SAMSUNG Electronics Co., Ltd. SMM115M Multi-band GSM/WCDMA/LTE phone with Bluetooth, WLAN ZCASMM115M ZCASMM115M smm115m
FCC PART 15C TEST REPORT No. I20Z70001-IOT01 for Samsung Electronics. Co., Ltd. Mobile phone Model Name: SM-M115M/DS, SM-M115M FCC ID: ZCASMM115M with Hardware Version: REV1.0 Software Version: M115M.001(M115MUBE0ATA8) Issued Date: 2020-2-17 Note: The test results in this test report relate only to the devices specified in this report.This report shall not be reproduced except in full without the written approval of CTTL. The report must not be used by the client to claim product certification, approval, or endorsement by NVLAP, NIST, or any agency of the U.S.Government. Test Laboratory: CTTL, Telecommunication Technology Labs, CAICT No.52, HuayuanNorth Road, Haidian District, Beijing, P. R. China 100191. Tel:+86(0)10-62304633-2512,Fax:+86(0)10-62304633-2504 Email:cttl_terminals@caict.ac.cn, website: www.chinattl.com ©Copyright. All rights reserved by CTTL. REPORT HISTORY Report Number I20Z70001-IOT01 Revision Rev.0 Description 1st edition No. I20Z70001-IOT01 Issue Date 2020-2-17 ©Copyright. All rights reserved by CTTL. Page 2 of 88. No. I20Z70001-IOT01 CONTENTS 1. TEST LABORATORY.................................................................................................................................5 1.1. INTRODUCTION &ACCREDITATION.......................................................................................................... 5 1.2. TESTING LOCATION..................................................................................................................................5 1.3. TESTING ENVIRONMENT.......................................................................................................................... 6 1.4. PROJECT DATA......................................................................................................................................... 6 1.5. SIGNATURE.............................................................................................................................................. 6 2. CLIENT INFORMATION......................................................................................................................... 7 2.1. APPLICANT INFORMATION....................................................................................................................... 7 2.2. MANUFACTURER INFORMATION..............................................................................................................7 3. EQUIPMENT UNDER TEST (EUT) AND ANCILLARY EQUIPMENT (AE)................................... 8 3.1. ABOUT EUT.............................................................................................................................................8 3.2. INTERNAL IDENTIFICATION OF EUT........................................................................................................ 8 3.3. INTERNAL IDENTIFICATION OF AE...........................................................................................................8 3.4. NORMAL ACCESSORY SETTING................................................................................................................ 9 3.5. GENERAL DESCRIPTION...........................................................................................................................9 4. REFERENCE DOCUMENTS.................................................................................................................. 10 4.1. DOCUMENTS SUPPLIED BY APPLICANT.................................................................................................. 10 4.2. REFERENCE DOCUMENTS FOR TESTING................................................................................................. 10 5. TEST RESULTS......................................................................................................................................... 11 5.1. SUMMARY OF TEST RESULTS................................................................................................................. 11 5.2. STATEMENTS.......................................................................................................................................... 11 5.3. EXPLANATION OF RE-USE OF TEST DATA............................................................................................... 11 6. TEST FACILITIES UTILIZED............................................................................................................... 12 7. MEASUREMENT UNCERTAINTY....................................................................................................... 13 7.1. PEAK OUTPUT POWER - CONDUCTED....................................................................................................13 7.2. FREQUENCY BAND EDGES.....................................................................................................................13 7.3. TRANSMITTER SPURIOUS EMISSION - CONDUCTED...............................................................................13 7.4. TRANSMITTER SPURIOUS EMISSION - RADIATED.................................................................................. 13 7.5. TIME OF OCCUPANCY (DWELL TIME)....................................................................................................13 7.6. 20DB BANDWIDTH................................................................................................................................ 13 7.7. CARRIER FREQUENCY SEPARATION...................................................................................................... 14 7.8. AC POWERLINE CONDUCTED EMISSION................................................................................................14 ANNEX A: DETAILED TEST RESULTS................................................................................................... 15 A.1. MEASUREMENT METHOD..................................................................................................................... 15 A.2. PEAK OUTPUT POWER CONDUCTED.................................................................................................. 16 A.3. FREQUENCY BAND EDGES CONDUCTED........................................................................................... 18 ©Copyright. All rights reserved by CTTL. Page 3 of 88. No. I20Z70001-IOT01 A.4. TRANSMITTER SPURIOUS EMISSION - CONDUCTED.............................................................................. 25 A.5. TRANSMITTER SPURIOUS EMISSION - RADIATED................................................................................. 50 A.6. TIME OF OCCUPANCY (DWELL TIME)................................................................................................... 60 A.7. 20DB BANDWIDTH................................................................................................................................71 A.8. CARRIER FREQUENCY SEPARATION..................................................................................................... 77 A.9. NUMBER OF HOPPING CHANNELS........................................................................................................ 80 A.10. AC POWERLINE CONDUCTED EMISSION.............................................................................................84 ANNEX B: ACCREDITATION CERTIFICATE.......................................................................................88 ©Copyright. All rights reserved by CTTL. Page 4 of 88. No. I20Z70001-IOT01 1. Test Laboratory 1.1. Introduction &Accreditation Telecommunication Technology Labs, CAICT is an ISO/IEC 17025:2005accredited test laboratory under NATIONAL VOLUNTARY LABORATORY ACCREDITATION PROGRAM (NVLAP)with lab code600118-0, and is also an FCC accredited test laboratory (CN5017), and ISED accredited test laboratory (CN0066). The detail accreditation scope can be found on NVLAP website. 1.2. Testing Location Conducted testing Location: CTTL(huayuan North Road) Address: No. 52, Huayuan North Road, Haidian District, Beijing, P. R. China100191 Radiated testing Location: CTTL(BDA) Address: No.18A, Kangding Street, Beijing Economic-Technology Development Area, Beijing, P. R. China 100176 ©Copyright. All rights reserved by CTTL. Page 5 of 88. 1.3. Testing Environment Normal Temperature: 15-35 Relative Humidity: 20-75% 1.4. Project data Testing Start Date: Testing End Date: 2019-12-13 2020-2-13 1.5. Signature Wu Le (Prepared this test report) Sun Zhenyu (Reviewed this test report) Li Zhuofang (Approved this test report) No. I20Z70001-IOT01 ©Copyright. All rights reserved by CTTL. Page 6 of 88. No. I20Z70001-IOT01 2. Client Information 2.1. Applicant Information Company Name: Samsung Electronics. Co., Ltd. R5, A Tower 22 Floor A-1,(Maetan dong) Address /Post: 129,Samsung-ro,Yeongtong-gu, Suwon-Si, Gyeonggi-do 16677, Korea City: / Postal Code: / Country: Korea Telephone: +82-10-4376-0326 Fax: / 2.2. Manufacturer Information Company Name: Samsung Electronics. Co., Ltd. R5, A Tower 22 Floor A-1,(Maetan dong) Address /Post: 129,Samsung-ro,Yeongtong-gu, Suwon-Si, Gyeonggi-do 16677, Korea City: / Postal Code: / Country: Korea Telephone: +82-10-4376-0326 Fax: / ©Copyright. All rights reserved by CTTL. Page 7 of 88. No. I20Z70001-IOT01 3. Equipment Under Test (EUT) and Ancillary Equipment (AE) 3.1. About EUT Description Model Name FCC ID Frequency Band Type of Modulation Number of Channels Power Supply Mobile phone SM-M115M/DS, SM-M115M ZCASMM115M ISM 2400MHz~2483.5MHz GFSK//4 DQPSK/8DPSK 79 3.85V DC by Battery 3.2. Internal Identification of EUT EUT ID* EUT1 EUT2 (SM-M115M/DS) SN or IMEI / 353691110106894/ 353692110106892 HW Version REV1.0 REV1.0 SW Version M115M.001(M115MUBE0ATA8) M115M.001(M115MUBE0ATA8) *EUT ID: is used to identify the test sample in the lab internally. 3.3. Internal Identification of AE AE ID* Description AE1 Battery AE2 Battery AE3 Charger AE4 USB Cable AE1 Model Manufacturer Capacitance Nominal voltage AE2 Model Manufacturer Capacitance Nominal voltage AE3 Model Manufacturer Length of cable / / / / HQ-70S SCUD(Fujian) Electronics Co., Ltd / / HQ-70N Amperex Technology Limited / / EP-TA200-JWE Samsung Electronics. Co., Ltd. / ©Copyright. All rights reserved by CTTL. Page 8 of 88. No. I20Z70001-IOT01 AE4 Model Manufacturer Length of cable EP-DR140AWE LUXSHARE-ICT (VIETNAM) LIMITED / *AE ID: is used to identify the test sample in the lab internally. 3.4. Normal Accessory setting Fully charged battery should be used during the test. 3.5. General Description The Equipment Under Test (EUT) is a model of Mobile phone with integrated antenna. It consists of normal options: lithium battery, charger. Manual and specifications of the EUT were provided to fulfill the test. Samples undergoing test were selected by the Client. ©Copyright. All rights reserved by CTTL. Page 9 of 88. No. I20Z70001-IOT01 4. Reference Documents 4.1. Documents supplied by applicant EUT feature information is supplied by the client or manufacturer, which is the basis of testing. 4.2. Reference Documents for testing The following documents listed in this section are referred for testing. Reference Title FCC CFR 47, Part 15, Subpart C: 15.205 Restricted bands of operation; FCC Part15 15.209 Radiated emission limits, general requirements; 15.247 Operation within the bands 902928MHz, 24002483.5 MHz, and 57255850 MHz. ANSI C63.10 American National Standard of Procedures for Compliance Testing of Unlicensed Wireless Devices Version 2018 June,2013 ©Copyright. All rights reserved by CTTL. Page 10 of 88. No. I20Z70001-IOT01 5. Test Results 5.1. Summary of Test Results Abbreviations used in this clause: P Pass, The EUT complies with the essential requirements in the standard. F Fail, The EUT does not comply with the essential requirements in the standard NA Not Applicable, The test was not applicable NP Not Performed, The test was not performed by CTTL R Re-use test data from basic model report. SUMMARY OF MEASUREMENT RESULTS Sub-clause Verdict Peak Output Power - Conducted 15.247 (b)(1) P Frequency Band Edges 15.247 (d) R Transmitter Spurious Emission - Conducted 15.247 (d) R Transmitter Spurious Emission - Radiated 15.247, 15.205, 15.209 R Time of Occupancy (Dwell Time) 15.247 (a) (1)(iii) R 20dB Bandwidth 15.247 (a)(1) R Carrier Frequency Separation 15.247 (a)(1) R Number of hopping channels 15.247 (a)(b)(iii) R AC Powerline Conducted Emission 15.107, 15.207 R Please refer to ANNEX A for detail. The measurement is made according to ANSI C63.10. 5.2. Statements CTTL has evaluated the test cases requested by the applicant /manufacturer as listed in section 5.1 of this report for the EUT specified in section 3 according to the standards or reference documents listed in section 4.2 5.3. Explanation of re-use of test data The Equipment Under Test (EUT) model SM-M115M/DS and SM-M115M(FCC ID: ZCASMM115M) are variants product of SM-A115M/DS(FCC ID: ZCASMA115M), according to the declaration of changes provided by the applicant and FCC KDB publication 484596 D01, spot check measurements(Peak Output Power-Conducted ) were performed on SM-M115M/DS, other test results are derived from test report No. I19Z70342-IOT01.The SM-M115M/DS with Dual SIM mode is a new product for this testing. The SM-M115M with single SIM mode is a variant product of SM-M115M/DS and shares the SM-M115M/DS results. Please refer Annex A for detail spot check verification data and reference data. the spot check test results are consistent with basic model. For detail differences between basic model and Under Test model please refer the Declaration of Changes document. ©Copyright. All rights reserved by CTTL. Page 11 of 88. No. I20Z70001-IOT01 6. Test Facilities Utilized Conducted test system No. Equipment Model 1 Vector Signal Analyzer FSQ26 2 Bluetooth Tester CBT32 3 LISN ENV216 4 Test Receiver 6 Shielding Room ESCI S81 Serial Number Manufacturer Calibratio n Period 200136 Rohde & Schwarz 1 year 100649 825562/0 28 100766 / Rohde & Schwarz R&S R&S ETS-Lindgren 1 year 1 year 1 year / Calibration Due date 2020-11-29 2020-11-29 2020-03-10 2020-03-20 / Radiated emission test system No. Equipment Model 1 Test Receiver ESU26 2 BiLog Antenna VULB9163 Dual-Ridge 3 Waveguide Horn 3117 Antenna Dual-Ridge 4 Waveguide Horn 3116 Antenna 5 Vector Signal FSV40 Analyzer Base Station 6 Simulator CMW500 Serial Number 100376 9163-514 00139065 2663 101047 159408 Manufacturer Rohde & Schwarz Schwarzbeck Calibration Period 1 year 1 year Calibration Due date 2020-10-30 2021-02-03 ETS-Lindgren 1 year 2020-11-10 ETS-Lindgren 1 year 2020-05-31 Rohde & Schwarz 1 year 2020-07-20 R&S 1 year 2020-03-03 ©Copyright. All rights reserved by CTTL. Page 12 of 88. No. I20Z70001-IOT01 7. Measurement Uncertainty 7.1. Peak Output Power - Conducted Measurement Uncertainty: Measurement Uncertainty (k=2) 0.66dB 7.2. Frequency Band Edges Measurement Uncertainty: Measurement Uncertainty (k=2) 0.66dB 7.3. Transmitter Spurious Emission - Conducted Measurement Uncertainty: Frequency Range 30 MHz ~ 8 GHz 8 GHz ~ 12.75 GHz 12.7GHz ~ 26 GHz Uncertainty (k=2) 1.22dB 1.51dB 1.51dB 7.4. Transmitter Spurious Emission - Radiated Measurement Uncertainty: Frequency Range 1 GHz 1 GHz Uncertainty (k=2) 5.40dB 4.32dB 7.5. Time of Occupancy (Dwell Time) Measurement Uncertainty: Measurement Uncertainty (k=2) 0.88ms 7.6. 20dB Bandwidth Measurement Uncertainty: Measurement Uncertainty (k=2) 61.936Hz ©Copyright. All rights reserved by CTTL. Page 13 of 88. 7.7. Carrier Frequency Separation Measurement Uncertainty: Measurement Uncertainty (k=2) 7.8. AC Powerline Conducted Emission Measurement Uncertainty: Measurement Uncertainty (k=2) No. I20Z70001-IOT01 61.936Hz 3.10dB ©Copyright. All rights reserved by CTTL. Page 14 of 88. No. I20Z70001-IOT01 ANNEX A: Detailed Test Results A.1. Measurement Method A.1.1. Conducted Measurements The measurement is made according to ANSI C63.10. 1). Connect the EUT to the test system correctly. 2). Set the EUT to the required work mode (Transmitter, receiver or transmitter & receiver). 3). Set the EUT to the required channel. 4). Set the EUT hopping mode (hopping or hopping off). 5). Set the spectrum analyzer to start measurement. 6). Record the values. Vector Signal Analyzer EUT Power Splitter Vector Signal Analyzer CBT32 A.1.2. Radiated Emission Measurements The measurement is made according to ANSI C63.10 The radiated emission test is performed in semi-anechoic chamber. The distance from the EUT to the reference point of measurement antenna is 3m. The test is carried out on both vertical and horizontal polarization and only maximization result of both polarizations is kept. During the test, the turntable is rotated 360° and the measurement antenna is moved from 1m to 4m to get the maximization result. In the case of radiated emission, the used settings are as follows, Sweep frequency from 30 MHz to 1GHz, RBW = 100 kHz, VBW = 300 kHz; Sweep frequency from 1 GHz to 26GHz, RBW = 1MHz, VBW = 1MHz; Signalling Tester Tower/Table Controller ©Copyright. All rights reserved by CTTL. Receiver Amp Filter Page 15 of 88. No. I20Z70001-IOT01 A.2. Peak Output Power Conducted Method of Measurement: See ANSI C63.10-clause 7.8.5 a) Use the following spectrum analyzer settings: Span: 6MHz RBW: 3MHz VBW: 3MHz Sweep time: 2.5ms Detector function: peak Trace: max hold b) Allow trace to stabilize. c) Use the marker-to-peak function to set the marker to the peak of the emission. d) The indicated level is the peak output power. Measurement Limit Standard FCC Part 15.247 (b)(1) Limits Bandwidth1MHz Bandwidth1MHz 30dBm (1W) 21dBm (125mW) Spot check Measurement Results: For GFSK Channel Ch 0 2402 MHz Peak Conducted Output Power (dBm) 8.03 For /4 DQPSK Channel Ch 0 2402 MHz Peak Conducted Output Power (dBm) 8.91 For 8DPSK Channel Ch 0 2402 MHz Peak Conducted 9.00 Output Power (dBm) Conclusion: PASS Ch 39 2441 MHz 8.85 Ch 39 2441 MHz 9.76 Ch 39 2441 MHz 10.15 Ch 78 2480 MHz 7.95 Conclusion P Ch 78 2480 MHz 8.41 Conclusion P Ch 78 2480 MHz 8.77 Conclusion P ©Copyright. All rights reserved by CTTL. Page 16 of 88. No. I20Z70001-IOT01 Reference Measurement Results from basic model: For GFSK Channel Ch 0 2402 MHz Ch 39 2441 MHz Peak Conducted Output Power (dBm) 8.93 9.72 For /4 DQPSK Channel Ch 0 2402 MHz Ch 39 2441 MHz Peak Conducted Output Power (dBm) 8.16 8.99 For 8DPSK Channel Ch 0 2402 MHz Ch 39 2441 MHz Peak Conducted Output Power (dBm) 8.31 9.23 Conclusion: PASS Ch 78 2480 MHz 8.35 Conclusion P Ch 78 2480 MHz 7.60 Conclusion P Ch 78 2480 MHz 7.80 Conclusion P ©Copyright. All rights reserved by CTTL. Page 17 of 88. No. I20Z70001-IOT01 A.3. Frequency Band Edges Conducted Method of Measurement: See ANSI C63.10-clause 7.8.6 Connect the spectrum analyzer to the EUT using an appropriate RF cable connected to the EUT output. Configure the spectrum analyzer settings as described below (be sure to enter all losses between the unlicensed wireless device output and the spectrum analyzer). Span: 10 MHz Resolution Bandwidth: 100 kHz Video Bandwidth: 300 kHz Sweep Time:Auto Detector: Peak Trace: max hold Place a marker at the end of the restricted band closest to the transmit frequency to show compliance. Also measure any emissions in the restricted bands. Save the spectrum analyzer plot. Repeat for each power and modulation for lowest and highest channel. Observe the stored trace and measure the amplitude delta between the peak of the fundamental and the peak of the band-edge emission. This is not an absolute field strength measurement; it is only a relative measurement to determine the amount by which the emission drops at the band edge relative to the highest fundamental emission level. Measurement Limit: Standard FCC 47 CFR Part 15.247 (d) Limit (dBc) < -20 Measurement Result: For GFSK Channel Hopping Hopping OFF 0 Hopping ON Hopping OFF 78 Hopping ON Band Edge Power ( dBc) Fig.1 -57.01 Fig.2 -63.38 Fig.3 -64.19 Fig.4 -68.30 Conclusion P P P P For /4 DQPSK Channel Hopping Hopping OFF 0 Hopping ON Hopping OFF 78 Hopping ON For 8DPSK Channel Hopping Hopping OFF 0 Hopping ON ©Copyright. All rights reserved by CTTL. Band Edge Power ( dBc) Fig.5 -56.41 Fig.6 -66.23 Fig.7 -63.88 Fig.8 -66.45 Band Edge Power ( dBc) Fig.9 -57.74 Fig.10 -64.17 Conclusion P P P P Conclusion P P Page 18 of 88. 78 Hopping OFF Hopping ON Conclusion: PASS Test graphs as below Fig.11 Fig.12 -63.40 -66.56 No. I20Z70001-IOT01 P P Fig.1. Frequency Band Edges: GFSK, Channel 0, Hopping Off Fig.2. Frequency Band Edges: GFSK, Channel 0, Hopping On ©Copyright. All rights reserved by CTTL. Page 19 of 88. No. I20Z70001-IOT01 Fig.3. Frequency Band Edges: GFSK, Channel 78, Hopping Off Fig.4. Frequency Band Edges: GFSK, Channel 78, Hopping On ©Copyright. All rights reserved by CTTL. Page 20 of 88. No. I20Z70001-IOT01 Fig.5. Frequency Band Edges: /4 DQPSK, Channel 0, Hopping Off Fig.6. Frequency Band Edges: /4 DQPSK, Channel 0, Hopping On ©Copyright. All rights reserved by CTTL. Page 21 of 88. No. I20Z70001-IOT01 Fig.7. Frequency Band Edges: /4 DQPSK, Channel 78, Hopping Off Fig.8. Frequency Band Edges: /4 DQPSK, Channel 78, Hopping On ©Copyright. All rights reserved by CTTL. Page 22 of 88. No. I20Z70001-IOT01 Fig.9. Frequency Band Edges: 8DPSK, Channel 0, Hopping Off Fig.10. Frequency Band Edges: 8DPSK, Channel 0, Hopping On ©Copyright. All rights reserved by CTTL. Page 23 of 88. No. I20Z70001-IOT01 Fig.11. Frequency Band Edges: 8DPSK, Channel 78, Hopping Off Fig.12. Frequency Band Edges: 8DPSK, Channel 78, Hopping On ©Copyright. All rights reserved by CTTL. Page 24 of 88. No. I20Z70001-IOT01 A.4. Transmitter Spurious Emission - Conducted Method of Measurement: See ANSI C63.10-clause 7.8.8 Measurement Procedure Reference Level 1. Set the RBW = 100 kHz. 2. Set the VBW = 300 kHz. 3. Set the span to 5-30 % greater than the EBW. 4. Detector = peak. 5. Sweep time = auto couple. 6. Trace mode = max hold. 7. Allow trace to fully stabilize. 8. Use the peak marker function to determine the maximum power level in any 100 kHz band segment within the fundamental EBW. Next, determine the power in 100 kHz band segments outside of the authorized frequency band using the following measurement: Measurement Procedure - Unwanted Emissions 1. Set RBW = 100 kHz. 2. Set VBW = 300 kHz. 3. Set span to encompass the spectrum to be examined. 4. Detector = peak. 5. Trace Mode = max hold. 6. Sweep = auto couple. 7. Allow the trace to stabilize (this may take some time, depending on the extent of the span). Ensure that the amplitude of all unwanted emissions outside of the authorized frequency band (excluding restricted frequency bands) is attenuated by at least the minimum requirements specified above. Measurement Limit: Standard FCC 47 CFR Part 15.247 (d) Measurement Results: For GFSK Channel Frequency Range Ch 0 Center Frequency ©Copyright. All rights reserved by CTTL. Limit 20dB below peak output power in 100 kHz bandwidth Test Results Fig.13 Conclusion P Page 25 of 88. 2402 MHz Ch 39 2441 MHz Ch 78 2480 MHz For /4 DQPSK Channel Ch 0 2402 MHz Ch 39 2441 MHz Ch 78 2480 MHz For 8DPSK Channel Ch 0 2402 MHz 30 MHz ~ 1 GHz 1 GHz ~ 3 GHz 3 GHz ~ 10 GHz 10 GHz ~ 26 GHz Center Frequency 30 MHz ~ 1 GHz 1 GHz ~ 3 GHz 3 GHz ~ 10 GHz 10 GHz ~ 26 GHz Center Frequency 30 MHz ~ 1 GHz 1 GHz ~ 3 GHz 3 GHz ~ 10 GHz 10 GHz ~ 26 GHz Frequency Range Center Frequency 30 MHz ~ 1 GHz 1 GHz ~ 3 GHz 3 GHz ~ 10 GHz 10 GHz ~ 26 GHz Center Frequency 30 MHz ~ 1 GHz 1 GHz ~ 3 GHz 3 GHz ~ 10 GHz 10 GHz ~ 26 GHz Center Frequency 30 MHz ~ 1 GHz 1 GHz ~ 3 GHz 3 GHz ~ 10 GHz 10 GHz ~ 26 GHz Frequency Range Center Frequency 30 MHz ~ 1 GHz 1 GHz ~ 3 GHz 3 GHz ~ 10 GHz 10 GHz ~ 26 GHz ©Copyright. All rights reserved by CTTL. Fig.14 Fig.15 Fig.16 Fig.17 Fig.18 Fig.19 Fig.20 Fig.21 Fig.22 Fig.23 Fig.24 Fig.25 Fig.26 Fig.27 Test Results Fig.28 Fig.29 Fig.30 Fig.31 Fig.32 Fig.33 Fig.34 Fig.35 Fig.36 Fig.37 Fig.38 Fig.39 Fig.40 Fig.41 Fig.42 Test Results Fig.43 Fig.44 Fig.45 Fig.46 Fig.47 No. I20Z70001-IOT01 P P P P P P P P P P P P P P Conclusion P P P P P P P P P P P P P P P Conclusion P P P P P Page 26 of 88. Center Frequency Ch 39 2441 MHz 30 MHz ~ 1 GHz 1 GHz ~ 3 GHz 3 GHz ~ 10 GHz 10 GHz ~ 26 GHz Center Frequency Ch 78 2480 MHz 30 MHz ~ 1 GHz 1 GHz ~ 3 GHz 3 GHz ~ 10 GHz 10 GHz ~ 26 GHz Conclusion: PASS Test graphs as below Fig.48 Fig.49 Fig.50 Fig.51 Fig.52 Fig.53 Fig.54 Fig.55 Fig.56 Fig.57 No. I20Z70001-IOT01 P P P P P P P P P P Fig.13. Conducted spurious emission: GFSK, Channel 0,2402MHz ©Copyright. All rights reserved by CTTL. Page 27 of 88. No. I20Z70001-IOT01 Fig.14. Conducted spurious emission: GFSK, Channel 0, 30MHz - 1GHz Fig.15. Conducted spurious emission: GFSK, Channel 0, 1GHz - 3GHz ©Copyright. All rights reserved by CTTL. Page 28 of 88. No. I20Z70001-IOT01 Fig.16. Conducted spurious emission: GFSK, Channel 0, 3GHz - 10GHz Fig.17. Conducted spurious emission: GFSK, Channel 0,10GHz - 26GHz ©Copyright. All rights reserved by CTTL. Page 29 of 88. No. I20Z70001-IOT01 Fig.18. Conducted spurious emission: GFSK, Channel 39, 2441MHz Fig.19. Conducted spurious emission: GFSK, Channel 39, 30MHz - 1GHz ©Copyright. All rights reserved by CTTL. Page 30 of 88. No. I20Z70001-IOT01 Fig.20. Conducted spurious emission: GFSK, Channel 39, 1GHz 3GHz Fig.21. Conducted spurious emission: GFSK, Channel 39, 3GHz 10GHz ©Copyright. All rights reserved by CTTL. Page 31 of 88. No. I20Z70001-IOT01 Fig.22. Conducted spurious emission: GFSK, Channel 39, 10GHz 26GHz Fig.23. Conducted spurious emission: GFSK, Channel 78, 2480MHz ©Copyright. All rights reserved by CTTL. Page 32 of 88. No. I20Z70001-IOT01 Fig.24. Conducted spurious emission: GFSK, Channel 78, 30MHz - 1GHz Fig.25. Conducted spurious emission: GFSK, Channel 78, 1GHz - 3GHz ©Copyright. All rights reserved by CTTL. Page 33 of 88. No. I20Z70001-IOT01 Fig.26. Conducted spurious emission: GFSK, Channel 78, 3GHz - 10GHz Fig.27. Conducted spurious emission: GFSK, Channel 78, 10GHz - 26GHz ©Copyright. All rights reserved by CTTL. Page 34 of 88. No. I20Z70001-IOT01 Fig.28. Conducted spurious emission: /4 DQPSK, Channel 0,2402MHz Fig.29. Conducted spurious emission: /4 DQPSK, Channel 0, 30MHz - 1GHz ©Copyright. All rights reserved by CTTL. Page 35 of 88. No. I20Z70001-IOT01 Fig.30. Conducted spurious emission: /4 DQPSK, Channel 0, 1GHz - 3GHz Fig.31. Conducted spurious emission: /4 DQPSK, Channel 0, 3GHz - 10GHz ©Copyright. All rights reserved by CTTL. Page 36 of 88. No. I20Z70001-IOT01 Fig.32. Conducted spurious emission: /4 DQPSK, Channel 0,10GHz - 26GHz Fig.33. Conducted spurious emission: /4 DQPSK, Channel 39, 2441MHz ©Copyright. All rights reserved by CTTL. Page 37 of 88. No. I20Z70001-IOT01 Fig.34. Conducted spurious emission: /4 DQPSK, Channel 39, 30MHz - 1GHz Fig.35. Conducted spurious emission: /4 DQPSK, Channel 39, 1GHz - 3GHz ©Copyright. All rights reserved by CTTL. Page 38 of 88. No. I20Z70001-IOT01 Fig.36. Conducted spurious emission: /4 DQPSK, Channel 39, 3GHz - 10GHz Fig.37. Conducted spurious emission: /4 DQPSK, Channel 39, 10GHz 26GHz ©Copyright. All rights reserved by CTTL. Page 39 of 88. No. I20Z70001-IOT01 Fig.38. Conducted spurious emission: /4 DQPSK, Channel 78, 2480MHz Fig.39. Conducted spurious emission: /4 DQPSK, Channel 78, 30MHz - 1GHz ©Copyright. All rights reserved by CTTL. Page 40 of 88. No. I20Z70001-IOT01 Fig.40. Conducted spurious emission: /4 DQPSK, Channel 78, 1GHz - 3GHz Fig.41. Conducted spurious emission: /4 DQPSK, Channel 78, 3GHz - 10GHz ©Copyright. All rights reserved by CTTL. Page 41 of 88. No. I20Z70001-IOT01 Fig.42. Conducted spurious emission: /4 DQPSK, Channel 78, 10GHz - 26GHz Fig.43. Conducted spurious emission: 8DPSK, Channel 0,2402MHz ©Copyright. All rights reserved by CTTL. Page 42 of 88. No. I20Z70001-IOT01 Fig.44. Conducted spurious emission: 8DPSK, Channel 0, 30MHz - 1GHz Fig.45. Conducted spurious emission: 8DPSK, Channel 0, 1GHz - 3GHz ©Copyright. All rights reserved by CTTL. Page 43 of 88. No. I20Z70001-IOT01 Fig.46. Conducted spurious emission: 8DPSK, Channel 0, 3GHz - 10GHz Fig.47. Conducted spurious emission: 8DPSK, Channel 0,10GHz - 26GHz ©Copyright. All rights reserved by CTTL. Page 44 of 88.