SK hynix Gold S31 Series 2.5" Standard SSD
Product Information Datasheet
Product Overview
The SK hynix Gold S31 Series offers reliable and high-performance 2.5" Standard SSDs in various capacities, designed for a wide range of computing needs. This datasheet details the specifications, features, and certifications of these SSDs.
Key Specifications
Capacity
Available in 250GB, 500GB, and 1TB.
Form Factor
STD 2.5"
NAND Technology
3D V4
Performance
- Sequential Read: Up to 560 MB/s
- Sequential Write: Up to 525 MB/s
- Random Read: Up to 95K IOPS
- Random Write: Up to 87K IOPS
Power Consumption (Typical)
- Active read: 2.0W
- Active write: 2.4W
Temperature Range Operating
0°C to 70°C
Shock
Operating: 1500G, duration 0.5ms
Non-Operating: 1500G, duration 0.5ms
Vibration
Operating: 20G, 10~2KHz (Frequency)
Non-Operating: 20G, 10~2KHz (Frequency)
Reliability
- MTBF: 1.5M hours
- BER: 1 error in 1015 bits transferred
Dimension
(69.85±0.25) x (100±0.25) x (7+0.2/-0.5) mm
Weight
250/500GB, 1TB: 61g±5%
Voltage
5V±5%
Drive Capacity Details
Capacity | No. of LBA |
250GB | 500,118,192 |
500GB | 1,000,215,216 |
1TB | 2,000,409,264 |
Notes: Sector Size: 512 Bytes. User-addressable LBA count calculation provided.
Performance Details
Specification | 250GB | 500GB | 1TB |
Sequential Read (up to) | 560 MB/s | 560 MB/s | 560 MB/s |
Sequential Write (up to) | 500 MB/s | 525 MB/s | 525 MB/s |
Random Read (up to) | 54K IOPS | 90K IOPS | 95K IOPS |
Random write (up to) | 87K IOPS | 87K IOPS | 87K IOPS |
Notes: Performance measured using IOmeter2006 with queue depth 32.
Latency Specifications
Status | 250GB | 500GB | 1TB |
Read Latency (Typical) | 123us | 123us | 107us |
Write Latency (Typical) | 33us |
Notes: Device measured by IOmeter 2006 with Queue Depth 32 workload. Read/Write latency measured on Random 4K transfers.
Power on Ready Time
Status | 250GB | 500GB | 1TB |
POR | <0.5 sec | <0.5 sec | <0.5 sec |
SPOR | <10 sec | <10 sec | <10 sec |
Supply Voltage
Item | Operating Voltage |
Allowable voltage | 5V± 5% |
Allowable noise/ripple | 100mV p-p or less |
Power Consumption
Status | 250GB | 500GB | 1TB |
Active Read (Typical) | 1.6W | 2.0W | 2.0W |
Active Write (Typical) | 1.4W | 2.0W | 2.4W |
Idle (Typical) | 100mW |
Notes: Active power measured during execution of sequential read/write 128KB with queue depth 32. DIPM enable (Device Initiated Power Management).
Environmental Specification
Item | Mode | Min | Max | Unit | Condition |
Temperature Ranges | Operating | 0 | 70 | °C | |
Non-Operating | -40 | 95 | °C | ||
Humidity | Non-Operating | 5 | 85 | % | |
Shock | Operating | 400G, 11ms / 1000G, 1ms | |||
Non-Operating | 500G, 2ms / 1500G, 0.5ms | ||||
Vibration | Operating | 2G, 10~3KHz, 30min/axis, Random, 3.6G, 10~3KHz, 10min/axis |
Notes: Measured w/o condensation. Operating mode measured by temperature sensor. Shock and Vibration specifications assume SSD is mounted securely with input applied to drive mounting screws (X, Y, or Z axis).
Reliability
Item | Description | Value |
Mean Time Between Failures (MTBF) | 1.5M Mean Time Between Failures is estimated based on population statistics not relevant to individual units through Reliability demonstration Test (RDT). | 1.5M |
Bit Error Rate (BER) | Bit error rate will not exceed one sector in the specified number of bits read. In the unlikely event of a read error, the SSD will report it as a read failure to the host; the sector in error is considered corrupt and is not returned to the host. | 1 error in 1015 bits transferred |
Notes: The SSD incorporates advanced technology for defect and error management, including hardware-based error correction algorithms and firmware-based static and dynamic wear-leveling algorithms.
Mechanical Specification
Physical Dimension and Weight
Model | Height(mm) | Width(mm) | Length(mm) | Weight(g) |
250GB | 7+0.2/-0.5 | 69.85±0.15 | 100±0.15 | 52.4g±5% |
500GB | ||||
1000GB |
Diagrams showing Top, Side, and Bottom views with dimensions are provided in the original document.
Electrical Interface Specification
Connector Pin Location
Pin | Function | Pin Definition |
S1 | Ground | Ground |
S2 | A+ | Differential signal pair A and A- |
S3 | A- | |
S4 | Ground | Ground |
S5 | B- | Differential signal pair B and B- |
S6 | B+ | |
S7 | Ground | Ground |
Power Pin Location
Pin | Name | Pin Definition |
P1 | V33 | 3.3 V Power; not used |
P2 | V33 | 3.3 V Power; not used |
P3 | DEVSLP | SATA PHY Power Control, not used |
P4 | GND | Ground |
P5 | GND | Ground |
P6 | GND | Ground |
P7 | V5 | 5 V Power, Precharge |
P8 | V5 | 5 V Power |
P9 | V5 | 5 V Power |
P10 | GND | Ground |
P11 | DAS | Device Activity Signal, not used |
P12 | GND | Ground |
P13 | V12 | 12 V Power; not used |
P14 | V12 | 12 V Power; not used |
P15 | V12 | 12 V Power; not used |
Supported ATA Command List
The SK hynix SSD complies with ATA-8/ACS-3. All mandatory and many optional commands and features are supported.
ATA Feature Set
Feature Set | Support |
48-Bit Address feature set | YES |
General feature set | YES |
Native Command Queuing(NCQ) feature set | YES |
Power Management feature set | YES |
Security feature set | YES |
S.M.A.R.T feature set | YES |
ATA Command Description
A comprehensive list of ATA commands and their hexadecimal codes is provided, covering various functions like data management, read/write operations, power management, and security.
Security
- User/master password concatenation with serial number for storage in Flash.
- Password setting and unlocking performed in less than 1 second.
- SECURITY ERASE UNIT command erases all data blocks, including hidden blocks.
- Firmware download is possible regardless of security state.
SMART Support
SK hynix SSDs support S.M.A.R.T (Self-Monitoring, Analysis, and Reporting Technology) commands.
SMART Command Set
Feature field values | Command |
D0h | SMART READ DATA |
D1h | SMART READ ATTRIBUTE THRESHOLDS |
D2h | SMART ENABLE/DISABLE ATTRIBUTE AUTOSAVE |
D3h | SAVE ATTRIVUTE VALUES |
D4h | SMART EXECUTE OFF-LINE IMMEDIATE |
00h* | Execute SMART Off-Line routine |
01h* | Execute SMART Short Self-test routine (Off-Line) |
02h* | Execute SMART Extended Self-test routine (Off-Line) |
04h* | Execute SMART Selective Self-test routine (Off-Line) |
7Fh* | Abort Off-Line routine |
81h* | Execute SMART Short Self-test routine (Captive) |
82h* | Execute SMART Extended Self-test routine (Captive) |
84h* | Execute SMART Selective Self-test routine (Captive) |
D5h | SMART READ LOG |
D6h | SMART WRITE LOG |
D8h | SMART ENABLE OPERATIONS |
D9h | SMART DISABLE OPERATIONS |
DAh | SMART RETURN STATUS |
DBh | SMART Enable/Disable Automatic Off-Line |
SMART Attributes
ID | Attribute (ID) | Description |
1 | Raw Read Error Rate | Frequency of errors while reading raw data from disk |
5 | Retired Block | The number of sectors that have been reallocated, not including any pending sectors |
9 | Power on Hours | The number of power on hours from the time the SSD leaves the factory |
12 | Power Cycle Count | The number of power-on initialization takes place |
100 | Total Erase Count | The number of user area block erasures |
168 | Min. Erase Cycle Count | The number of min. erase/program cycles among blocks |
169 | Max. Erase Cycle Count | The number of max. erase/program cycles among blocks |
171 | Program Fail Count | The number of NAND program fails |
172 | Erase Fail Count | The number of NAND erase fails |
174 | Unexpected Power Loss Count | The number of unexpected power loss events |
175 | Program Fail Count (Worst Case Component) | The number of error events on program |
176 | Erase Fail Count (Worst Case Component) | The number of error Events on Erase |
177 | Wear Leveling Count | The number of erase/program cycles per block on average for indicate imminent wear-out |
178 | Used Reserved Block Count (Chip) | The number of reserved blocks used to replace bad blocks for the worst die |
179 | Used Reserved Block Count (Total) | The number of reserved blocks used to replace bad blocks. |
180 | Unused Reserved Block Count (Total) | The number of the reserved blocks remaining for the entire drive. |
184 | End to End Error Detection Count | The number of times that an internal data path protection error is detected |
187 | Reported Uncorrectable (UCC) Errors | The number of uncorrectable errors reported at the interface |
188 | Command Timeout Count | The number of command time outs as defined by an active command being interrupted |
194 | Temperature (Celsius) | Current temperature of the base casting |
195 | On-the-fly ECC Uncorrectable Error Rate | The number of ECC on-the-fly errors |
196 | Reallocation Event Count | The number of reallocation events that have taken place on the SSD, regardless of the number of sectors reallocated |
198 | Offline Scan Uncorrectable Sector Count | The number of uncorrected errors |
199 | CRC Error Count | The number of CRC errors that have occurred on the SATA interface |
204 | Soft ECC Correction Rate | Soft ECC rate for the current power/reset period |
212 | Phy Error Count | The number of Phy error |
233 | Normalized Media Wear-out | The number of average erase/program cycles to indicate of imminent wear-out (Counting down from 100 to 1) |
234 | NAND GB Written | The number of programed pages |
241 | Lifetime Writes From The Host In GB | Quantity of data written to the SDD over its' lifetime (in GB count) |
242 | Lifetime Reads From The Host In GB | Quantity of data read from the SDD over its' lifetime (in GB count) |
Certifications
Category | Certification |
BSMI | Bureau of Standard, Metrology & Inspection |
CE | Communaute Europeenne |
FCC | Federal Communications Commission |
KCC | Korea Communications Commission |
RCM | Regulatory Compliance Mark |
VCCI | Voluntary Control Council for Interference |
TUV | Technischen Uberwachungs Vereine |
CB | Scheme of the IECEE for Mutual Recognition of Test Certificates for Electrical Equipment |
UL | Underwriters Laboratories Inc. |
SATA-IO | Serial ATA International Organization. |
Microsoft WHCK | Microsoft Windows Hardware Certification Kit |
RoHS Compliant | Restriction of Hazardous Substance Directive |
SK hynix reserves the right to change products, information and specifications without notice.