Introduction to the R&S TS-PAM Analyzer Module

The R&S TS-PAM Analyzer Module is a key component for advanced signal analysis within the Rohde & Schwarz TSVP (Test System Versatile Platform). Designed as a PXI module, it integrates seamlessly into TSVP base units, offering powerful capabilities for electronic testing and measurement.

Key Features and Applications

This module excels in capturing and analyzing electrical signals, functioning similarly to a multi-channel digital storage oscilloscope. It supports various acquisition modes, including high sampling rates for detailed waveform analysis and multi-channel recording. The R&S TS-PAM can replace traditional instruments like digital voltmeters, timers, and oscilloscopes, providing versatile measurement options for voltage, time, frequency, and events. It is complemented by the R&S TS-PDC rear I/O module, which provides essential power supply functions.

Documentation Overview

This user manual provides comprehensive guidance on the R&S TS-PAM Analyzer Module. It details installation procedures, module tour, operational functions, software integration with drivers and analysis libraries, troubleshooting steps, and technical specifications. The document is intended for engineers and technicians working with the R&S TSVP platform in demanding test and measurement environments.