User Manual for ON Semiconductor models including: EVBUM2184DB, NB7L14MNGEVB, NB7L14MNG Evaluation Board, NB7L14MNG, Evaluation Board, Board

EVBUM2184DB - NB7L14MNG Evaluation Board User's Manual

ON Semiconductor has developed the QFN16EVB..evaluation board for its high-performance devices packaged..in the 16-pin QFN. This evaluation board was designed to..provide a flexible and convenient platform to quickly..evaluate, characterize and verify the operation of various..ON Semiconductor products. Many QFN16EVBs are..dedicated with a device already installed, and can be ordered..from www.onsemi.com at the specific device web page...This evaluation board manual contains:..• Information on 16-lead QFN E

ON Semiconductor


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evbum2184d
NB7L14MNGEVB

NB7L14MNG Evaluation Board User's Manual

Introduction ON Semiconductor has developed the QFN16EVB
evaluation board for its high-performance devices packaged in the 16-pin QFN. This evaluation board was designed to provide a flexible and convenient platform to quickly evaluate, characterize and verify the operation of various ON Semiconductor products. Many QFN16EVBs are dedicated with a device already installed, and can be ordered from www.onsemi.com at the specific device web page.
This evaluation board manual contains:
· Information on 16-lead QFN Evaluation Board · Assembly Instructions · Appropriate Lab Setup · Bill of Materials
This user's manual provides detailed information on board contents, layout and its use. It should be used in conjunction with an appropriate ON Semiconductor device datasheet located at www.onsemi.com. The datasheet contains the technical device specifications.

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EVAL BOARD USER'S MANUAL
Board Layout The QFN16 Evaluation Board provides a high bandwidth,
50 W controlled impedance environment and is implemented in four layers. The first layer or primary trace layer is 0.008 thick Rogers RO4003 material, and is designed to have equal electrical length on all signal traces from the device under test (DUT) pins to the SMA connectors. The second layer is the 1.0 oz copper ground plane and is primarily dedicated for the SMA connector ground plane. FR4 dielectric material is placed between the second and third layers and between third and fourth layers. The third layer is also 1.0 oz copper plane. A portion of this layer is designated for the device VCC and DUTGND power planes. The fourth layer is the secondary trace layer.

Top View

Bottom View

Figure 1. Top and Bottom View of the 16 QFN Evaluation Board

© Semiconductor Components Industries, LLC, 2013

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Figure 2. Enlarged Bottom View

Pin 13 Pin 14 Pin 15 Pin 16

Pin 12 Pin 11 Pin 10 Pin 9

VEE/DUTGND VCC
SMA_GND
DUT_GND

SMA_GND

Pin 1 Pin 2 Pin 3 Pin 4

Pin 8 Pin 7 Pin 6 Pin 5

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Figure 3. Enlarged Bottom View of the Evaluation Board

SILKSCREEN (TOP SIDE)

LAYER 1 (TOP SIDE) 1 OZ ROGERS 4003 0.008 in
LAYER 2 (GROUND PLANE P1) 1 OZ FR-4 0.020 in
LAYER 3 (GROUND, VCC & VEE, PLANE P2) 1 OZ FR-4 0.025 in
LAYER 4 (BOTTOM SIDE) 1 OZ
Figure 4. Evaluation Board Layout, 4 Layer

0.062 ± 0.007

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Top View

Figure 5. Evaluation Board Layout

Bottom View

Evaluation Board Assembly Instructions The QFN-16 evaluation board is designed for
characterizing devices in a 50 W laboratory environment using high bandwidth equipment. Each signal trace on the board has a via at the DUT pin, which provides an option of placing a termination resistor on the board bottom, depending on the input/output configuration (see Table 1, Configuration for Device: NB7L14). Table 4 contains the Bill of Materials for this evaluation board.
The QFN16EVB was designed to accommodate a custom QFN-16 socket. Therefore, some external components are installed on the bottom side of the board.
Solder the Device on the Evaluation Board The soldering of a device to the evaluation board can be
accomplished by hand soldering or solder reflow techniques using solder paste. Make sure pin 1 of the device is located properly and all the pins are aligned to the footprint pads. Solder the QFN-16 device to the evaluation board. As mentioned earlier, many QFN16EVBs are dedicated with a device already installed, and can be ordered from onsemi.com at the specific device web page.
Connecting Power and Ground On the top side of the evaluation board, solder the four
surface mount test point clips (anvils) to the pads labeled VCC, VEE/DUTGND, SMAGND, and ExPad. ExPad is connected to the exposed flag of the QFN package. For proper operation, the exposed flag is typically recommended to be tied to VEE/DUTGND, the negative supply of the device.
The positive power supply connector is labeled VCC. Depending on the device, the negative power supply nomenclature is labeled either GND or VEE. To help avoid

confusion with the use of this board, the negative supply connector is labeled VEE/DUTGND. SMAGND is the ground for the SMA connectors and is not to be confused with the device ground, VEE/DUTGND. SMAGND and DUTGND can be connected in single-supply applications. The power pin layout and typical connection of the evaluation board is shown in Figure 6.
It is recommended to add bypass capacitors to reduce unwanted noise from the power supplies. Connect 0.1 mF capacitors from VCC and VEE/DUTGND to SMA_GND.
Output Loading/Termination
ECL/PECL/LVPECL Outputs Most ECL outputs are open emitter and need to be DC
loaded and AC terminated to VCC - 2.0 V via a 50 W resistor. If no internal resistors are provided on the device, 0402 chip resistor pads are provided on the bottom side of the evaluation board to terminate the ECL driver. Solder the chip resistors to the bottom side of the board between the appropriate input device pads and the ground pads. If internal resistors are provided, the VT pins should be wired to SMAGND. (More information on termination is provided in AND8020).
For standard ECL lab setup and test, a split (dual) power supply is recommended enabling the 50 W internal impedance in the oscilloscope, or other measuring instrument, to be used as an ECL output load/termination. By offsetting VCC = +2.0 V, SMAGND = VCC - 2.0 V, (SMAGND is the system ground, 0V); VCC is 2.0 V, and VEE/DUTGND is -3.0 V, -1.3 V or -0.5 V; see Table 2, Power Supply Levels).

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CML Outputs Likewise, CML outputs need to be terminated to VCC via
a 50 W resistor. If no internal resistors are provided on the device, 0402 chip resistor pads are provided on the bottom side of the evaluation board to terminate the CML driver. If internal resistors are provided, the VT pins should be wired to VCC.
For CML lab setup and test, operation with negative supply voltages is recommended to enable the 50 W internal impedance in the oscilloscope, or other measuring instrument, to be used as a CML output termination; (VCC = 0 V, SMAGND = 0 V, and VEE/DUTGND = -5.0 V, -3.3 V, -2.5 V, or -1.8 V).
LVDS Outputs LVDS outputs are typically terminated with 100 W across
the Q/Q output pair. The 100 W can be added on the QFN16EVB, but it is not provided on the board, since there are several user dependent LVDS output measurement techniques.
For LVDS lab setup and test, a single supply is typically used, ie. VCC = 3.3 V and DUTGND = 0 V.

Installing the SMA Connectors Each configuration indicates the number of SMA
connectors needed to populate an evaluation board for a given device. Each input and output requires one SMA connector. Install all the required SMA connectors onto the board and solder the center signal conductor pin to the board on J1 through J16. Please note that the alignment of the signal connector pin of the SMA connector to the metal trace on the board can influence lab results. The launch and reflection of the signals are largely influenced by imperfect alignment and soldering of the SMA connector.
Validating the Assembled Board After assembling the evaluation board, it is recommended
to perform continuity checks on all soldered areas before commencing with the evaluation process. Time Domain Reflectometry (TDR) is another highly recommended validation test.

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NB7L14MNGEVB ASSEMBLY

Table 1. CONFIGURATION FOR DEVICE: NB7L14

J1 J2 J3 J4 J5 J6 J7 J8 J9 J10 J11 J12 J13 J14 J15 J16

Device Pin # 1

2

3

4

5

6

7

8

9 10 11 12 13 14 15 16

SMA Connector

Yes Yes Yes Yes No Yes Yes No Yes Yes Yes Yes No Yes Yes No

Wire

No No No No GND No No VCC No No No No VCC No No GND

NOTE: DUTGND/VEE = Exposed Pad and must be tied to DUTGND/VEE.

CONFIGURATIONS

VEE/DUTGND

VCC SMAGND

13 14 15 16

12

1

11 ExPad

2

10

3

9

4

8 7 6 5

SMAGND

J15 J16
J1 VCC
J2
J3 Exposed Pad
J4
J5 J6

J14 J13
J12
DUTGND/VEE J11
DUT J10
SMAGND
J9
J8 J7

Top View

Polarity of 22 mF:

+ C4 -

+ C2 -

Bottom View

Install 0.1 mF Decoupling Capacitors here and at package pins

Figure 6. Power Supply Configuration for Device NB7L14

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Differential Signal
Generator
Out
Out

NB7L14MNGEVB
NB7L14MNGEVB TEST
Power Supply VCC VEE/DUTGND

VCC

DUTGND/

DUT

VEE

ExPad

SMAGND

Test Measuring Equipment
Channel 1 Channel 2

Trigger

Trigger

VEE/ DUTGND

GND (0 V)

Power Supply

1. Connect appropriate power supplies to VCC, VEE/DUTGND, SMAGND, and ExPad (see Table 2). 2. Connect a signal generator to the input SMA connectors. Setup input signal according to the device data sheet. 3. Connect a test measurement device to the device's output SMA connectors.
NOTE: The test measurement device must contain 50 W termination.
Figure 7. Basic Lab Setup (Typical)

Table 2. POWER SUPPLY LEVELS

Outputs

Power Supply

ECL/LVPECL

2.5 V

ECL/LVPECL

3.3 V

VCC +2.0 V +2.0 V

VEE/DUTGND -0.5 V -1.3 V

SMAGND 0 V 0 V

ExPad (typ) VEE/DUTGND VEE/DUTGND

Table 3. NB7xxx, LVPECL OUTPUTS "SPLIT" POWER SUPPLY CONFIGURATION

Device Pin Power Supply Convertor

"Spilt" Power Supply

VCC SMAGND DUTGND

VCC = +2.0 V VTT = 0 V
DUTGND = -0.5 V or -1.3 V

Dual Power Supplies

+2.0 V

+1.3 V

+

-+

-

VCC

DUTGND

SMAGND

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+3.3 V Offset / "Split" Power Supply Configuration Figure 8. "Split" or Dual Power Supply Connections
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Table 4. BILL OF MATERIALS

Components SMA Connector

Manufacturer

Description

Part Number

Qty

Rosenberger

SMA Connector, Side 32K243-40ME3

12

Launch, Gold Plated

Surface Mount Test Points

Keystone*

SMT Miniature Test

5015

4

Point

Chip Capacitor

AVC Corporation* 0603 0.01 mF ±10% 06035C103KAT2A na

Chip Resistor

Panasonic*

0603 0.1 mF ±10%

0603C104KAT2A

8

0402 50 W ±1%

ERJ-2RKF49R9X na

Precision Thick Film

Chip Resistor

Evaluation Board

ON Semiconductor QFN 16 Evaluation

QFN16EVB

1

Board

Device Samples

ON Semiconductor

QFN 16 Package Device

NB7L14MNG

1

*Components are available through most distributors, i.e. www.newark.com, www.digikey.com

Web Site http://www.rosenberger.de http://www.rosenbergerna.com
http://www.keyelco.com http://www.avxcorp.com
http://www.panasonic.com
http://www.onsemi.com http://www.onsemi.com

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Top Layer

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Second Layer (SMA_GND Plane) Figure 9. Gerber Files
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Third Layer (DUT_GND Trace)

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Bottom Layer Figure 10. Gerber Files
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ADDITIONAL INFORMATION
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References

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