Owner's Manual for GeneSiC models including: G3R350MT12D Silicon Carbide MOSFET, G3R350MT12D, Silicon Carbide MOSFET, Carbide MOSFET, MOSFET

G3R350MT12D 1200V 350mΩ SiC MOSFET - Silicon Carbide MOSFET - N-Channel Enhancement Mode - GeneSiC Semiconductor

Navitas Semiconductor; Power Discrete; Power Discrete Semiconductor; Silicon Carbide, SiC, SiC MOSFET; G3R™; Silicon Carbide MOSFET; GeneSiC Semiconductor; Wide Band Gap; Power Electronics; High Performance; Industrial, Automotive; 650V; 1200V; 1700V; 3300V; Silicon Carbide Diode; Silicon Carbide Rectifier; High Voltage Rectifier; Solar; SMPS; PV; EV; OBC; DC-DC; Fast Charger; PFC; UPS; Power Supply; Inverter; Cool; 175C; High Temperature; Superior Figure of Merit; Low Gate Charge; Low RdsON; Fast Switching

"Navitas Semiconductor; Power Discrete; Power Discrete Semiconductor; Silicon Carbide, SiC, SiC MOSFET; G3R™; Silicon Carbide MOSFET; GeneSiC Semiconductor; Wide Band Gap; Power Electronics; High Performance; Industrial, Automotive; 650V; 1200V; 1700V; 3300V; Silicon Carbide Diode; Silicon Carbide Rectifier; High Voltage Rectifier; Solar; SMPS; PV; EV; OBC; DC-DC; Fast Charger; PFC; UPS; Power Supply; Inverter; Cool; 175C; High Temperature; Superior Figure of Merit; Low Gate Charge; Low RdsON; Fast Switchin

GeneSiC Semiconductor LLC

GENESIC SEMICONDUCTOR - РКС Компоненти - РАДІОМАГ

G3R350MT12D GeneSiC Semiconductor - РКС Компоненти - РАДІОМАГ


File Info : application/pdf, 14 Pages, 2.97MB

g3r350mt12d
G3R350MT12D 1200 V 350 m SiC MOSFET
Silicon Carbide MOSFET
N-Channel Enhancement Mode
Features
· G3RTM (3rd Generation) Technology · Low Temperature Coefficient of RDS(ON) · Lower QG and Smaller RG(INT) · Low Device Capacitances (COSS, CRSS) · LoRingTM - Electromagnetically Optimized Design · Superior Cost-Performance Index · Robust Body Diode with Low VF and Low QRR · 100% Avalanche (UIL) Tested
Advantages
· Compatible with Commercial Gate Drivers · Low Conduction Losses at all Temperatures · Faster and More Efficient Switching · Lesser Switching Spikes and Lower Losses · Reduced Ringing · Better Power Density and System Efficiency · Ease of Paralleling without Thermal Runaway · Superior Robustness and System Reliability

TM

Package TO-247-3

VDS

=

RDS(ON)(Typ.) =

ID (TC = 100°C) =

1200 V 350 m 7 A

D
G
S
D = Drain G = Gate S = Source

RoHS REACH

Applications
· Auxiliary Power Supply · Solar Inverters · UPS · High Voltage DC-DC Converters · Switched Mode Power Supplies · Auxiliary Motor Drives · High Frequency Converters

Absolute Maximum Ratings (At TC = 25°C Unless Otherwise Stated)

Parameter Drain-Source Voltage Gate-Source Voltage (Dynamic) Gate-Source Voltage (Static)
Continuous Forward Current
Pulsed Drain Current Power Dissipation Non-Repetitive Avalanche Energy Operating and Storage Temperature

Symbol VDS(max) VGS(max) VGS(op)-ON VGS(op)-OFF
I D
ID(pulse) P D EAS
Tj , Tstg

Conditions VGS = 0 V, ID = 100 µA
Recommended Operation
TC = 25°C, VGS = -5 / +15 V TC = 100°C, VGS = -5 / +15 V TC = 135°C, VGS = -5 / +15 V tP  3µs, D  1%, VGS = 15 V, Note 1
Tc = 25°C L = 21.5 mH, IAS = 2.0 A

Values 1200 -10 / +22 +15 to +18 -5 to -3 10
7 5 16 63 43 -55 to 175

Unit

Note

V

V

V

A

Fig. 15

A

Fig. 14

W

Fig. 16

mJ

°C

Thermal/Package Characteristics

Parameter
Thermal Resistance, Junction - Case Weight Mounting Torque

Symbol
RthJC W T T M

Conditions Screws to Heatsink

Values Unit Note
Min. Typ. Max.

2.4 °C/W Fig. 13

6.1

g

1.1

Nm

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G3R350MT12D

TM

1200 V 350 m SiC MOSFET

Electrical Characteristics (At TC = 25°C Unless Otherwise Stated)

Parameter
Drain-Source Breakdown Voltage Zero Gate Voltage Drain Current
Gate Source Leakage Current
Gate Threshold Voltage
Transconductance
Drain-Source On-State Resistance
Input Capacitance Output Capacitance Reverse Transfer Capacitance Coss Stored Energy Coss Stored Charge Effective Output Capacitance (Energy Related) Effective Output Capacitance (Time Related) Gate-Source Charge Gate-Drain Charge Total Gate Charge Internal Gate Resistance Turn-On Switching Energy (Body Diode) Turn-Off Switching Energy (Body Diode) Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time

Symbol VDSS IDSS IGSS
VGS(th)
gfs
RDS(ON)
Ciss Coss Crss Eoss Qoss Co(er)

Conditions
VGS = 0 V, ID = 100 µA VDS = 1200 V, VGS = 0 V VDS = 0 V, VGS = 22 V VDS = 0 V, VGS = -10 V VDS = VGS, ID = 2.0 mA VDS = VGS, ID = 2.0 mA, Tj = 175°C
VDS = 10 V, ID = 4 A VDS = 10 V, ID = 4 A, Tj = 175°C
VGS = 15 V, ID = 4 A VGS = 15 V, ID = 4 A, Tj = 175°C
VGS = 18 V, ID = 4 A VGS = 18 V, ID = 4 A, Tj = 175°C
VDS = 800 V, VGS = 0 V f = 1 MHz, VAC = 25mV

Values Min. Typ. Max. 1200
1 100 -100
1.8 2.70 2.05 1.8 2.1 350 489 270 359 424 331 10 0.8 4 15
12

Co(tr)

19

Qgs

VDS = 800 V, VGS = -5 / +15 V

3

Qgd

ID = 4 A

3

Q g

Per IEC607478-4

10

RG(int)

f = 1 MHz, VAC = 25 mV

2.5

EOn

Tj = 25°C, VGS = -5/+15V, RG(ext) = 15 , L =

33

EOff

400.0 µH, ID = 4 A, VDD = 800 V

6

td(on)

14

t r td(off)

VDD = 800 V, VGS = -5/+15V RG(ext) = 15 , L = 400.0 µH, ID = 4 A Timing relative to VDS, Inductive load

10 10

t f

7

Note 1: Pulse Width tP Limited by Tj(max)
Note 2: Co(er), a lumped capacitance that gives same stored energy as COSS while VDS is rising from 0 to 800V. Co(tr), a lumped capacitance that gives same charging times as COSS while VDS is rising from 0 to 800V.

Unit Note V µA nA

V

Fig. 9

S

Fig. 4

m Fig. 5-8

pF Fig. 11 µJ Fig. 12 nC
pF Note 2

nC Fig. 10  µJ Fig. 22,26

ns Fig. 24

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1200 V 350 m SiC MOSFET

Reverse Diode Characteristics

Parameter

Symbol

Diode Forward Voltage
Continuous Diode Forward Current Diode Pulse Current Reverse Recovery Time Reverse Recovery Charge Peak Reverse Recovery Current Reverse Recovery Time Reverse Recovery Charge Peak Reverse Recovery Current

VSD
I S IS(pulse)
trr Qrr Irrm trr Qrr Irrm

Conditions
VGS = -5 V, ISD = 2 A VGS = -5 V, ISD = 2 A, Tj = 175°C
VGS = -5 V, Tc = 100°C VGS = -5 V, Note 1
VGS = -5 V, ISD = 4 A, VR = 800 V dif/dt = 1500 A/µs, Tj = 25°C
VGS = -5 V, ISD = 4 A, VR = 800 V dif/dt = 1500 A/µs, Tj = 175°C

Values Min. Typ. Max.
4.8 4.3 4 16 7 14 1 12 35 3

Unit Note
V Fig. 17-18
A A ns nC A ns nC A

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G3R350MT12D 1200 V 350 m SiC MOSFET
Figure 1: Output Characteristics (Tj = 25°C)

TM
Figure 2: Output Characteristics (Tj = 175°C)

ID = f(VDS, VGS); tP = 250 µs Figure 3: Output Characteristics (VGS = 15 V)

ID = f(VDS, VGS); tP = 250 µs Figure 4: Transfer Characteristics (VDS = 10 V)

ID = f(VDS, Tj); tP = 250 µs

ID = f(VGS, Tj); tP = 100 µs

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G3R350MT12D 1200 V 350 m SiC MOSFET
Figure 5: On-State Resistance v/s Temperature

TM
Figure 6: On-State Resistance v/s Drain Current

RDS(ON) = f(Tj, VGS); tP = 250 µs; ID = 4 A

RDS(ON) = f(Tj,ID); tP = 250 µs; VGS = 15 V

Figure 7: Normalized On-State Resistance v/s Temperature Figure 8: On-State Resistance v/s Gate Voltage

RDS(ON) = f(Tj); tP = 250 µs; ID = 4 A; VGS = 15 V

RDS(ON) = f(Tj,VGS); tP = 250 µs; ID = 4 A

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1200 V 350 m SiC MOSFET

Figure 9: Threshold Voltage Characteristics

Figure 10: Gate Charge Characteristics

VGS(th) = f(Tj); VDS = VGS; ID = 2.0 mA Figure 11: Capacitance v/s Drain-Source Voltage

ID = 4 A; VDS = 800 V; Tc = 25°C Figure 12: Output Capacitor Stored Energy

f = 1 MHz; VAC = 25mV

Eoss = f(VDS)

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G3R350MT12D 1200 V 350 m SiC MOSFET
Figure 13: Transient Thermal Impedance

TM
Figure 14: Safe Operating Area (Tc = 25°C)

Zth,jc = f(tP,D); D = tP/T Figure 15: Current De-rating Curve

ID = f(VDS, tP); Tj  175°C; D = 0 Figure 16: Power De-rating Curve

VGS = 15 V; ID = f(TC); Tj  175°C

PD = f(TC); Tj  175°C

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G3R350MT12D 1200 V 350 m SiC MOSFET
Figure 17: Body Diode Characteristics (Tj = 25°C)

TM
Figure 18: Body Diode Characteristics (Tj = 175°C)

ID = f(VDS, VGS); tP = 250 µs Figure 19: Third Quadrant Characteristics (Tj = 25°C)

ID = f(VDS, VGS); tP = 250 µs Figure 20: Third Quadrant Characteristics (Tj = 175°C)

ID = f(VDS, VGS); tP = 250 µs

ID = f(VDS, VGS); tP = 250 µs

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G3R350MT12D 1200 V 350 m SiC MOSFET
Figure 21: Inductive Switching Energy v/s Drain Current (VDD = 600V)

TM
Figure 22: Inductive Switching Energy v/s Drain Current (VDD = 800V)

Tj = 25°C; VGS = -5/+15V; RG(ext) = 15 ; L = 400.0µH
Figure 23: Inductive Switching Energy v/s RG(ext) (VDD = 800V)

Tj = 25°C; VGS = -5/+15V; RG(ext) = 15 ; L = 400.0µH
Figure 24: Switching Time v/s RG(ext) (VDD = 800V)

Tj = 25°C; VGS = -5/+15V; IDS = 4 A; L = 400.0µH

Tj = 25°C; VGS = -5/+15V; IDS = 4 A; L = 400.0µH

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1200 V 350 m SiC MOSFET

Figure 25: Inductive Switching Energy v/s Temperature (VDD = 800V)

Figure 26: dV/dt v/s RG(ext) (VDD = 800V)

Tj = 25°C; VGS = -5/+15V; RG(ext) = 15 ; IDS = 4 A; L = 400.0µH

Tj = 25°C; VGS = -5/+15V; IDS = 4 A; L = 400.0µH

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1200 V 350 m SiC MOSFET

Gate Charge Circuit

Gate Charge Waveform

VDS

VGS

D.U.T

RLoad

Gate Voltage (VGS)

IG(cont)
Switching Time Circuit

ID

VDD

QGS

QGD Gate Charge (QG)

Switching Time Waveform

Same device as the D.U.T. -5 V
VGS RG

LLoad
VDS D.U.T.

VDD

VGS VDS

10% 10%

90%

ID

td(on)

tr

ton

90% 10%

td(off)

90%
tf toff

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G3R350MT12D

TM

1200 V 350 m SiC MOSFET

Switching Energy Circuit

Switching Energy Waveform

Same device as the D.U.T. -5 V
VGS RG

LLoad
VDS D.U.T.

EOND xDS x dt Irr
VDS
VDD

ID

IDS

EOFFD xDS x dt

Reverse Recovery Circuit

Reverse Recovery Waveform

D.U.T.

LLoad

IF

-5 V

IF

VGS RG

0 Level VDD Same device as the D.U.T.
Irr

trr
90% dIrr to 90% range 10%

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G3R350MT12D

TM

1200 V 350 m SiC MOSFET

Package Dimensions TO-247-3 Package Outline

0.170 (4.32) 0.216 (5.49)

0.620 (15.75) 0.635 (16.13)

0.819 0.831 (20.80) (21.10)

0.085 (2.16) 0.108 (2.75)
0.212 (5.39) 0.244 (6.20)

0.780 0.800 (19.81)
(20.32)

0.075 (1.91) 0.094 (2.39)

0.044 (1.12) 0.052 (1.33)

0.161 (4.10) 0.173 (4.40)
0.113 (2.87) 0.127 (3.22)
0.022 (0.55) 0.214 (5.44) BSC. 0.027 (0.69)

0.190 (4.83) 0.205 (5.21)
0.059 (1.50) 0.098 (2.49)
0.238 (6.04) 0.248 (6.30.)

0.530 (13.46) 0.557 (14.16)

Ø 0.140 (3.56) Ø 0.144 (3.65)
Ø 0.283 (7.19) REF

0.047 (1.19)
0.640 (16.25) 0.695 (17.65)

0.090 (2.29) 0.100 (2.55)

Recommended Solder Pad Layout

0.12 (3.05)

0.214 (5.44)

0.08 (2.03)

0.214 (5.44)

Package View

Case (D)

S G
D

NOTE
1. CONTROLLED DIMENSION IS INCH. DIMENSION IN BRACKET IS MILLIMETER. 2. DIMENSIONS DO NOT INCLUDE END FLASH, MOLD FLASH, MATERIAL PROTRUSIONS.

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1200 V 350 m SiC MOSFET

Compliance
RoHS Compliance
The levels of RoHS restricted materials in this product are below the maximum concentration values (also referred to as the threshold limits) permitted for such substances, or are used in an exempted application, in accordance with EU Directive 2011/65/EC (RoHS 2), as adopted by EU member states on January 2, 2013 and amended on March 31, 2015 by EU Directive 2015/863. RoHS Declarations for this product can be obtained from your GeneSiC representative.
REACH Compliance
REACH substances of high concern (SVHCs) information is available for this product. Since the European Chemical Agency (ECHA) has published notice of their intent to frequently revise the SVHC listing for the foreseeable future, please contact a GeneSiC representative to insure you get the most up-to-date REACH SVHC Declaration. REACH banned substance information (REACH Article 67) is also available upon request.

Disclaimer
GeneSiC Semiconductor, Inc. reserves right to make changes to the product specifications and data in this document without notice. GeneSiC disclaims all and any warranty and liability arising out of use or application of any product. No license, express or implied to any intellectual property rights is granted by this document.
Unless otherwise expressly indicated, GeneSiC products are not designed, tested or authorized for use in life-saving, medical, aircraft navigation, communication, air traffic control and weapons systems, nor in applications where their failure may result in death, personal injury and/or property damage.

Related Links

· SPICE Models:

https://www.genesicsemi.com/sic-mosfet/G3R350MT12D/G3R350MT12D_SPICE.zip

· PLECS Models:

https://www.genesicsemi.com/sic-mosfet/G3R350MT12D/G3R350MT12D_PLECS.zip

· CAD Models:

https://www.genesicsemi.com/sic-mosfet/G3R350MT12D/G3R350MT12D_3D.zip

· Gate Driver Reference: https://www.genesicsemi.com/technical-support

· Evaluation Boards: https://www.genesicsemi.com/technical-support

· Reliability:

https://www.genesicsemi.com/reliability

· Compliance:

https://www.genesicsemi.com/compliance

· Quality Manual:

https://www.genesicsemi.com/quality

Revision History
· Rev 23/Feb: Updated with Most Recent Data · Supersedes: Rev 20/Jun, Rev 20/Aug, Rev 21/Jan, Rev 21/May

www.genesicsemi.com/sic-mosfet/

Rev 23/Feb Copyright© 2023 GeneSiC Semiconductor Inc. All Rights Reserved. Downloaded from Arrow.com.

Published by GeneSiC Semiconductor, Inc. 43670 Trade Center Place Suite 155, Dulles, VA 20166; USA
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References

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