Your mineral identification ambitions realized non-destructively
ZEISS Phase Identifier 3D
The Game Has Changed
The phrase "automated mineralogy" has been synonymous with the use of scanning electron microscopes (SEM) for decades. The classification of minerals using SEM-based energy dispersive spectroscopy (EDS) chemical measurements has been the only method for rapid, automated phase ID in microscopy.
Now, ZEISS Phase Identifier 3D applies non-destructive X-ray-microscopy techniques and deep learning algorithms to execute automated mineralogy in 3D. Mineral classification and particle identification are performed alongside customizable data outputs including true grain size/shape and mineral association measurements.
Three immediate benefits:
- Streamlined sample preparation with no polished mounts
- Reduce sample runs by eliminating stereological assumptions
- Non-destructive analysis, allowing for precious samples or correlative workflows
Maximize Outputs from Non-destructive Techniques
The capabilities of ZEISS X-ray microscopy (XRM) and computed tomography (µCT) are at the forefront of lab-based, non-destructive imaging. These 3D microscopy capabilities now feature three key enhancements enabling quantitative analytical applications:
- DeepRecon Pro: Advanced deep learning for noise reduction and speed.
- LabDCT/CrystalCT: Diffraction contrast tomography for crystal orientation analysis.
- Phase Identifier 3D: Calibrated phase identification for automated mineralogy.
Recent advances in 3D X-ray analysis include (1) DeepRecon Pro deep learning image processing, (2) non-destructive crystal orientation analysis, and now (3) automated quantitative mineralogy.
Introducing Phase Identifier 3D
Phase Identifier 3D automatically classifies the mineralogy of the sample based on attenuation measurements. This unique capability can be combined with morphological measurements to create a full description of the sample with none of the stereological restrictions of SEM-based analyses.
Phase Identifier 3D is capable of analyzing whole rock samples, loose particle fractions, or intricate structures in full with no sample damage and minimal preparation. Maximizing the quantitative outputs from non-destructive X-ray techniques is ideal for precious samples such as meteorites and sample-return missions, museum specimens, and fossil samples - particularly those still embedded in host rock.
Prepare Your Research Workflows Like Never Before
Phase Identifier 3D creates a new opportunity to understand your samples in as much detail as possible, either as standalone datasets, or prior to further sample preparation and analysis. Automated mineralogy in 3D paves the way for targeted, correlative workflows to light microscopy, SEM, FIB-SEM, and beyond.
Characterize mineral deposits and meteorites with quantitative grain size/shape analysis and mineral associations for key minerals in situ. Or create streamlined 3D-to-2D workflows. For example, Phase Identifier 3D identifies minerals, highlighting the perfect targets for high resolution EBSD or TOF-SIMS.
Investigate your sample in its true form, without mechanical alteration, and see 100% of it. Phase Identifier 3D offers an unparalleled ability to understand composition, mineral relationships, and fabric of the geological materials under scrutiny, including minor phases and mineral inclusions. Assumptions on the representativity of the exposed sample are no longer relevant, nor are there issues with stereology.
Simple Preparation, Advanced Analysis
Analyze your sample intact and dispense with the requirement to make epoxy mounts or hope for the perfect thin section to be cut.
Take advantage of the ZEISS flat panel detector to obtain a larger field of view and enjoy the high throughput of deep learning image processing improvements provided by ZEISS DeepRecon Pro. Phase Identifier 3D offers unrivaled resolution, mineral classification, and measurement of samples in their natural state with simple sample handling.
System Configurations
ZEISS Versa XRM
With primary workstation, Standard FDK Reconstruction.
ZEISS Context microCT
With primary workstation, Standard FDK Reconstruction.
Phase Identifier 3D
- XRM with:
- Flat Panel Extension
- ZEN navx or Scout-and-Scan
- XRM High Performance Workstation with:
- ART
- Deep Recon Pro
Optional Extras: Dragonfly 3D World ZEISS Edition
Contact and Company Information
Carl Zeiss Microscopy GmbH
07745 Jena, Germany
microscopy@zeiss.com
www.zeiss.com/microscopy/phase-identifier
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