OnePlus Technology (Shenzhen) Co., Ltd. AA534 Mobile Phone with BT, WIFI, GSM, WCDMA, LTE, 5G NR and NFC 2ABZ2-AA534 2ABZ2AA534 aa534
OnePlus Technology (Shenzhen) Co., Ltd. AA534 2ABZ2-AA534 2ABZ2AA534 aa534
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DocumentDocumentNo.I23Z60155-SEM01 HAC RF TEST REPORT No. I23Z60155-SEM01 For OnePlus Technology (Shenzhen) Co., Ltd. Mobile Phone Model Name: CPH2513,CPH2515 With Hardware Version: 11 Software Version: OxygenOS 13.1 FCC ID: 2ABZ2-AA534 Issued Date: 2023-2-28 Note: The test results in this test report relate only to the devices specified in this report. This report shall not be reproduced except in full without the written approval of CTTL. Test Laboratory: CTTL, Telecommunication Technology Labs, CAICT No. 51, Xueyuan Road, Haidian District, Beijing, P. R. China 100191. Tel:+86(0)10-62304633-2512, Fax:+86(0)10-62304633-2504 Email: cttl_terminals@caict.ac.cn, website: www.caict.ac.cn ©Copyright. All rights reserved by CTTL. Page 1 of 53 REPORT HISTORY Report Number I23Z60155-SEM01 Revision Rev.0 No.I23Z60155-SEM01 Issue Date 2023-2-28 Description Initial creation of test report ©Copyright. All rights reserved by CTTL. Page 2 of 53 No.I23Z60155-SEM01 TABLE OF CONTENT 1 TEST LABORATORY ................................................................................................................... 5 1.1 TESTING LOCATION ........................................................................................................................................ 5 1.2 TESTING ENVIRONMENT................................................................................................................................. 5 1.3 PROJECT DATA ............................................................................................................................................... 5 1.4 SIGNATURE..................................................................................................................................................... 5 2 CLIENT INFORMATION ............................................................................................................... 6 2.1 APPLICANT INFORMATION .............................................................................................................................. 6 2.2 MANUFACTURER INFORMATION ..................................................................................................................... 6 3 EQUIPMENT UNDER TEST (EUT) AND ANCILLARY EQUIPMENT (AE) ................................ 7 3.1 ABOUT EUT ................................................................................................................................................... 7 3.2 INTERNAL IDENTIFICATION OF EUT USED DURING THE TEST .......................................................................... 7 3.3 INTERNAL IDENTIFICATION OF AE USED DURING THE TEST ............................................................................ 7 3.4 AIR INTERFACES / BANDS INDICATING OPERATING MODES ............................................................................ 7 4 MAXIMUM OUTPUT POWER. ..................................................................................................... 8 5 REFERENCE DOCUMENTS ........................................................................................................ 8 5.1 REFERENCE DOCUMENTS FOR TESTING .......................................................................................................... 8 6 OPERATIONAL CONDITIONS DURING TEST ........................................................................... 9 6.1 HAC MEASUREMENT SET-UP.................................................................................................................. 9 6.2 PROBE SPECIFICATION .................................................................................................................................. 10 6.3 TEST ARCH PHANTOM &PHONE POSITIONER ............................................................................................... 11 6.4 ROBOTIC SYSTEM SPECIFICATIONS .............................................................................................................. 11 7 EUT ARRANGEMENT ................................................................................................................ 12 7.1 WD RF EMISSION MEASUREMENTS REFERENCE AND PLANE ...................................................................... 12 8 SYSTEM VALIDATION ............................................................................................................... 13 8.1 VALIDATION PROCEDURE ............................................................................................................................. 13 8.2 VALIDATION RESULT .................................................................................................................................... 13 9 EVALUATION OF MIF ................................................................................................................ 14 9.1 INTRODUCTION............................................................................................................................................. 14 9.2 MIF MEASUREMENT WITH THE AIA ............................................................................................................. 15 9.3 TEST EQUIPMENT FOR THE MIF MEASUREMENT ........................................................................................... 15 9.4 DUT MIF RESULTS....................................................................................................................................... 15 10 EVALUATION FOR LOW-POWER EXEMPTION .................................................................... 16 10.1 PRODUCT TESTING THRESHOLD .................................................................................................................. 16 10.2 CONDUCTED POWER ................................................................................................................................... 16 10.3 CONCLUSION .............................................................................................................................................. 16 11 RF TEST PROCEDUERES....................................................................................................... 17 ©Copyright. 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Page 3 of 53 No.I23Z60155-SEM01 12 MEASUREMENT RESULTS (E-FIELD) ................................................................................... 18 13 ANSIC 63.19-2011 LIMITS ....................................................................................................... 18 14 MEASUREMENT UNCERTAINTY ........................................................................................... 19 15 MAIN TEST INSTRUMENTS.................................................................................................... 20 ANNEX A TEST LAYOUT ........................................................................................................... 21 ANNEX B TEST PLOTS ............................................................................................................. 22 ANNEX C SYSTEM VALIDATION RESULT............................................................................... 24 ANNEX D PROBE CALIBRATION CERTIFICATE .................................................................... 25 ANNEX E DIPOLE CALIBRATION CERTIFICATE.................................................................... 48 ©Copyright. All rights reserved by CTTL. Page 4 of 53 No.I23Z60155-SEM01 1 Test Laboratory 1.1 Testing Location CompanyName: Address: CTTL(Shouxiang) No. 51 Shouxiang Science Building, Xueyuan Road, Haidian District, Beijing, P. R. China100191 1.2 Testing Environment Temperature: 18C~25C, Relative humidity: 30%~ 70% Ground system resistance: < 0.5 Ambient noise is checked and found very low and in compliance with requirement of standards. Reflection of surrounding objects is minimized and in compliance with requirement of standards. 1.3 Project Data Project Leader: Test Engineer: Testing Start Date: Testing End Date: Qi Dianyuan Lin Xiaojun February 10, 2023 February 10, 2023 1.4 Signature Lin Xiaojun (Prepared this test report) Qi Dianyuan (Reviewed this test report) Lu Bingsong Deputy Director of the laboratory (Approved this test report) ©Copyright. All rights reserved by CTTL. Page 5 of 53 No.I23Z60155-SEM01 2 Client Information 2.1 Applicant Information Company Name: Address/Post: Contact Person: Contact Email: Telephone: OnePlus Technology (Shenzhen) Co., Ltd. 18C02, 18C03, 18C04, and 18C05, Shum Yip Terra Building, Binhe Avenue North, Futian District, Shenzhen, Guangdong, P.R. China. Ariel Cheng chenglijun1@oppo.com (86)75561882366 2.2 Manufacturer Information Company Name: Address/Post: Contact Person: Contact Email: Telephone: OnePlus Technology (Shenzhen) Co., Ltd. 18C02, 18C03, 18C04, and 18C05, Shum Yip Terra Building, Binhe Avenue North, Futian District, Shenzhen, Guangdong, P.R. China. Ariel Cheng chenglijun1@oppo.com (86)75561882366 ©Copyright. All rights reserved by CTTL. Page 6 of 53 No.I23Z60155-SEM01 3 Equipment Under Test (EUT) and Ancillary Equipment (AE) 3.1 About EUT Description: Model name: Operating mode(s): Mobile Phone CPH2513,CPH2515 LTE Band 48 3.2 Internal Identification of EUT used during the test EUT ID* EUT IMEI 869320060046747 HW Version 11 *EUT ID: is used to identify the test sample in the lab internally. SW Version OxygenOS 13.1 3.3 Internal Identification of AE used during the test AE ID* Description Model SN BLP989 AE1 Battery \ AE2 Battery BLP989 \ *AE ID: is used to identify the test sample in the lab internally. Manufacturer Dongguan NVT Technology Co., Ltd Sunwoda Electronic Co., Ltd. 3.4 Air Interfaces / Bands Indicating Operating Modes Airinterface Band(MHz) Type Simultaneo C63.19/test us ed Transmiss ions Name of Voice Service VoLTE, Power Reduction LTE (TDD) Band48 V/D Yes No Google No duo VO : Voice CMRS / PSTN Service Only VD : Voice CMRS / PSTN and Data Service DT : Digital Transport HAC Rating was not based on concurrent voice and data modes , Non-current mode was found to represent worstcase rating for both M and T rating ©Copyright. All rights reserved by CTTL. Page 7 of 53 4 Maximum Output Power. LTE Band48 QPSK LTE Band48 16QAM LTE Band48 64QAM Channel 56640 23.8 Channel 56640 22.8 Channel 56640 21.8 No.I23Z60155-SEM01 Conducted Power (dBm) Channel 55990 23.8 Conducted Power (dBm) Channel 55990 22.8 Conducted Power (dBm) Channel 55990 21.8 Channel 55340 23.8 Channel 55340 22.8 Channel 55340 21.8 5 Reference Documents 5.1 Reference Documents for testing The following document listed in this section is referred for testing. Reference Title ANSI C63.19-2011 American National Standard for Methods of Measurement of Compatibility between Wireless Communication Devices and Hearing Aids FCC 47 CFR §20.19 Hearing Aid Compatible Mobile Headsets KDB285076 D01 v06r02 Equipment Authorization Guidance for Hearing Aid Compatibility Version 2011 Edition 2015 Edition 2022 Edition ©Copyright. All rights reserved by CTTL. Page 8 of 53 No.I23Z60155-SEM01 6 OPERATIONAL CONDITIONS DURING TEST 6.1 HAC MEASUREMENT SET-UP These measurements are performed using the DASY5 NEO automated dosimetric assessment system. It is made by Schmid & Partner Engineering AG (SPEAG) in Zurich, Switzerland. It consists of high precision robotics system (Stäubli), robot controller, Intel Core2 computer, near-field probe, probe alignment sensor. The robot is a six-axis industrial robot performing precise movements. A cell controller system contains the power supply, robot controller, teach pendant (Joystick),and remote control, is used to drive the robot motors. The PC consists of the HP Intel Core21.86 GHz computer with Windows XP system and HAC Measurement Software DASY5 NEO, A/D interface card, monitor, mouse, and keyboard. The Stäubli Robot is connected to the cell controller to allow software manipulation of the robot. A data acquisition electronic (DAE)circuit performs the signal amplification, signal multiplexing, AD-conversion, offset measurements, mechanical surface detection, collision detection, etc. is connected to the Electro-optical coupler (EOC). The EOC performs the conversion from the optical into digital electric signal of the DAE and transfers data to the PC plug-in card. Fig. 1 HAC Test Measurement Set-up The DAE4 consists of a highly sensitive electrometer-grade preamplifier with auto-zeroing, a channel and gain-switching multiplexer, a fast 16 bit AD-converter and a command decoder and control logic unit. Transmission to the PC-card is accomplished through an optical downlink for data and status information and an optical uplink for commands and clock lines. The mechanical probe mounting device includes two different sensor systems for frontal and sidewise probe contacts. They are also used for mechanical surface detection and probe collision detection. The robot uses its own controller with a built in VME-bus computer. ©Copyright. All rights reserved by CTTL. Page 9 of 53 6.2 Probe Specification E-Field Probe Description No.I23Z60155-SEM01 Construction One dipole parallel, two dipoles normal to probe axis Built-in shielding against static charges PEEK enclosure material Calibration Frequency In air from 100 MHz to 3.0 GHz (absolute accuracy ±6.0%, k=2) 40 MHz to > 6 GHz (can be extended to < 20 MHz) Linearity: ±0.2 dB (100 MHz to 3 GHz) [ER3DV6] Directivity ±0.2 dB in air (rotation around probe axis) ±0.4 dB in air (rotation normal to probe axis) Dynamic Range 2 V/m to > 1000 V/m; Linearity: ±0.2 dB Dimensions Overall length: 330 mm (Tip: 16 mm) Tip diameter: 8 mm (Body: 12 mm) Distance from probe tip to dipole centers: 2.5 mm Application General near-field measurements up to 6 GHz Field component measurements Fast automatic scanning in phantoms ©Copyright. All rights reserved by CTTL. Page 10 of 53 No.I23Z60155-SEM01 6.3 Test Arch Phantom &Phone Positioner The Test Arch phantom should be positioned horizontally on a stable surface. Reference markings on the Phantom allow the complete setup of all predefined phantom positions and measurement grids by manually teaching three points in the robot. It enables easy and well defined positioning of the phone and validation dipoles as well as simple teaching of the robot (Dimensions: 370 x 370 x 370 mm). The Phone Positioner supports accurate and reliable positioning of any phone with effect on near field <±0.5 dB. Fig. 2 HAC Phantom & Device Holder 6.4 Robotic System Specifications Specifications Positioner: Stäubli Unimation Corp. Robot Model: RX160L Repeatability: ±0.02 mm No. of Axis: 6 Data Acquisition Electronic (DAE) System Cell Controller Processor: Intel Core2 Clock Speed: 1.86GHz Operating System: Windows XP Data Converter Features:Signal Amplifier, multiplexer, A/D converter, and control logic Software: DASY5 software Connecting Lines: Optical downlink for data and status info. Optical uplink for commands and clock ©Copyright. All rights reserved by CTTL. Page 11 of 53 No.I23Z60155-SEM01 7 EUT ARRANGEMENT 7.1 WD RF Emission Measurements Reference and Plane Figure 4 illustrates the references and reference plane that shall be used in the WD emissions measurement. · The grid is 5 cm by 5 cm area that is divided into 9 evenly sized blocks or sub-grids. · The grid is centered on the audio frequency output transducer of the WD (speaker or T-coil). · The grid is located by reference to a reference plane. This reference plane is the planar area that contains the highest point in the area of the WD that normally rests against the user's ear ·The measurement plane is located parallel to the reference plane and 15 mm from it, out from the phone. The grid is located in the measurement plane. Fig. 3 WD reference and plane for RF emission measurements ©Copyright. All rights reserved by CTTL. Page 12 of 53 No.I23Z60155-SEM01 8 SYSTEM VALIDATION 8.1 Validation Procedure Place a dipole antenna meeting the requirements given in ANSI C63.19 in the position normally occupied by the WD. The dipole antenna serves as a known source for an electrical output. Position the E-field probes so that: ·The probes and their cables are parallel to the coaxial feed of the dipole antenna ·The probe cables and the coaxial feed of the dipole antenna approach the measurement area from opposite directions · The center point of the probe element(s) are 15 mm from the closest surface of the dipole elements. Fig. 4 Dipole Validation Setup 8.2 Validation Result E-Field Scan Frequency Mode (MHz) CW 3500 Input Power (mW) 100 Measured1 Target2 Deviation3 Value(dBV/m) Value(dBV/m) (%) 38.6 38.59 0.12 Limit4 (%) ±25 Notes: 1. Please refer to the attachment for detailed measurement data and plot. 2. Target value is provided by SPEAD in the calibration certificate of specific dipoles. 3. Deviation (%) = 100 * (Measured value minus Target value) divided by Target value. 4. ANSI C63.19 requires values within ±25% are acceptable, of which 12% is deviation and 13% is measurement uncertainty. Values independently validated for the dipole actually used in the measurements should be used, when available. ©Copyright. All rights reserved by CTTL. Page 13 of 53 9 Evaluation of MIF No.I23Z60155-SEM01 9.1 Introduction The MIF (Modulation Interference Factor) is used to classify E-field emission to determine Hearing Aid Compatibility (HAC). It scales the power-averaged signal to the RF audio interference level and is characteristic to a modulation scheme. The HAC standard preferred "indirect" measurement method is based on average field measurement with separate scaling by the MIF. With an Audio Interference Analyzer (AIA) designed by SPEAG specifically for the MIF measurement, these values have been verified by practical measurements on an RF signal modulated with each of the waveforms. The resulting deviations from the simulated values are within the requirements of the HAC standard. The AIA (Audio Interference Analyzer) is an USB powered electronic sensor to evaluate signals in the frequency range 698MHz - 6 GHz. It contains RMS detector and audio frequency circuits for sampling of the RF envelope. Fig. 5 AIA Front View ©Copyright. All rights reserved by CTTL. Page 14 of 53 No.I23Z60155-SEM01 9.2 MIF measurement with the AIA The MIF is measured with the AIA as follows: 1. Connect the AIA via USB to the DASY5 PC and verify the configuration settings. 2. Couple the RF signal to be evaluated to an AIA via cable or antenna. 3. Generate a MIF measurement job for the unknown signal and select the measurement port and timing settings. 4. Document the results via the post processor in a report. 9.3 Test equipment for the MIF measurement No. Name 01 Signal Generator 02 AIA 03 BTS Type E4438C SE UMS 170 CB CMW500 Serial Number MY49070393 1029 166370 Manufacturer Agilent SPEAG R&S 9.4 DUT MIF results Based on the KDB285076D01v06r02, the handset can also use the MIF values predetermined by the test equipment manufacturer. MIF values applied in this test report were provided by the HAC equipment provider of SPEAG, and the worst values for all air interface are listed below to be determine the Low-power Exemption. Typical MIF levels in ANSI C63.19-2011 Transmission protocol Modulation interference factor LTE-TDD (SC-FDMA, 1RB, 20MHz, QPSK) -1.62 dB LTE-TDD (SC-FDMA, 1RB, 20MHz, 16QAM) -1.44 dB LTE-TDD (SC-FDMA, 1RB, 20MHz, 64QAM) -1.54 dB ©Copyright. All rights reserved by CTTL. Page 15 of 53 No.I23Z60155-SEM01 10 Evaluation for low-power exemption 10.1 Product testing threshold There are two methods for exempting an RF air interface technology from testing. The first method requires evaluation of the MIF for the worst-case operating mode. An RF air interface technology of a device is exempt from testing when its average antenna input power plus its MIF is17 dBm for any of its operating modes. The second method does not require determination of the MIF. The RF emissions testing exemption shall be applied to an RF air interface technology in a device whose peak antenna input power, averaged over intervals 50 s20, is 23 dBm. An RF air interface technology that is exempted from testing by either method shall be rated as M4. The first method is used to be exempt from testing for the RF air interface technology in this report. 10.2 Conducted power Band LTE Band 48 QPSK LTE Band 48 16QAM LTE Band 48 64QAM Average power (dBm) 23.8 22.8 21.8 MIF (dB) -1.62 -1.44 -1.54 Sum (dBm) 22.18 21.36 20.26 C63.19 Tested Yes Yes Yes 10.3 Conclusion According to the above table, it is measured for LTE TDD bands. ©Copyright. All rights reserved by CTTL. Page 16 of 53 No.I23Z60155-SEM01 11 RF TEST PROCEDUERES The evaluation was performed with the following procedure: 1) Confirm proper operation of the field probe, probe measurement system and other instrumentation and the positioning system. 2) Position the WD in its intended test position. The gauge block can simplify this positioning. 3) Configure the WD normal operation for maximum rated RF output power, at the desired channel and other operating parameters (e.g., test mode), as intended for the test. 4) The center sub-grid shall centered on the center of the T-Coil mode axial measurement point or the acoustic output, as appropriate. Locate the field probe at the initial test position in the50 mm by 50 mm grid, which is contained in the measurement plane. If the field alignment method is used, align the probe for maximum field reception. 5) Record the reading. 6) Scan the entire 50 mm by 50 mm region in equally spaced increments and record the reading at each measurement point. The distance between measurement points shall be sufficient to assure the identification of the maximum reading. 7) Identify the five contiguous sub-grids around the center sub-grid whose maximum reading is the lowest of all available choices. This eliminates the three sub-grids with the maximum readings. Thus, the six areas to be used to determine the WD's highest emissions are identified. 8) Identify the maximum field reading within the non-excluded sub-grids identified in Step 7) 9) Evaluate the MIF and add to the maximum steady-state rms field-strength reading to obtain the RF audio interference level.. 10) Compare this RF audio interference level with the categories and record the resulting WD category rating. ©Copyright. All rights reserved by CTTL. Page 17 of 53 No.I23Z60155-SEM01 12 Measurement Results (E-Field) Frequency MHz Channel 3690 3625 3560 56640 55990 55340 3690 3625 3560 56640 55990 55340 3690 3625 3560 56640 55990 55340 Measured Value(dBV/m) Power Drift (dB) LTE Band 48 QPSK 18.93 -0.03 17.02 -0.08 17.15 0.12 LTE Band 48 16QAM 18.07 -0.05 16.40 -0.02 16.24 0.04 LTE Band 48 64QAM 17.06 0.14 14.98 0.06 14.81 0.06 Category M4(see Fig B.1) M4 M4 M4 M4 M4 M4 M4 M4 13 ANSIC 63.19-2011 LIMITS WD RF audio interference level categories in logarithmic units Emission categories < 960 MHz E-field emissions Category M1 50 to 55 dB (V/m) Category M2 45 to 50 dB (V/m) Category M3 40 to 45 dB (V/m) Category M4 < 40 dB (V/m) Emission categories > 960 MHz E-field emissions Category M1 40 to 45 dB (V/m) Category M2 35 to 40 dB (V/m) Category M3 30 to 35 dB (V/m) Category M4 < 30 dB (V/m) ©Copyright. All rights reserved by CTTL. Page 18 of 53 No.I23Z60155-SEM01 14 MEASUREMENT UNCERTAINTY No. Error source Measurement System 1 Probe Calibration Uncertainty Prob. Type k Value(%) Dist. B 5. N 1 2 Axial Isotropy B 4.7 R 3 Standard Uncertainty Degree of ciE (%) ui' (%)E freedom Veffor vi 1 5.1 1 2.7 3 Sensor Displacement B 16.5 R 3 1 9.5 4 Boundary Effects B 2.4 R 3 1 1.4 5 Linearity B 4.7 R 3 1 2.7 Scaling to Peak Envelope 6 Power B 2.0 R 3 1 1.2 7 System Detection Limit B 1.0 R 3 1 0.6 8 Readout Electronics B 0.3 N 1 1 0.3 9 Response Time B 0.8 R 3 1 0.5 10 Integration Time B 2.6 R 3 1 1.5 11 RF Ambient Conditions B 3.0 R 3 1 1.7 12 RF Reflections B 12.0 R 3 1 6.9 13 Probe Positioner B 1.2 R 3 1 0.7 14 Probe Positioning A 4.7 R 3 1 2.7 15 Extra. And Interpolation B 1.0 R 3 1 0.6 Test Sample Related 16 Device Positioning Vertical B 4.7 R 3 1 2.7 17 Device Positioning Lateral B 1.0 R 3 1 0.6 18 Device Holder and Phantom B 2.4 R 3 1 1.4 19 Power Drift B 5.0 R 3 1 2.9 ©Copyright. All rights reserved by CTTL. Page 19 of 53 20 AIA measurement Phantom and Setup related 21 Phantom Thickness Combined standard uncertainty(%) Expanded uncertainty (confidence interval of 95 %) B 12 B 2.4 ue 2uc No.I23Z60155-SEM01 R 3 1 6.9 R 3 1 1.4 16.2 N k=2 32.4 15 MAIN TEST INSTRUMENTS Table 1: List of Main Instruments No. Name Type Signal 01 Generator E4483C 02 Power meter NRP2 03 Power sensor NRP6A 04 Amplifier 60S1G4 05 E-Field Probe EF3DV3 06 DAE SPEAG DAE4 07 HAC Dipole CD3500V3 08 BTS CMW500 09 AIA SE UMS 170 CB Serial Number MY49070393 106276 101369 0331848 4060 1524 1008 166370 1029 Calibration Date May 17, 2022 Valid Period One Year May 10, 2022 One year No Calibration Requested May 13, 2022 One year October 17, 2022 One year August 25, 2022 One year June 28,2022 One year No Calibration Requested ***END OF REPORT BODY*** ©Copyright. All rights reserved by CTTL. Page 20 of 53 ANNEX A TEST LAYOUT No.I23Z60155-SEM01 Picture A1:HAC RF System Layout ©Copyright. All rights reserved by CTTL. Page 21 of 53 No.I23Z60155-SEM01 ANNEX B TEST PLOTS HAC RF E-Field LTE Band48 QPSK Date: 2023-2-10 Electronics: DAE4 Sn1524 Medium: Air Medium parameters used: = 0 mho/m, r = 1; = 1000 kg/m3 Ambient Temperature: 22.0oC Communication System: LTE Band48; Frequency: 3560 MHz; Duty Cycle: 1:1.58 Probe: EF3DV3 - SN4060;ConvF(1, 1, 1) E Scan - ER3DV6 - 2011: 15 mm from Probe Center to the Device/Hearing Aid Compatibility Test (101x101x1): Interpolated grid: dx=0.5000 mm, dy=0.5000 mm Device Reference Point: 0, 0, -6.3 mm Reference Value = 8.971 V/m; Power Drift = -0.03 dB Applied MIF = -3.52 dB RF audio interference level = 18.93 dBV/m Emission category: M4 MIF scaled E-field Grid 1 M4 Grid 2 M4 Grid 3 M4 18.98 dBV/m 19.61 dBV/m 18.93 dBV/m Grid 4 M4 Grid 5 M4 Grid 6 M4 19.14 dBV/m 16.68 dBV/m 16.57 dBV/m Grid 7 M4 Grid 8 M4 Grid 9 M4 18.31 dBV/m 15.49 dBV/m 15.01 dBV/m ©Copyright. All rights reserved by CTTL. Page 22 of 53 No.I23Z60155-SEM01 0 dB = 9.564 V/m = 19.61 dBV/m Fig B.1 HAC RF E-Field LTE Band48 QPSK ©Copyright. All rights reserved by CTTL. Page 23 of 53 No.I23Z60155-SEM01 ANNEX C SYSTEM VALIDATION RESULT E SCAN of Dipole 3500 MHz Date: 2023-2-10 Electronics: DAE4 Sn1524 Medium: Air Medium parameters used: = 0 mho/m, r = 1; = 1000 kg/m3 Communication System: CW; Frequency: 3500 MHz; Duty Cycle: 1:1 Probe: EF3DV3 - SN4060 Dipole E-Field measurement (E-field scan for ANSI C63.19-2007 & -2011 compliance)/E Scan - measurement distance from the probe sensor center to CD3500 = 15mm/Hearing Aid Compatibility Test at 15mm distance (41x101x1): Interpolated grid: dx=0.5000 mm, dy=0.5000 mm Device Reference Point: 0, 0, -6.3 mm Reference Value = 36.28 V/m; Power Drift = 0.06 dB Applied MIF = 0.00 dB RF audio interference level = 38.60 dBV/m Emission category: M2 MIF scaled E-field Grid 1 M2 Grid 2 M2 Grid 3 M2 38.59 dBV/m 38.63 dBV/m 38.53 dBV/m Grid 4 M2 Grid 5 M2 Grid 6 M2 38.46 dBV/m 38.55 dBV/m 38.42 dBV/m Grid 7 M2 Grid 8 M2 Grid 9 M2 38.5 dBV/m 38.6 dBV/m 38.46 dBV/m 0 dB = 85.43 V/m = 38.63 dBV/m ©Copyright. All rights reserved by CTTL. Page 24 of 53 No.I23Z60155-SEM01 ANNEX D PROBE CALIBRATION CERTIFICATE ©Copyright. All rights reserved by CTTL. Page 25 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 26 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 27 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 28 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 29 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 30 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 31 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 32 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 33 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 34 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 35 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 36 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 37 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 38 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 39 of 53 No.I23Z60155-SEM01 ©Copyright. All rights reserved by CTTL. Page 40 of 53