Test Report 3

General RF Test Report

Zhang Weimin

Test Report 3

Huawei Technologies Co.,Ltd ANE-LX1 Smart Phone QISANE-LX1 QISANELX1 ane lx1

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FCC RF Test Report
Product Name: Smart Phone
Model Number: ANE-LX1

Report No: SYBH(Z-EMC) 20171223014005-3 FCC ID: QISANE-LX1

Reliability Laboratory of Huawei Technologies Co., Ltd.
(Global Compliance and Testing Center of Huawei Technologies Co., Ltd)
Administration Building, Headquarters of Huawei Technologies Co., Ltd., Bantian, Longgang District, Shenzhen, 518129, P.R.C
Tel: +86 755 28780808 Fax: +86 755 89652518

Report No: SYBH(Z-EMC) 20171223014005-3

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RF Test Report of ANE-LX1
Notice
1. The laboratory has passed the accreditation by China National Accreditation Service for Conformity Assessment (CNAS). The accreditation number is L0310. 2. The laboratory has passed the accreditation by The American Association for Laboratory Accreditation (A2LA). The accreditation number is 2174.01. 3. The laboratory has been recognized by the US Federal Communications Commission (FCC) to perform compliance testing subject to the Commission's Certification rules. The Designation Number is CN1173, and the Test Firm Registration Number is 294140. 4. The laboratory has been listed by Industry Canada to perform electromagnetic emission measurements. The recognition numbers of test site are 6369A-1. 5. The laboratory (Reliability Lab of Huawei Technologies Co., Ltd) is also named "Global Compliance and Testing Center of Huawei Technologies Co., Ltd", the both names have coexisted since 2009. 6. The test report is invalid if not marked with the signatures of the persons responsible for preparing and approving the test report. 7. The test report is invalid if there is any evidence of erasure and/or falsification. 8. The test report is only valid for the test samples. 9. Content of the test report, in part or in full, cannot be used for publicity and/or promotional purposes without prior written approval from the laboratory.

Report No: SYBH(Z-EMC) 20171223014005-3

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RF Test Report of ANE-LX1

Applicant: Address:

Huawei Technologies Co., Ltd. Administration Building, Headquarters of Huawei Technologies Co., Ltd., Bantian, Longgang District, Shenzhen, 518129, P.R.C

Date of Receipt Sample: Start Date of Test: End Date of Test:

2018-02-08 2018-02-08 2018-02-10

Test Result:

Pass

Approved By (Lab Manager)

2018-02-12 Date

Prepared By (Test Engineer)

2018-02-11 Date

Roger Zhang Name
Hua Mei Name

Signature Signature

Report No: SYBH(Z-EMC) 20171223014005-3

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RF Test Report of ANE-LX1
CONTENT
1 General Information ................................................................................................................................................ 5 1.1 Applied Standard........................................................................................................................................ 5 1.2 Test Location ............................................................................................................................................. 5 1.3 Test Environment Condition ....................................................................................................................... 5
2 Test Summary ........................................................................................................................................................ 6 2.1 Measurement Technical Requirements......................................................................................................6
3 Description of the Equipment under Test (EUT) ..................................................................................................... 7 3.1 General Description ................................................................................................................................... 7 3.2 EUT Identity ............................................................................................................................................... 7 3.3 Technical Description.................................................................................................................................8
4 General Test Conditions / Configurations ............................................................................................................... 9 4.1 Test Modes ................................................................................................................................................ 9 4.2 EUT Configurations....................................................................................................................................9 4.3 Test Environments ..................................................................................................................................... 9 4.4 Test Setups .............................................................................................................................................. 10 4.5 Test Conditions ........................................................................................................................................ 12
5 Main Test Instruments .......................................................................................................................................... 13 6 Appendixes ........................................................................................................................................................... 13

Report No: SYBH(Z-EMC) 20171223014005-3

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RF Test Report of ANE-LX1

1 General Information

1.1 Applied Standard

Applied Rules:

47 CFR FCC Part 2, Subpart J 47 CFR FCC Part 15, Subpart C 47 CFR FCC Part 15, Subpart E

Test Method:

KDB 789033 D02 General UNII Test Procedures New Rules v01r04 ANSI C63.10-2013, American National Standard for Testing Unlicensed Wireless Devices

1.2 Test Location

Test Location 1: Address:

Reliability Laboratory of Huawei Technologies Co., Ltd. Administration Building, Headquarters of Huawei Technologies Co., Ltd., Bantian, Longgang District, Shenzhen, 518129, P.R.C

1.3 Test Environment Condition

Temperature: Relative Humidity: Atmospheric Pressure:

15 to 30 °C (Ambient) 20 to 85 % (Ambient) Not applicable

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RF Test Report of ANE-LX1

2 Test Summary

2.1 Measurement Technical Requirements

Band edge of Unwanted Emissions in the Restricted Bands (Radiated)

5150-525 0 5250-535 0 5470-572 5

15.209

FCC: Part 15.209

Appendix A Pass

Remark: this report is only for band edge of Unwanted Emissions in the Restricted Bands (Radiated)

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RF Test Report of ANE-LX1

3 Description of the Equipment under Test (EUT) 3.1 General Description

ANE-LX1 is subscriber equipment in the GSM/WCDMA/LTE system. The GSM frequency band includes GSM850 and GSM900 and DCS1800 and PCS1900. The UMTS frequency band is B1 and B2 and B5 and B8. The LTE frequency band is B1 and B3 and B7 and B8 and B20. The Mobile Phone implements such functions as RF signal receiving/transmitting, LTE/HSPA/UMTS and GSM/GPRS/EDGE protocol processing, voice, video MMS service, GPS, AGPS, NFC and WIFI 11a/n/ac etc. Externally it provides one micro SD card (it can also used as SIM card interface), earphone port (to provide voice service) and one SIM card interface. ANE-LX1 is dual SIM smart phone. It also provides Bluetooth module to synchronize data between a PC and the phone, or to use the built-in modem of the phone to access the Internet with a PC, or to exchange data with other Bluetooth devices

3.2 EUT Identity

NOTE:

Unless otherwise noted in the report, the functional boards installed in the units shall be selected from the below list, but not means all the functional boards listed below shall be installed in one unit.

3.2.1 Board

Description Main Board

Hardware Version HL2ANNEM

Board

Software Version ANE-LX1 8.0.0.40(C900)

3.2.2 Sub-Assembly

Name Adapter

Manufacture Huawei Technologies Co., Ltd.

Rechargeable Li

Huawei Technologies Co., Ltd.

USB Cable(Black)

Huawei Technologies Co., Ltd.

Description Model: HW-059200UHQ Input voltage: 100-240V 50/60Hz ,0.5A

Output Voltage: 5V

Rated Power: 10W OR 18W

SN: B76596HB502880

2A OR

Battery Model: HB366481ECW Rated capacity: 2900mAh

Nominal Voltage:

+3.82V

Charging Voltage:

+4.40V

SN: 2157LYHB05X02AE1

Data Cable USB A Male to Type C ,Shield

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RF Test Report of ANE-LX1

3.3 Technical Description

Characteristics IEEE 802.11 WLAN Mode Supported TX/RX Operating Range
Antenna
Power Supply

Description

802.11a (20 MHz channel bandwidth) , 802.11n (40 MHz channel bandwidth), 802.11ac (40 MHz channel bandwidth),

802.11n (20 MHz channel bandwidth) 802.11ac (20 MHz channel bandwidth)
802.11ac (80 MHz channel bandwidth)

All
5150-5250 MHz (U-NII) 5250-5350 MHz (U-NII)

fc = 5000 MHz + N * 5 MHz, where: - fc = "Operating Frequency" in MHz, - N = "Channel Number". N = 36 to 48 with step of 4 for the 20 MHz channel bandwidth. N = 38 to 46 with step of 4 for the 40 MHz channel bandwidth. N = 42 for the 80 MHz channel bandwidth. N = 52 to 64 with step of 4 for the 20 MHz channel bandwidth. N = 54 to 62 with step of 4 for the 40 MHz channel bandwidth. N = 58 for the 80 MHz channel bandwidth.

5470-5650 MHz (U-NII)
5650-5725 MHz (U-NII)
Type

N = 100 to 120 with step of 4 for the 20 MHz channel bandwidth. N = 102 to 110 with step of 4 for the 40 MHz channel bandwidth. N = 106 for the 80 MHz channel bandwidth. N = 132 to 144 with step of 4 for the 20 MHz channel bandwidth. N = 134 to 142 with step of 4 for the 40 MHz channel bandwidth. N = 138 for the 80 MHz channel bandwidth.
External, Integrated

Ports

Ant 1, Ant 2, Ant 3, Ant 4

Smart System

SISO (for 802.11a/n/ac),

MIMO (for 802.11n/ac),

Diversity (for 802.11a) :

Tx &

Gain

4.0 dBi (per antenna port, max.)

Remark Type

When the EUT is put into service, the practical maximum antenna gain

should NOT exceed the value as described above.

AC/DC Adapter

PoE:

Other:

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RF Test Report of ANE-LX1

4 General Test Conditions / Configurations 4.1 Test Modes

NOTE: Worst cases for each IEEE 802.11 mode are selected to perform tests.

Test Mode 11A 11N20 11N40 11AC20 11AC40 11AC80

Test Modes Description IEEE 802.11a with data rate of 6 Mbps using SISO mode. IEEE 802.11n with data date of MCS0 and bandwidth of 20 MHz using SISO mode. IEEE 802.11n with data date of MCS0 and bandwidth of 40 MHz using SISO mode. IEEE 802.11ac with data date of MCS0 and bandwidth of 20 MHz using SISO mode. IEEE 802.11ac with data date of MCS0 and bandwidth of 40 MHz using SISO mode. IEEE 802.11ac with data date of MCS0 and bandwidth of 80 MHz using SISO mode.

4.2 EUT Configurations 4.2.1 General Configurations

Configuration Test Antenna Ports

Description Until otherwise specified, All TX tests are performed at all TX antenna ports of the EUT, and All RX tests are performed at all RX antenna ports of the EUT.

4.3 Test Environments

Environment Parameter
Relative Humidity Temperature
Voltage

Selected Values During Tests
Ambient TN VL VN VH

NOTE: VL= lower extreme test voltage VN= nominal voltage VH= upper extreme test voltage TN= normal temperature

Ambient 3.6V 3.8V 4.35V

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RF Test Report of ANE-LX1
4.4 Test Setups 4.4.1 Test Setup 1
The test site semi-anechoic chamber has met the requirement of NSA tolerance 4 dB according to the standards: ANSI C63.4. The test distance is 3 m (for 30 MHz to 26.5 GHz) or 1 m (for 26.5 GHz to 40 GHz).The setup is according to ANSI C63.10, ANSI C63.4 and CAN/CSA-CEI/IEC CISPR 22. The maximal emission value is acquired by adjusting the antenna height, polarisation and turntable azimuth. Normally, the height range of antenna is 1 m to 4 m, the azimuth range of turntable is 0°to 360°, and the receive antenna has two polarizations Vertical (V) and Horizontal (H).
Semi-Anechoic Chamber

MIN:1 m
MAX:4 m

AE
Ferrite Clamp

EUT

Signal cable

0.8 m

Grounding (only for grounded device)

(Below 1 GHz)

Antenna
GRP

Preamplifier
Receiver

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RF Test Report of ANE-LX1 (Above 1 GHz)

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RF Test Report of ANE-LX1

4.5 Test Conditions 4.5.1 U-NII

Test Case
Unwanted Emissions (Radiated)

Test Conditions Configuration Test Env. Test Setup EUT Conf. Meas. Method Test Env. Test Setup EUT Conf.

Description

NTNV

Test Setup 1

All EUT conf. with Tx modes.

FCC KDB 789033 §G), (Radiated)

NTNV

Test Setup 1

5150-5250

All EUT Test Mode 20MHz BandWidthCh36(5180MHz) 40MHz BandWidthCh38(5190MHz) 80MHz BandWidthCh42(5210MHz)

5250-5350

All EUT Test Mode 20MHz BandWidthCh64(5320MHz) 40MHz BandWidthCh62(5310MHz) 80MHz BandWidthCh58(5290MHz)

5470-5725

All EUT Test Mode 20MHz BandWidth

Ch100(5500MHz) ,Ch140(5700MHz) 40MHz BandWidth

Ch102(5510MHz),Ch134(5670MHz), 80MHz BandWidth

Ch106(5530MHz), Ch122(5610MHz)

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RF Test Report of ANE-LX1

5 Main Test Instruments

NOTE:

Unless otherwise specified, the calibration intervals for test instruments were Annual (per year). The other intervals, if applicable, are marked with (##y), which denotes ## years calibration interval.

Equipment Name EMI Test receiver Power amplifier
Horn Antenna
Test Item RE

Main Test Equipments

Manufactur er

Model

Serial Number

Cal Date

R&S

ESU26

100150

Jan. 20, 2018

R&S

SCU 18

10162

May 16, 2017

R&S

HF906

100684

May 27, 2017

Software Information

Software Name

Manufacturer

EMC32

R&S

Cal- Due Jan. 20, 2019 May 16, 2018 May 28, 2019
Version V9.25.0

6 Appendixes

Appendix No. 001

Description 5G WLAN Appendix for ANE-LX1(SISO)

END

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