VISHAY IRF830AS Power MOSFET 

VISHAY IRF830AS Power MOSFET

OVERVIEW

Overview

PRODUCT SUMMARY
VDS (V) 500
RDS(on) max. (Ù) VGS = 10 V 1.40
Qg max. (nC) 24
Qgs (nC) 6.3
Qgd (nC) 11
Configuration Single

FEATURES

  • Low gate charge Qg results in simple drive requirement
  • Improved gate, avalanche and dynamic dV/dt ruggedness
  • Fully characterized capacitance and avalanche voltage and current
  • Effective Coss specified
  • Material categorization: for definitions of compliance please see www.vishay.com/doc?99912

Note

* This datasheet provides information about parts that are RoHS-compliant and / or parts that are non RoHS-compliant. For example, parts with lead (Pb) terminations are not RoHS-compliant. Please see the information / tables in this datasheet for details

APPLICATIONS

  • Switch mode power supply (SMPS)
  • Uninterruptible power supply
  • High speed power switching

TYPICAL SMPS TOPOLOGIES

  • Two transistor forward
  • Half bridge and full bridge

ORDERING INFORMATION

Package D2PAK (TO-263) D2PAK (TO-263) I2PAK (TO-262)
Lead (Pb)-free and Halogen-free SiHF830AS-GE3 SiHF830ASTRL-GE3 a SiHF830AL-GE3 a
Lead (Pb)-free IRF830ASPbF IRF830ASTRLPbF a IRF830ALPbF
Note
  1. See device orientation
ABSOLUTE MAXIMUM RATINGS (TC = 25 °C, unless otherwise noted)
PARAMETER SYMBOL LIMIT UNIT
Drain-Source Voltage VDS 500 V
Gate-Source Voltage VGS ± 30
Continuous Drain Current VGS at 10 V TC = 25 °C ID 5.0 A
TC = 100 °C 3.2
Pulsed Drain Current a, e IDM 20
Linear Derating Factor 0.59 W/°C
Single Pulse Avalanche Energy b, e EAS 230 mJ
Avalanche Currenta IAR 5.0 A
Repetiitive Avalanche Energy a EAR 7.4 mJ
Maximum Power Dissipation TA = 25 °C PD 3.1 W
TC = 25 °C 74
Peak Diode Recovery dV/dtc, e dV/dt 5.3 V/ns
Operating Junction and Storage Temperature Range TJ, Tstg -55 to +150 °C
Soldering Recommendations (Peak temperature) d for 10 s 300
Notes
  • a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11)
  • b. Starting TJ = 25 °C, L = 18 mH, Rg = 25 Ω, IAS = 5.0 A (see fig. 12)
  • c. ISD ≤ 5.0 A, dI/dt ≤ 370 A/μs, VDD ≤ VDS, TJ ≤ 150 °C
  • d. 1.6 mm from case
  • e. Uses SiHF830A data and test conditions
THERMAL RESISTANCE RATINGS
PARAMETER SYMBOL TYP. MAX. UNIT
Maximum Junction-to-Ambient (PCB mounted, steady-state) a RthJA 40 °C/W
Maximum Junction-to-Case (Drain) RthJC 1.7

Note

  • a. When mounted on 1″ square PCB (FR-4 or G-10 material)
SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
PARAMETER SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT
Static
Drain-Source Breakdown Voltage VDS VGS = 0, ID = 250 μA 500 V
VDS Temperature Coefficient ÄVDS/TJ Reference to 25 °C, ID = 1 mA d 0.60 V/°C
Gate-Source Threshold Voltage VGS(th) VDS = VGS, ID = 250 μA 2.0 4.5 V
Gate-Source Leakage IGSS VGS = ± 30 V ± 100 nA
Zero Gate Voltage Drain Current IDSS VDS = 500 V, VGS = 0 V 25 μA
VDS = 400 V, VGS = 0 V, TJ = 125 °C 250
Drain-Source On-State Resistance RDS(on) VGS = 10 V ID = 3.0 A b 1.4 Ù
Forward Transconductance gfs VDS = 50 V, ID = 3.0 A d 2.8 S
Dynamic
Input Capacitance Ciss VGS = 0 V, VDS = 25 V,

f = 1.0 MHz, see fig. 5 d

620 pF
Output Capacitance Coss 93
Reverse Transfer Capacitance Crss 4.3
Output Capacitance Coss VGS = 0 V VDS = 1.0 V, f = 1.0 MHz 886
VDS = 400 V, f = 1.0 MHz 27
Effective Output Capacitance Coss eff. VDS = 0 V to 400 V c, d 39
Total Gate Charge Qg VGS = 10 V ID = 5.0 A, VDS = 400 V, see fig. 6 and 13 b, d 24 nC
Gate-Source Charge Qgs 6.3
Gate-Drain Charge Qgd 11
Turn-On Delay Time td(on) VDD = 250 V, ID = 5.0 A,
Rg = 14 Ù, RD = 49 Ù, see fig. 10 b, d
10 ns
Rise Time tr 21
Turn-Off Delay Time td(off) 21
Fall Time tf 15
Gate Input Resistance Rg f = 1 MHz, open drain 1.7 10.7 Ù
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current IS MOSFET symbol showing the integral reverse p – n junction diode
Wir
5.0 A
Pulsed Diode Forward Current a ISM 20
Body Diode Voltage VSD TJ = 25 °C, IS = 5.0 A, VGS = 0 V b 1.5 V
Body Diode Reverse Recovery Time trr TJ = 25 °C, IF = 5.0 A, dI/dt = 100 A/μs b, d 430 650 ns
Body Diode Reverse Recovery Charge Qrr 2.0 3.0 μC
Forward Turn-On Time ton Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)

Notes

  • a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11)
  • b. Pulse width ≤ 300 μs; duty cycle ≤ 2 %
  • c. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80 % VDS
  • d. Uses SiHF830A data and test conditions

TYPICAL CHARACTERISTICS

(25 °C, unless otherwise noted)

Typical Characteristics
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Peak Diode Recovery dV/dt Test Circuit 

Typical CharacteristicsTypical Characteristics

Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability data, see www.vishay.com/ppg?91062.

TO-263AB (HIGH VOLTAGE)

Typical Characteristics

MILLIMETERS INCHES MILLIMETERS INCHES
DIM. MIN. MAX. MIN. MAX. DIM. MIN. MAX. MIN. MAX.
A 4.06 4.83 0.160 0.190 D1 6.86 0.270
A1 0.00 0.25 0.000 0.010 E 9.65 10.67 0.380 0.420
b 0.51 0.99 0.020 0.039 E1 6.22 0.245
b1 0.51 0.89 0.020 0.035 e 2.54 BSC 0.100 BSC
b2 1.14 1.78 0.045 0.070 H 14.61 15.88 0.575 0.625
b3 1.14 1.73 0.045 0.068 L 1.78 2.79 0.070 0.110
c 0.38 0.74 0.015 0.029 L1 1.65 0.066
c1 0.38 0.58 0.015 0.023 L2 1.78 0.070
c2 1.14 1.65 0.045 0.065 L3 0.25 BSC 0.010 BSC
D 8.38 9.65 0.330 0.380 L4 4.78 5.28 0.188 0.208
ECN: S-82110-Rev. A, 15-Sep-08 DWG: 5970

Notes

  1. Dimensioning and tolerancing per ASME Y14.5M-1994.
  2. Dimensions are shown in millimeters (inches).
  3. Dimension D and E do not include mold flash. Mold flash shall not exceed 0.127 mm (0.005″) per side. These dimensions are measured at the outmost extremes of the plastic body at datum A.
  4. Thermal PAD contour optional within dimension E, L1, D1 and E1.
  5. Dimension b1 and c1 apply to base metal only.
  6. Datum A and B to be determined at datum plane H.
  7. Outline conforms to JEDEC outline to TO-263AB.

I2PAK (TO-262) (HIGH VOLTAGE)

Typical CharacteristicsTypical Characteristics

MILLIMETERS INCHES MILLIMETERS INCHES
DIM. MIN. MAX. MIN. MAX. DIM. MIN. MAX. MIN. MAX.
A 4.06 4.83 0.160 0.190 D 8.38 9.65 0.330 0.380
A1 2.03 3.02 0.080 0.119 D1 6.86 0.270
b 0.51 0.99 0.020 0.039 E 9.65 10.67 0.380 0.420
b1 0.51 0.89 0.020 0.035 E1 6.22 0.245
b2 1.14 1.78 0.045 0.070 e 2.54 BSC 0.100 BSC
b3 1.14 1.73 0.045 0.068 L 13.46 14.10 0.530 0.555
c 0.38 0.74 0.015 0.029 L1 1.65 0.065
c1 0.38 0.58 0.015 0.023 L2 3.56 3.71 0.140 0.146
c2 1.14 1.65 0.045 0.065
ECN: S-82442-Rev. A, 27-Oct-08 DWG: 5977

Notes

  1. Dimensioning and tolerancing per ASME Y14.5M-1994.
  2. Dimension D and E do not include mold flash. Mold flash shall not exceed 0.127 mm per side. These dimensions are measured at the outmost extremes of the plastic body.
  3. Thermal pad contour optional within dimension E, L1, D1, and E1.
  4. Dimension b1 and c1 apply to base metal only.

RECOMMENDED MINIMUM PADS FOR D2PAK: 3-Lead 0.635 (16.129) 

Typical Characteristics

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Documents / Resources

VISHAY IRF830AS Power MOSFET [pdf] Owner's Manual
IRF830AS Power MOSFET, IRF830AS, Power MOSFET, MOSFET
VISHAY IRF830AS Power MOSFET [pdf] Owner's Manual
IRF830AS Power MOSFET, IRF830AS, Power MOSFET, MOSFET

References

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