Ossila Probe Station User Manual

This user manual provides comprehensive guidance for the Ossila Probe Station, a sophisticated instrument designed for the precise and repeatable electrical characterization of electronic devices.

The system is engineered for stability and accuracy, featuring a vibration-dampening base, a high-resolution translation stage for sub-micron control, and a vacuum-compatible chuck. It supports detailed visual inspection and probe placement with its integrated microscope and camera system.

Key features include:

• Precise four-axis stage movement (X, Y, Z, Rotation)
• Vacuum chuck with selectable zones for various substrate sizes
• High-resolution optical system with zoom lens and LED illumination
• Real-time video output for monitoring and analysis
• Robust construction for laboratory environments

This manual covers installation, system overview, operation, maintenance, and troubleshooting to ensure optimal performance and safe usage. For further information, please visit www.ossila.com.