Automotive Ethernet Test Solutions
Tektronix 5/6 Series MSO Solutions for 1000BASE-T1/100BASE-T1
Product Overview
Tektronix's 5-CMAUTOEN/6-CMAUTOEN automotive Ethernet solutions provide fully automated compliance test application software for 1000BASE-T1 and 100BASE-T1 standards. Running on the 5/6 Series MSO, these solutions not only offer compliance testing but also leverage the oscilloscope's verification and debugging capabilities. The integration of automotive Ethernet presents higher demands on technology, requiring more comprehensive design validation to ensure interoperability between ECUs and reliability in harsh environments. The complete test solution enables engineers to gain design margins with greater confidence in real-world conditions through rigorous compliance testing.
Key Features
- Test Time: Fully automated setup wizard supports compliance testing for Automotive Ethernet 1000BASE-T1™ (802.3bp) and 100BASE-T1 (802.3bw™) standards, significantly reducing overall test time by automatically configuring the instrument based on test requirements.
- Test Coverage: The automotive Ethernet solutions for 100BASE-T1 and 1000BASE-T1 are designed based on IEEE and Open Alliance specifications. Test coverage meets OPEN Alliance TC8 ECU test requirements.
- Verification and Debugging: Companion tools, such as advanced jitter analysis, help identify issues before performing compliance tests or during troubleshooting.
- Signal Inspection: Beyond compliance testing, automated tests and advanced jitter analysis tools are provided for testing the DUT under various environmental conditions.
- Comprehensive Reporting: Automated report generation includes test pass/fail screenshots of waveforms.
- Measurement Accuracy: The 5/6 Series MSO oscilloscopes deliver accurate and repeatable results, featuring 12-bit ADC vertical resolution and sampling rates of 3.125 Gs/s (5 Series MSO) and 12.5 Gs/s (6 Series MSO).
- Return Loss Measurement: The 100/1000BASE-T1 specifications require a "Return Loss" measurement, typically needing a Vector Network Analyzer (VNA). With Tektronix's patented measurement method within the automotive Ethernet test solution, engineers can perform return loss measurements using the oscilloscope without additional test equipment.
- ECU Clock Access: The "Distortion" test requires access to the ECU clock, which is often not feasible. Tektronix's proprietary algorithm software correction method (patent pending) allows users to perform distortion measurements without connecting to the ECU clock. This method is applicable for both 100BASE-T1 and 1000BASE-T1.
- Performance Validation: Automotive Ethernet applications allow users to run selected tests multiple times. Reports display pass/fail results for each run, enabling analysis of ECU performance across different operational cycles.
Automated Automotive Ethernet Compliance Testing
Industry-standard physical layer compliance tests ensure interoperability between different designs and hardware vendors. The requirements for these tests have expanded to cover Automotive Ethernet 1000BASE-T1™ (802.3bp) and 100BASE-T1 (802.3bw™). For electrical signals, numerous specific tests are defined for the Physical Medium Attachment (PMA), with Group 1 primarily focusing on the transmitter. 1000BASE-T1 automotive Ethernet testing requires oscilloscopes with a minimum bandwidth of 2 GHz.
Supported Tests
1000BASE-T1 Tests
| Test Item | Test Name | Test Mode | Instrument |
|---|---|---|---|
| 97.5.3.1 | Transmitter Output Droop | 6 | 2 GHz Oscilloscope |
| 97.5.3.2 | Transmitter Distortion | 4 | 2 GHz Oscilloscope and AWG |
| 97.5.3.3 | Transmitter Timing Jitter (Master/Slave) | 1 | 2 GHz Oscilloscope |
| 97.5.3.4 | Transmitter Power Spectral Density (PSD) | 5 | 2 GHz Oscilloscope |
| 97.5.3.6 | Transmitter Clock Frequency | 1 | 2 GHz Oscilloscope |
| 97.5.3.5 | Peak Differential Output | 5 | 2 GHz Oscilloscope |
| 97.7.2.1 | MDI Return Loss | Slave | 2 GHz Oscilloscope or Tektronix VNA |
| 97.5.3.3 | MDI Jitter | 2 | 2 GHz Oscilloscope |
100BASE-T1 Tests
| Test Number | Test Name | Test Mode | Instrument |
|---|---|---|---|
| 5.1.1 | Transmitter Output Droop | 1 | 1 GHz Oscilloscope |
| 5.1.2 | Transmitter Distortion | 4 | 2 GHz Oscilloscope and AWG |
| 5.1.3 | Transmitter Timing Jitter | 2 | 2 GHz Oscilloscope and AWG/AFG |
| 5.1.4 | Transmitter Power Spectral Density (PSD) | 5 | 1 GHz Oscilloscope |
| 5.1.5 | Transmitter Clock Frequency | 2 | 1 GHz Oscilloscope |
| 5.1.6 | MDI Return Loss | Slave | 1 GHz Oscilloscope and AWG or Tektronix VNA |
| 5.1.6 | Peak Differential Output | 5 | 1 GHz Oscilloscope |
The Tektronix Automotive Ethernet Test Solution provides automated compliance testing to meet 100BASE-T1 (IEEE 802.3bw™) and 1000BASE-T1 (IEEE 802.3bp™) requirements. The automated compliance test solution includes test software that runs on Tektronix oscilloscopes with Windows 10 operating systems (1 GHz or higher) to perform all physical layer (PHY) transmitter compliance tests. The compliance test software allows for comprehensive or selective testing of any transmitter electrical parameter, including the use of the oscilloscope's full control over required settings. The software's flexible setup enables design validation, margin analysis, and repeatable compliance testing while simplifying instrument setup. Additionally, the software generates detailed, timestamped test reports with pass/fail results, displaying waveforms and data plots.
Verification and Debugging
With the 5/6 Series MSO, verification and debugging can be easily performed in the early stages of design, prior to final compliance testing. The oscilloscope's standard measurement functions, combined with the optional 5-DJA/6-DJA Advanced Jitter and Timing Analysis software, support several key compliance tests, including:
- Clock frequency and transmitter amplitude with histogram and trend analysis.
- Positive and negative droop measurements.
- Comprehensive characterization of jitter performance, including TIE and histogram characteristics.
- Eye diagram analysis for PAM3 signals.
These early tests improve the likelihood of passing compliance tests while supporting more comprehensive characterization and determination of design margins. Master/slave jitter measurements can be particularly challenging, as compliance test limits are tight, requiring the elimination of potential random or deterministic jitter sources.
Diagram: Connection diagram for measurements that use TC1 Test fixture
This diagram illustrates the connection setup for measurements using the TC1 Test fixture, showing the DUT connected to the fixture, which then connects to the 5/6 Series MSO and a differential probe.
Diagram: Connection diagram for MDI Return Loss measurement
This diagram shows the setup for MDI Return Loss measurement, detailing the connections between the 5/6 Series MSO, test fixture, and the AWG5200 signal generator.
Diagram: Jumper Connections for testing Lane A, B, C, & D
This illustration shows the jumper connections on a test fixture, specifying configurations for testing different lanes (A, B, C, & D).
Diagram: Jitter and Transmit Clock Frequency Measurement
This shows waveform and histogram plots related to jitter analysis and transmit clock frequency measurements, as performed by the 5/6 Series MSO.
Diagram: Droop Measurement - Positive and Negative Peak Values of Waveform
This displays waveform plots illustrating the positive and negative peak values of the signal for droop measurements.
Diagram: MDI Jitter Measurement
This shows a histogram plot representing the MDI jitter measurement results.
Diagram: Power Spectral Density (PSD) Measurement
This plot displays the Power Spectral Density (PSD) of the signal, showing frequency on the x-axis and PSD (dBm/Hz) on the y-axis, along with defined limits.
Diagram: TIE Histogram, TIE Spectrum, Eye Diagram
These are plots generated during jitter and eye diagram analysis, showing Time Interval Error (TIE) histogram, TIE spectrum, and the eye diagram of the signal.
Diagram: Physical Layer Jitter/Timing Analysis
This section includes waveform and histogram plots related to physical layer jitter and timing analysis, such as Time Interval Error (TIE).
Diagram: Differential Amplitude Characteristics
This refers to eye diagram plots that characterize the differential amplitude of the signal.
Diagram: Distortion Signal Eye Diagram Analysis
These eye diagram plots demonstrate the effect of a disturbing signal on the eye diagram, illustrating analysis with and without the disturbance.
Diagram: Detailed Test Report, Showing PSD Template Test Diagram
This refers to a detailed test report that includes a diagram showing the Power Spectral Density (PSD) template test results.
Diagram: TF-XGbT Ethernet Fixture
An image of the TF-XGbT Ethernet test fixture used for automotive Ethernet testing.
Diagram: TC5
A label indicating a component or connection point, likely on a test fixture.
Signal Quality Testing
Automotive design engineers need to validate circuit design quality under various conditions, including different temperatures, voltages, and vibrations. Beyond compliance testing, engineers must verify design quality across these diverse environments. The 5-DJA/6-DJA Advanced Jitter and Timing Analysis software allows engineers to configure 1000BASE-T1/100BASE-T1 measurements and run tests under different environmental conditions. This enables integration of measurements within the automotive environment and continuous mode operation.
Pass/Fail Reporting
The 5-CMAUTOEN/6-CMAUTOEN solutions support summary reports in MHL or PDF formats, allowing for quick and convenient compilation of compliance test documentation. The software automatically generates reports upon test completion, including pass/fail status for tests, enabling rapid analysis of results. Reports also include test configuration details, waveform plots, oscilloscope display screens, and margin analysis for in-depth understanding of design characteristics.
Probes and Test Fixtures
Accurate and repeatable compliance testing requires access to the PHY transmitter output and reference clock, supporting calibration and the use of disturbing signals. The recommended approach is to use the Tektronix TF-XGbT Ethernet fixture and the TF-BRR-CFD clock divider fixture. These fixtures support all test setups and provide convenient test points for probing.
Diagram: TF-XGbT Ethernet Fixture
An image of the TF-XGbT Ethernet test fixture, a key component for automotive Ethernet testing.
For direct DUT probing, a differential probe with ≥2 GHz bandwidth is recommended. The Tektronix TDP3500 is the recommended differential probe for 1000BASE-T1 testing.
Ordering Information
| Measurement | Required Hardware | Required Software | Recommended Options | Probing | Signal Source (AWG) | Recommended Test Fixture | Other Recommended Items |
|---|---|---|---|---|---|---|---|
| Transmitter Output Droop | 5/6 Series MSO with one probe | ||||||
| Transmitter Timing Jitter | Option 5–CMAUTOEN/6–CMAUTOEN or SUP5–CMAUTOEN/SUP6–CMAUTOEN (TekExpress Automotive Ethernet Compliance Test Software) | Option 5-DJA/6-DJA or SUP5-DJA/SUP6-DJA (for advanced jitter and eye diagram analysis) | Recommended (requires two): 1000BASE-T1 TDP3500 differential probe and 100BASE-T1 TDP1500 or TDP3500 differential probe | Recommended: Tektronix AFG3152C Signal Source | TF-XGbT Test Fixture | External PC Monitor | |
| Transmitter Clock Frequency | 5 Series MSO (2 GHz Option 5-BW-2000) or 6 Series MSO with minimum 2 GHz bandwidth (Options 6-BW-2500, 6-BW-4000, 6-BW-6000, 6-BW-8000) for 1000BASE-T1 | Option 5-WIN/6-WIN or SUP5-WIN/SUP6-WIN (with removable hard drive, featuring Microsoft Windows 10 OS) | Supports: Tektronix AWG5200 with high-amplitude DC-coupled output option or AWG70000 series signal source (for 1000BASE-T1 return loss measurement) | TF-BRR-CFD Clock Divider (required for hardware clock for 'Distortion' test) | Two pairs of 50 Ω high-quality coaxial cables (4 cables total), all of the same length, for AFG or AWG signal source. | ||
| MDI Jitter | 5 Series MSO (1 GHz Option 5-BW-1000 or 2 GHz Option 5-BW-2000) or 6 Series MSO with minimum 1 GHz bandwidth (Options 6-BW-1000, 6-BW-2500, 6-BW-4000, 6-BW-6000, 6-BW-8000) for 100BASE-T1 | Option 5-RL-125M/6-RL-125M or SUP5-RL-125M/SUP6-RL-125M (for 125M record length) | Supports: P77C292MM adapter for TDP7704 / 7706/7708 probes (Return Loss and Distortion tests not supported), P6247 or P6248 (requires TPA-BNC adapter) | Two 50 Ω high-quality coaxial cables for clock divider output; one 50 Ω high-quality SMA cable for clock divider input; one 50 Ω high-quality coaxial cable for marker output from AFG or AWG signal source. | |||
| Differential Output | Option 5–SRAUTO/6–SRAUTO or SUP5–SRAUTO/SUP6-SRAUTO (for CAN, CAN FD, LIN, FlexRay serial bus trigger and decode) | ||||||
| Transmitter Power Spectral Density | Option 5-SRAUTOSEN/6-SRAUTOSEN or SUP5-SRAUTOSEN/SUP6-SRAUTOSEN (for SENT protocol trigger and decoder) | ||||||
| Transmitter Distortion | Option 5-SREMBD/6-SREMBD or SUP5–SREMBD/SUP6-SREMBD (for I2C, SPI serial bus trigger and decode) | ||||||
| Return Loss |
Company Information & Certifications
Tektronix is certified by SRI quality system registrar for ISO 9001 and ISO 14001. Products comply with IEEE standard 488.1-1987, RS-232-C, and Tektronix standard specifications and requirements. Areas of accepted product evaluation include planning, design/development, and manufacturing of electronic test and measurement instruments.
For detailed information, Tektronix maintains a knowledge base of application notes, technical briefs, and other resources, continuously adding new content to help engineers solve cutting-edge technical challenges. Please visit cn.tek.com.
Copyright © Tektronix, Inc. All rights reserved. Tektronix products are protected by U.S. and foreign patents (including issued and pending patents). Information in this document supersedes information in all previously published material. Rights to change product specifications and prices are reserved. TEKTRONIX and TEK are registered trademarks of Tektronix, Inc. All other trademarks mentioned are service marks, trademarks, or registered trademarks of their respective companies.
