Technical Compliance Statement
No. EM-E990051
This document confirms that products from FSP Group Inc. have been tested by AUDIX TECHNOLOGY CORPORATION and found to be in compliance with the council EMC directive 2004/108/EC. This compliance allows for the use of CE marking.
Product Information
- Submittor:
- FSP Group Inc.
No. 22, Jianguo E. Rd., Taoyuan City, Taiwan, R.O.C. - Product:
- Switching Power Supply
- Model Numbers (M/N):
- (1)FSP700-802UK, (2)FSP700-801UK, (3)FSP600-801UK, (4)SPI700W7BB, (5)SPI700U4BB, (6)SPI600U4BB
- Brand:
- (1)~(3)FSP, (4)~(6)SPI
Test Standards Compliance
| Standard | Description |
|---|---|
| EN 61204-3/2000 | Low voltage power supplies, d.c. output Part 3: Electromagnetic compatibility (EMC) |
| EN 55022/2006 +A1/2007 | Limits and methods of measurement of radio disturbance characteristics of information technology equipment |
| EN 61000-3-2/2006 | Part 3: Limits-Section 2: Limits for harmonic current emission (equipment input current <=16A per phase) |
| EN 61000-3-3/1995 +A1/2001 +A2/2005 | Part 3: Limits-Section 3: Limitation of voltage fluctuations and flicker in low-voltage supply systems for equipment with rated current <=16A |
| EN 55024/1998 +A1/2001+A2/2003 | Information technology equipment-Immunity characteristics Limits and methods of measurement |
| IEC 61000-4-2/2008 | Electrostatic discharge immunity test |
| IEC 61000-4-3/2008 | Radiated, radio-frequency electromagnetic field immunity test |
| IEC 61000-4-4/2004 +Corr.1:2006 +Corr.2:2007 | Electrical fast transient / burst immunity test |
| IEC 61000-4-5/2005 | Surge immunity test |
| IEC 61000-4-6/2008 | Immunity to conducted disturbances, induced by radio-frequency fields |
| IEC 61000-4-8/2001 | Power Frequency Magnetic field immunity test |
| IEC 61000-4-11/2004 | Voltage dips, short interruptions and voltage variations immunity test |
Verification Details
The verification is based on a single evaluation of one sample of the mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab logo.
Issued by: Leon Liu, Deputy General Manager
Date: January 25, 2018
