetAF T477 (dB/m)Amp Cbl (dB)Corrected Reading (dBuV/m)ClassB Grp2 QPk Limit (dBuV/m)Margin (dB)Azimuth (Degs)Height (cm)Polarity
158.992542.07Pk13.4-30.724.7740-15.23178201H
359.417648.77Pk13.4-30.731.4740-8.53141100V
2157.70341.64Pk18.3-29.830.1440-9.86244201H
4194.13543.08Pk17.6-29.531.1840-8.82228100V
6218.202433.53Pk16.6-29.420.7340-19.2720299V
5327.716634.44Pk20-28.625.8447-21.1618999H

5.4. Reference Detail

Reference application containing reused reference data is attached in Appendix A.

Equipment ClassReference FCC ID & ICReference ReportReport Title/Section
DCDBCG-E3539A
579C-E3539A
13179110-E13FCC IC_WPTReport / All sections

5.5. Worst-Case Configuration and Mode

The EUT (smartphone) connects to an AC/DC adapter via USB-C and uses an inductive charging coil for WPT accessories. Radiated emissions tests were performed based on the worst-case configuration identified for model A2176.

Configuration: Operating

Descriptions: EUT and Load powered by AC/DC adapter.

For testing below 30MHz, three antenna orientations were investigated: RX antenna Face-on, Face-off, and horizontal. The worst-case configurations were determined to be Face-on and Face-off, which were used for final tests.

Although tests were conducted at a site other than an open area test site, comparison measurements confirmed correlation with a 300 m open area test site, supporting the results based on KDB 414788 D01.

5.6. Description of Test Setup

Support Equipment & Peripherals List

DescriptionManufacturerModelSerial NumberFCC ID
AC/DC adapterAppleA2305N/AN/A
WPT AccessoryAppleN/AN/AN/A

I/O Cable List

Cable No.Port# of Identical PortsConnector TypeCable TypeCable Length (m)Remarks
1DC1USBCUn-shielded25W Power Supply

Configuration 1: Operating Mode Phone with Load

Test Setup Diagram Description: A block diagram illustrates the test setup. It shows the EUT + Load connected to an Antenna/Amp for Radiated Test and to a Spectrum Analyzer. The EUT is also connected to an AC/DC Adapter, which is powered by an AC Source/LISN for Conducted Test.

6. Test and Measurement Equipment

The following test and measurement equipment was utilized:

DescriptionManufacturerModelID NumCal DueLast Cal
Antenna, Active Loop 9KHz to 30MHzETS-Lindgren6502T161610/28/202010/28/2019
*Antenna, Broadband Hybrid, 30MHz to 2000MHz w/4dBSunol Sciences Crop.JB3T47709/04/202009/04/2019
Amplifier, 10kHz to 1GHz, 32dBSonoma Instrument310NT83407/14/202107/14/2020
Spectrum Analyzer, PXA, 3Hz to 44GHzAgilent (Keysight) TechnologiesN9030A-544T111303/02/202103/02/2020
Spectrum Analyzer, PXA, 3Hz to 44GHzAgilent (Keysight) TechnologiesN9030AT34201/23/202101/23/2020

UL Automation Software

Radiated SoftwareConducted SoftwareAC Line Conducted Software
ULUL EMCVer 9.5, Mar 6, 2020

Note: Testing was completed before equipment expiration date.

7. Setup Photos

Please refer to 13179110-EP1 for setup photos.

Appendix A – Reference Test Report

Attached is the test report (13179110-E13) containing the reference data from the parent model as detailed in section 5.4.

PDF preview unavailable. Download the PDF instead.

GetApplicationAttachment.html?id=4945077 Chiu, Stephen Adobe PDF Library 20.12.80

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