Renishaw SFP2 Surface Finish Probe
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Enhanced access and inspection capability for integrated surface finish measurement
The SFP2 probe increases the surface finish measurement ability of the REVO® system, which offers multi-sensor capability providing touch-trigger, high speed tactile scanning and non-contact vision measurement on a single CMM.
Powered by 5-axis measurement technology, the SFP2's automated surface finish inspection offers significant time savings, reduced part handling and greater return on CMM investment.
The SFP2 system consists of a probe and a range of modules and is automatically interchangeable with all other probe options available for REVO, providing the flexibility to easily select the optimum tool to inspect a wide range of features, all on one CMM platform. Data from multiple sensors is automatically referenced to a common datum.
The surface finish system is managed by the same I++ DME compliant interface as the REVO system, and full user functionality is provided by Renishaw's MODUS metrology software.
Image Description: A Renishaw SFP2 surface finish probe attached to a REVO-2 system, showcasing its probe head, integral motorised C-axis, and knuckle joint for enhanced access.
Key benefits
Unrivalled feature access
SFP2 benefits from REVO's infinite positioning and 5-axis movement, and features an integral motorised C-axis. The SFM variants offer a range of tip arrangements which, combined with the knuckle joint between module and holder, provide access to the features most difficult to reach.
Operator independent data collection
CMM programs can now include automated and operator-independent surface finish measurement. All results, including surface finish data, are recorded and stored in a single location for easy retrieval.
Greater return on investment in CMMs
Integrated surface finish and dimensional inspection can remove the need for dedicated surface measurement equipment, reducing factory footprint, part handling and associated costs.
Specifications
SFM-A1 and SFM-A2 modules
| Specification | Value |
|---|---|
| Surface finish range | 0.05 - 6.3 µm Ra |
| Surface finish accuracy (of nominal Ra) | ± (5% +15 nm) |
| Surface forces (nominal) | Skid: 0.2 N Stylus tip: 0.003 N |
| Encoder resolution | 1 nm |
| Nominal stylus tip protrusion beyond skid | 0.5 mm |
| Measurement speed | Up to 1 mm/s |
| SFM range of adjustment | ± 90° at the knuckle joint |
SFP2 probe
| Specification | Value |
|---|---|
| C-axis positioning accuracy | ± 0.25° |
| C-axis rotation speed | Up to 90°/sec |
| Rotational capability | A-axis (from REVO-2): +120°/-110° B-axis (from REVO-2): Infinite positioning C-axis: ± 180° |
| Mounting (probe and holder) | Magnetised coupling |
System features
| Feature | Details |
|---|---|
| Probe head | REVO-2 only |
| Change rack | MRS2 recommended for full capability |
| Software compatibility | UCCsuite 5.2 onwards MODUS 1.8 onwards |
Weight
| Component | Weight |
|---|---|
| SFP2 probe | 330 g |
| SFH1 holder | 33 g |
| SFM-A1 module | 12 g |
| SFM-A2 module | 12 g |
Environmental Specifications
| Specification | Value |
|---|---|
| Operating temperature range | +10 °C to +40 °C |
| Storage temperature range | -25 °C to +70 °C |
| Operating humidity | 0% to 80% (non-condensing) |
Calibration and verification artifacts
| Artifact | Specification |
|---|---|
| SFA1 | 3.0 µm Ra sinusoid |
| SFA2 | 0.5 µm Ra sinusoid |
| SFA3 | 0.4 µm Ra sawtooth |
| TFP | Uses LF TP20 module; PICS interface to SPA3 amplifier |
Outputs
| Software | Surface Texture Parameters |
|---|---|
| MODUS basic | Ra, Rms(Rq) |
| MODUS standard surface texture | Rt, R3z, Rz, Rz1max, RzDIN, RzJIS, Rseg Rp, Rv Rpm, Rvm, Rc, Rsm |
| MODUS advanced surface texture | Rk, Rpk, Rvk, Rmr, Rmr1, Rmr2, Rpq, Rvq, Rmq, Rvoid, Rvdd, Rvddl, Rcvx, Rcvxl |
Sampling rate
4 kHz
SFP2 surface finish probe for the REVO® system
