VISHAY IRFD120 Power MOSFET 

IRFD120 Power MOSFET

Power MOSFET

Power Mosfet

PRODUCT SUMMARY
VDS (V) 100
RDS(on) (W) VGS = 10 V 0.27
Qg (Max.) (nC) 16
Qgs (nC) 4.4
Qgd (nC) 7.7
Configuration Single

FEATURES

  • Dynamic dV/dt rating
  • Repetitive avalanche rated
  • For automatic insertion
  • End stackable
  • 175 °C operating temperature
  • Fast switching
  • Ease of paralleling
  • Material categorization: for definitions of compliance please see www.vishay.com/doc?99912
DESCRIPTION

Third generation power MOSFETs from Vishay provide the designer with the best combination of fast switching, ruggedized device design, low on-resistance and cost-effectiveness. The 4 pin DIP package is a low cost machine-insertab le case style which can be stacked in multiple combinations on standard 0.1″ pin centers. The dual drain serves as a thermal link to the mounting surface for power dissipation levels up to 1 W.

ORDERING INFORMATION
Package HVMDIP
Lead (Pb)-free IRFD120PbF
ABSOLUTE MAXIMUM RATINGS (TA = 25 °C, unless otherwise noted)
PARAMETER SYMBOL LIMIT UNIT
Drain-source voltage VDS 100   V
Gate-source voltage VGS ± 20
  Continuous drain current VGS at 10 V TA = 25 °C ID 1.3   A
TA = 100 °C 0.94
Pulsed drain current a IDM 10
Linear derating factor 0.0083 W/°C
Single pulse avalanche energy b EAS 100 mJ
Repetitive avalanche current a IAR 1.3 A
Repetitive avalanche energy a EAR 0.13 mJ
Maximum power dissipation TA = 25 °C PD 1.3 W
Peak diode recovery dV/dt c dV/dt 5.5 V/ns
Operating junction and storage temperature range TJ, Tstg -55 to +175   °C
Soldering recommendations (peak temperature) For 10 s 300d

Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11)
b. VDD = 25 V, starting TJ = 25 °C, L = 22 mH, Rg = 25 Ω, IAS = 2.6 A (see fig. 12)
c. ISD ≤ 9.2 A, dI/dt ≤ 110 A/μs, VDD ≤ VDS, TJ ≤ 175 °C
d. 1.6 mm from case

THERMAL RESISTANCE RATINGS
PARAMETER SYMBOL TYP. MAX. UNIT
Maximum Junction-to-Ambient RthJA 120 °C/W
SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
PARAMETER SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT
Static
Drain-Source Breakdown Voltage VDS VGS = 0 V, ID = 250 μA 100 V
VDS Temperature Coefficient DVDS/TJ Reference to 25 °C, ID = 1 mA 0.13 V/°C
Gate-Source Threshold Voltage VGS(th) VDS = VGS, ID = 250 μA 2.0 4.0 V
Gate-Source Leakage IGSS VGS = ± 20 V ± 100 nA
Zero Gate Voltage Drain Current   IDSS VDS = 100 V, VGS = 0 V 25   μA
VDS = 80 V, VGS = 0 V, TJ = 150 °C 250
Drain-Source On-State Resistance RDS(on) VGS = 10 V ID = 0.78 Ab 0.27 W
Forward Transconductance gfs VDS = 50 V, ID = 0.78 Ab 0.80 S
Dynamic
Input Capacitance Ciss VGS = 0 V VDS = 25 V f = 1.0 MHz, see fig. 5 360   pF
Output Capacitance Coss 150
Reverse Transfer Capacitance Crss 34
Total Gate Charge Qg   VGS = 10 V   ID = 9.2 A, VDS = 80 V see fig. 6 and 13b 16   nC
Gate-Source Charge Qgs 4.4
Gate-Drain Charge Qgd 7.7
Turn-On Delay Time td(on) VDD = 50 V, ID = 9.2 A Rg = 18 W, RD = 5.2 W, see fig. 10b 6.8     ns
Rise Time tr 27
Turn-Off Delay Time td(off) 18
Fall Time tf 17
 Internal Drain Inductance LD Between lead, 6 mm (0.25″) from package and center of die contact
Symbol
  –   4.0   –     nH
Internal Source Inductance LS   –   6.0   –
Drain-Source Body Diode Characteristics
  Continuous Source-Drain Diode Current IS MOSFET symbol showing the integral reverse p – n junction diode
Symbol
  –   –   1.3     A
Pulsed Diode Forward Currenta ISM   –   –   10
Body Diode Voltage VSD TJ = 25 °C, IS = 1.3 A, VGS = 0 Vb 2.5 V
Body Diode Reverse Recovery Time trr TJ = 25 °C, IF = 9.2 A, dI/dt = 100 A/μsb 130 260 ns
Body Diode Reverse Recovery Charge Qrr 0.65 1.3 μC
Forward Turn-On Time ton Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)

Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11)
b. Pulse width ≤ 300 μs; duty cycle ≤ 2 %

TYPICAL CHARACTERISTICS

(25 °C, unless otherwise noted)
Typical Characteristics
Typical Characteristics
Typical Characteristics
Typical Characteristics
Typical Characteristics
Typical Characteristics
Typical Characteristics
Typical Characteristics
Typical Characteristics
Typical Characteristics
Typical Characteristics
Typical Characteristics
Typical Characteristics
Typical Characteristics
Typical Characteristics

Peak Diode Recovery dV/dt Test Circuit

Typical Characteristics
Typical Characteristics

Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability data, see www.vishay.com/ppg?91128.

HVM DIP

(High voltage)

Hvm Dip

INCHES MILLIMETERS
DIM. MIN. MAX. MIN. MAX.
A 0.310 0.330 7.87 8.38
E 0.300 0.425 7.62 10.79
L 0.270 0.290 6.86 7.36
ECN: X10-0386-Rev. B, 06-Sep-10 DWG: 5974

Note

  1. Package length does not include mold flash, protrusions or gate burrs. Package width does not include interplead flash or protrusions.

Disclaimer

ALL PRODUCT, PRODUCT SPECIFICATIONS AND DATA ARE SUBJECT TO CHANGE WITHOUT NOTICE TO IMPROVE RELIABILITY, FUNCTION OR DESIGN OR OTHERWISE.

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Documents / Resources

VISHAY IRFD120 Power MOSFET [pdf] Owner's Manual
IRFD120 Power MOSFET, IRFD120, Power MOSFET, MOSFET

References

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