MIC Test Report

Issuing Laboratory

Company Name: BTF Testing Lab (Shenzhen) Co., Ltd.

Address: F101, 201 and 301, Building 1, Block 2, Tantou Industrial Park, Tantou Community, Songgang Street, Bao'an District, Shenzhen, China

Report Number: BTF250210R01002

Test Standards: Article 2, Paragraph 1, Item11-19, item 54.

Test Conclusion: Pass

Test Date: 2023-02-08 to 2023-02-15

Date of Issue: 2025-02-11

Prepared By: Chris Liu, Project Engineer

Approved By: Ryan CJ, EMC Manager

Revision History

Note: Once the revision has been made, then previous versions reports are invalid.

1. Introduction

1.1 Identification of Testing Laboratory

1.2 Identification of the Responsible Testing Location

1.3 Laboratory Condition

1.4 Announcement

• The test report reference to the report template version v0.
• The test report is invalid if not marked with the signatures of the persons responsible for preparing, reviewing and approving the test report.
• The test report is invalid if there is any evidence and/or falsification.
• This document may not be altered or revised in any way unless done so by BTF and all revisions are duly noted in the revisions section.
• Content of the test report, in part or in full, cannot be used for publicity and/or promotional purposes without prior written approval from the laboratory.
• The laboratory is only responsible for the data released by the laboratory, except for the part provided by the applicant.

2. Product Information

2.1 Application Information

2.2 Manufacturer Information

2.3 Factory Information

2.4 General Description of Equipment under Test (EUT)

2.5 Technical Information

Test Channel List

3. Summary of Test Results

Note:

• 1. PASS: Test item meets the requirement.
• 2. Fail: Test item does not meet the requirement.
• 3. N/A: Test case does not apply to the test object.
• 4. The test result judgment is decided by the limit of test standard.

3.1 Uncertainty of Test

The following measurement uncertainty levels have been estimated for tests performed on the EUT as specified in TR 100 028-1, and TR 100 028-2. This uncertainty represents an expanded uncertainty expressed at approximately the 95% confidence level using a coverage factor of k=2.

4. Test Configuration

4.1 Environment Condition

The RF unit is supplied DC 1.8V. The fluctuation of input voltage to the circuit of RF unit of test equipment is under ±1%, when input voltage DC 3.8V is fluctuated ±10%, so all measurement has been conducted by only rated voltage.

4.2 Test Equipment List

Remark:

• 1. Calibration conducted by the National Institute of Information and Communications Technology (NICT) in Japan (hereinafter referred to as *NICT*) or a designated calibration agency under Article 102-18 paragraph (1) in JRL.
• 2. Correction conducted pursuant to the provisions of Article 135 or Article 144 of the Measurement Act (Act No.51 of 1992).
• 3. Calibration conducted in countries except Japan, which shall be equivalent to the calibration conducted by the NICT or a designated calibration agency under Article 102-18 paragraph (1).
• 4. Calibration, etc. conducted by using measuring instruments and other equipment listed in the right column of appended table No. 3, which shall have been given any type of calibration, etc. listed above from (2) to (4).
• From JRL Article 24-2, paragraph 4, Item 2.
• All calibration information is from Guangzhou LiSai Metrology & Test Co.,Ltd.

4.3 Test Setup

Test Setup 1 For antenna port Test

5. Test Items

5.1 Test Results and Measurement Data

5.1.1 Frequency Tolerance

5.1.1.1 Limit

≤±(0.1 x fc x 10^-6 + 15) Hz

5.1.1.2 Test Setup

Please refer to 4.3 section description of test setup of test setup 1. The photo of test setup please refer to Test Setup Document.

5.1.1.3 Test Procedures

Follow 3GPP Standard TS36.521-1 Section 6.5.1.

5.1.1.4 Test Result

Please refer to the appendix B of test data.

5.1.2 RF Output Power and Output Power Tolerance Measurement

5.1.2.1 Limit

5.1.2.2 Test Setup

Please refer to 4.3 section description of test setup of test setup 1. The photo of test setup please refer to Test Setup Document.

5.1.2.3 Test Procedures

Follow 3GPP Standard TS 36.521-1 Section 6.2.2

Output Power(dBm) = P(dBm) = P_Linear(mW)

E.I.R.P(dBm) = P(dBm) + Peak Antenna Gain(dBi)

Tolerance = (P_Linear -200) / 200 x 100%

5.1.2.4 Test Result

Please refer to the appendix B of test data.

5.1.3 Occupied Bandwidth Measurement

5.1.3.1 Limit

5.1.3.2 Test Setup

Please refer to 4.3 section description of test setup of test setup 1. The photo of test setup please refer to Test Setup Document.

5.1.3.3 Test Procedures

Follow 3GPP Standard TS 36.521-1 Section 6.6.1.

5.1.3.4 Test Result

Please refer to the appendix B of test data.

5.1.4 Adjacent Channel Leakage Power Measurement

5.1.4.1 Limit

5.1.4.2 Test Setup

Please refer to 4.3 section description of test setup of test setup 1. The photo of test setup please refer to Test Setup Document.

5.1.4.3 Test Procedures

Follow 3GPP Standard TS 36.521-1 Section 6.6.2.3

5.1.4.4 Test Result

Please refer to the appendix B of test data.

5.1.5 Unwanted Emission Strength in Out-band Area Measurement

5.1.5.1 Limit

5.1.5.2 Test Setup

Please refer to 4.3 section description of test setup of test setup 1. The photo of test setup please refer to Test Setup Document.

5.1.5.3 Test Procedures

Follow 3GPP Standard TS 36.521-1 Section 6.6.2.2

5.1.5.4 Test Result

Please refer to the appendix B of test data.

5.1.6 Unwanted Emission Strength in Spurious Area Measurement

5.1.6.1 Limit

5.1.6.2 Test Setup

Please refer to 4.3 section description of test setup of test setup 1. The photo of test setup please refer to Test Setup Document.

5.1.6.3 Test Procedures

Follow 3GPP Standard TS 36.521-1 Section 6.6.3

5.1.6.4 Test Result

Please refer to the appendix B of test data.

5.1.7 Secondarily Emitted Radio Wave Strength Measurement

5.1.7.1 Limit

5.1.7.2 Test Setup

Please refer to 4.3 section description of test setup of test setup 1. The photo of test setup please refer to Test Setup Document.

5.1.7.3 Test Procedures

Follow 3GPP Standard TS 36.521-1 Section 7.9.

5.1.7.4 Test Result

Please refer to the appendix B of test data.

5.1.8 Leakage Power at No-carrier Transmission Measurement

5.1.8.1 Limit

5.1.8.2 Test Setup

Please refer to 4.3 section description of test setup of test setup 2. The photo of test setup please refer to Test Setup Document.

5.1.8.3 Test Procedures

Follow 3GPP Standard TS 36.521-1 Section 6.3.3

5.1.8.4 Test Result

Please refer to the appendix B of test data.

5.1.9 Comprehensive Operation Test

5.1.9.1 Limit

1. Automatic identification function: The transmitter of each land mobile station communicating with a base station shall be identified automatically by a base station.
2. Automatic channel switching function: It is preformed that has automatically channel switching communicating channel from base station to other base station.
3. Traffic control function: The area in accordance is provided for the service of base station. The area resulting electric field strength required to provide for the service. It can be subdivided to match the traffic of the area.
4. Automatic power control function: Based on the control information from the base station or the measurement of the received power of the radio wave from the base station, It has a function for automatically controlling that antenna power is the minimum.

5.1.9.2 Test Setup

Please refer to 4.3 section description of test setup of test setup 2. The photo of test setup please refer to Test Setup Document.

5.1.9.3 Test Result

All test methods meet the above upper limit requirements.

5.1.10 Construction Protection Confirmation Method

5.1.10.1 Limit

The high-frequency section and modulation section of the radio equipment except for the antenna system shall not be capable of being opened easily.

5.1.10.2 Test Method

• ☑ Sealed with special screws.
• ☑ Plastic chassis is being welded using ultrasonic waves.
• ☑ Chassis is glued using a special adhesive.
• ☑ Metal covers are spot-fused.
• ☑ Cover is specially interlocked.
• ☑ RF and Modulation components are covered with shielding case and this shielding case is soldered.
• ☐ Shield case is welded at RF and modulation parts, and ID-ROM is welded using the BGA Method.
• ☐ Shield case is welded at RF and modulation parts, and ID-ROM is glued at its lead with a special adhesive.
• ☐ Shield case is welded at RF and modulation parts, and ID-ROM is glued with a non-transparent laminating agent.
• Other:

5.1.10.3 Test Result

EUT TEST SETUP PHOTOS

SETUP PHOTOS

EUT EXTERNAL PHOTOS

Please refer to Report No. BTF250210R01001.

EUT INTERNAL PHOTOS

Please refer to Report No. BTF250210R01001.